Abstract

LOPEZ-MALDONADO, G. et al. Graphite thin film characterization using a simplified resonant near field scanning microwave microscope. Rev. mex. fis. [online]. 2014, vol.60, n.1, pp.88-94. ISSN 0035-001X.

We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non-uniform granular graphite film sample and the surface resistance results agree with data in the literature.

Keywords : Near field scanning microwave microscopy; surface resistance; topographic images; resonant probe; resonant frequency.

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