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Journal of applied research and technology

versión On-line ISSN 2448-6736versión impresa ISSN 1665-6423

J. appl. res. technol vol.12 no.1 Ciudad de México feb. 2014


Projector Calibration for Pattern Projection Systems


I. Din*1, H. Anwar2, I. Syed1, H. Zafar3, L. Hasan3


1 Department of Electronics Engineering, Incheon National University, Incheon, South Korea. *

2 PhD School of Informatics, Vienna University of Technology (TU Vienna), Vienna, Austria.

3 Department of Computer Systems Engineering, UET Peshawar, Peshawar, Pakistan.



In this paper we proposed a method for geometric calibration of a projector. This method makes use of a calibrated camera to calibrate the projector. Since the projector works inversely with a camera i.e., it projects the image instead of capturing it, so it can be considered as a reverse camera. The projector is calibrated with the help of a calibrated camera using two types of chessboard, a printed chessboard and a projected chessboard by the projector. The object points of the projected chessboard pattern are measured with the help of calibrated camera and the image points are directly acquired from the chessboard pattern to be projected. Then using these object points and image points the projector is calibrated. Once the projector calibration is done, the transformation matrices (from projector to screen, from camera to screen and from camera to projector) are determined which are used for the reconstruction of the 3D geometry.

Keywords: calibration, extrinsic parameters, intrinsic parameters.





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