Abstract

GALICIA, R. et al. A program for phase identification using diffractograms obtained from TEM structure images. Rev. mex. fis. [online]. 2013, vol.59, n.2, pp.102-106. ISSN 0035-001X.

In this work a computer program for the indexing of diffractograms is presented. The diffractograms are obtained by means of a discrete Fourier transform from high resolution electron microscope images. The program requires the use of x-ray diffraction data files together with a fast Fourier transform program, for this purpose we used the Digital Micrograph software.

Keywords : Electron microscopy; X-ray diffraction; difractograms; indexing.

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