Abstract

RIZWAN, Sumaira et al. Evaluation of Synthetic Hexaploid Wheats (Triticum turgidum L. x Aegilops tauschii L.) and their Durum Parents for Stripe Rust (Puccinia striiformis Westend. f. sp. tritici Erikson) Resistance. Rev. mex. fitopatol [online]. 2007, vol.25, n.2, pp.152-160. ISSN 2007-8080.

In this study, resistance to stripe rust (Puccinia striiformis) of 95 lines of Elite 1 synthetics, 33 lines of Elite 2 synthetics, and 51 lines of their durum parents were evaluated at the seedling stage in glasshouses at Murree, Pakistan, and at the adult plant stage under field and glasshouse conditions. Bulk inoculum collected during 2004-2005 cropping season was used in all studies. Fifty six entries (58%) of Elite 1 synthetics, 15 entries (45%) of Elite 2 synthetics, and 16 (11%) durum parental entries were found resistant at the seedling stage. In the field and glasshouse the adult plant resistance was evaluated by estimating the area under disease progress curve (AUDPC). Thirty three percent of Elite 1, 30% of Elite 2, and 41% of their durum parents had AUDPC ranging between 0-10 percent. Most of the genotypes resistant at the seedling stage were also resistant at the adult plant stage. Few lines possessed partial resistance as these lines had high infection types at the seedling stage, but low AUDPC at the adult plant stage. Resistance from Aegilops tauschii was identified only at seedling stage in those synthetic hexaploid wheats in which the contributing durum parent was susceptible. The synthetic hexaploid wheats found resistant in this study are potential candidates for bread wheat improvement.

Keywords : Yellow rust; AUDPC.

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