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Revista mexicana de física
Print version ISSN 0035-001X
Rev. mex. fis. vol.56 n.2 México Apr. 2010
Investigación
Calorimetric measurements of AC looses in Bi2213/Ag multifilament tape
M. Ramosª, J. Schwartzb, U. Trociewitzb, S. Pamidic, and S. Floresd
ª Materials Research and Technology Institute, University of Texas at El Paso, email: maramos1@miners.utep.edu
b National High Magnetic Field Laboratory Tallahassee, Florida.
c Center for the Advanced Power Systems, Tallahassee, Florida.
d Departamento de Ciencias Básicas, Universidad Autónoma de Ciudad Juárez.
Recibido el 10 de febrero de 2010
Aceptado el 17 de marzo de 2010
Abstract
We present research work collaboration between the University of Texas at El Paso and The National High Magnetic Field Laboratory. This work presents a series of measurements of AC losses in multifilamentary Bi2223/Ag tapes using a calorimetric method as described by Ashworth and Suenaga. The AC losses were investigated at liquid nitrogen temperatures (77 K) for different AC currents and in frequency range form 50 Hz to 500 Hz. The results are compared with the Norris ellipse model for calculating selffield loss in high temperature superconducting tape.
Keywords: AC losses; superconductor; nitrogen; calorimetric.
Resumen
Presentamos un trabajo de investigación en colaboración con la Universidad de Texas en El Paso y El Laboratorio Nacional de Altos Campos Magnéticos. Este trabajo presenta una serie de mediciones de pérdidas de potencial (AC) en una cinta multifilamentaria de Bi2223/Ag utilizando un método calorimétrico descrito por Ashworth and Suenaga. Las pérdidas de corriente (AC) son investigadas en bajas temperaturas usando nitrógeno líquido (77 K) para diferentes corrientes AC en un rango de frecuencia de 50Hz a 500 Hz. Los resultados son comparados con el modelo de elíptico Norris para calcular las pérdidas por campo directo en cintas superconductivas de alta temperatura.
Descriptores: Perdidas AC; superconductor; nitrógeno; calorimétrico.
PACS: 74.72.h; 74.10.+v; 74.62.c; 07.20.Fw; 07.20.Dt
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Acknowledgments
Authors thank the National Science Foundation and to the Electronics and Machine Shops personnel of the National High Magnetic Field Laboratory and the Center for Advance Power Systems.
References
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