Abstract

PALAVICINI, C.; JAOUEN, Y.; GALLION, P.  and  CAMPUZANO, G.. Caracterización de componentes fotónicos utilizando reflectometría optica de baja coherencia. Rev. mex. fis. [online]. 2006, vol.52, n.4, pp.379-386. ISSN 0035-001X.

Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

Keywords : Optical low-coherence reflectometry; photonic device characterization.

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