Resumen

SANCHEZ-HERNANDEZ, H. H.; PEREZ-ABARCA, J. M.; SANTIAGO-ALVARADO, A.  y  CRUZ-FELIX, A. S.. Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance. Rev. mex. fis. [online]. 2022, vol.68, n.3, e031304.  Epub 14-Abr-2023. ISSN 0035-001X.  https://doi.org/10.31349/revmexfis.68.031304.

In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the Surface Plasmon Resonance (SPR) at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and Δ.

Palabras llave : Surface plasmon; polarization; ellipsometry; film thickness.

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