| | Table of contents
J. appl. res. technol vol.6 n.1 Ciudad de México Apr. 2008 An Automatic Test Environment for Microelectronics Education and Reserch
Sandoval-Ibarra, Federico
| | | Diverse Time-Frequency Distributions Integrated to an ART2 Network for Non-Destructive Testing
Benítez-Pérez, H.; Medina-Gómez, L.
| | | Pattern Classification of Decomposed Wavelet Information using ART2 Networks for echoes Analysis
Solís, M.; Benítez-Pérez, H.; Rubio, E.; Medina-Gómez, L.; Moreno, E.; Gonzalez, G.; Leija, L.
| | | Measurement of Chua Chaos and Its Applications
Núñez Pérez, Ricardo
| | | Ring CMOS NOT-based Oscillators: Analysis and Design
Sandoval-Ibarra, F.; Hernández-Bernal, E. S.
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