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Revista mexicana de física

Print version ISSN 0035-001X

Abstract

MARTINEZ, J.A.; VALENZUELA, J.; HERNANDEZ, M.P.  and  HERRERA, J.. Automatización de un microscopio de barrido por efecto túnel utilizando una tarjeta OMB-DaqBoard/2000 y LabVIEW. Rev. mex. fis. [online]. 2016, vol.62, n.1, pp.45-50. ISSN 0035-001X.

This paper shows the work for the automation and control of a scanning tunneling microscope (STM) built by the authors. The interface between the computer and the microscope has been implemented by mean of the data acquisition board OMB-DaqBoard/2000. A developed software in LabVIEW generates the signals required for the X-Y scanning, and it simultaneously acquires the Z voltages, related to the tunneling current between the tip and the sample. The program constructs the microscopy images of the studied surface from the Z voltages. The process to calibrate the instrument using atomic resolution images of known samples is also presented.

Keywords : Scanning tunneling microscopy; microscopy instrumentation; data acquisition.

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