Abstract

FERMIN, J.R.; SALCEDO, D.Y.; DURANTE RINCON, C.  and  CASTRO, J.A.. Análisis de tensión/tamaño en compuestos ternarios AgIn₅VI₈ (VI = S, Se, Te) mediante difracción de Rayos-x. Rev. mex. fis. [online]. 2017, vol.63, n.4, pp.345-350. ISSN 0035-001X.

In this work, we have study the microestructural properties of the ternary compounds AgIn5VI8 (VI= S, Se, Te) by X-ray diffraction technique (XRD). The linewidth of the XRD profile is measured as function of the diffraction angle. Structural parameters such as, average grain size, microstrains, and crystalline dislocation density, are obtained on the framework of a strain/size analysis based on the modified Scherrer equation for Gaussian profiles. The crystalline dislocations arrange according to a Gaussian distribution function, indicating that these dislocations are randomly distributed within the grains.

Keywords : Strain/size analysis; Scherrer modified equation; microstructural properties; ternary compounds AgIn₅VI₈.

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