<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>2448-5691</journal-id>
<journal-title><![CDATA[Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología]]></journal-title>
<abbrev-journal-title><![CDATA[Mundo nano]]></abbrev-journal-title>
<issn>2448-5691</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S2448-56912019000200301</article-id>
<article-id pub-id-type="doi">10.22201/ceiich.24485691e.2019.23.67334</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[De los micrómetros a los picómetros: evolución de las técnicas de microscopía para el estudio de nanomateriales]]></article-title>
<article-title xml:lang="en"><![CDATA[From micrometers to picometers: evolution of microscopy techniques for the study of nanomaterials]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Rivera]]></surname>
<given-names><![CDATA[Margarita]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Arenas-Alatorre]]></surname>
<given-names><![CDATA[Jesús]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Nacional Autónoma de México Instituto de Física ]]></institution>
<addr-line><![CDATA[Ciudad de México ]]></addr-line>
<country>Mexico</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>12</month>
<year>2019</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>12</month>
<year>2019</year>
</pub-date>
<volume>12</volume>
<numero>23</numero>
<fpage>0</fpage>
<lpage>0</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S2448-56912019000200301&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S2448-56912019000200301&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S2448-56912019000200301&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[RESUMEN: En las últimas décadas, las técnicas de microscopía electrónica (EM) y microscopía de barrido por sonda (SPM) han contribuido enormemente al estudio de nanomateriales en muchos campos de investigación, dando información de propiedades morfológicas, estructurales, de superficie, eléctricas y magnéticas, entre muchas otras. Los avances tecnológicos recientes asociados con estas técnicas han permitido alcanzar límites de resolución espacial que hace 25 años era inimaginables, siendo los últimos valores reportados de decenas de picómetros (10-12 m). Adicionalmente, estas técnicas han crecido en sus capacidades de análisis en el campo de las nanociencias y nanotecnología, dando lugar a otras microscopías independientes, o incluso complementarias, que han contribuido al entendimiento de fenómenos de interacción y propiedades fisicoquímicas a escalas atómicas y moleculares. En este articulo, se hace un análisis de la trascendencia actual que tienen las técnicas de microscopía electrónica y de microscopia de barrido por sonda, y se mencionan brevemente algunos de sus alcances actuales como métodos de caracterización y análisis. Finalmente, se señalan algunas retos, así como perspectivas, en cuanto a su enorme potencial para impulsar el estudio y entendimiento de procesos físicos y químicos a nanoescala.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[ABSTRACT: Over the last few decades, electron microscopy (EM) and scanning probe microscopy (SPM) techniques have had a great contribution to the study of nanomaterials in many research fields, providing morphological, structural, interfacial, electric and magnetic information, among many others. Recent technological advances of these techniques have helped to achieve unprecedent spatial resolution limits unimaginable 25 years ago, being the last reported values of tenths of picometers (10-12 m). In addition, these techniques have grown in analytical capabilities in the nanoscience and nanotechnology fields, resulting in new independent, or even complimentary, techniques that have improved the understanding of interaction phenomena and physicochemical properties at the atomic and molecular scale. In this paper, an analysis of the actual importance of these techniques as well as some of their recent characterization and analytical achievements are discussed. Finally, in view of its enormous progress and large potential in the study and understanding of physical and chemical processes at the nanoscale, future challenges and perspectives are underlined.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[microscopía electrónica de barrido]]></kwd>
<kwd lng="es"><![CDATA[microscopía electrónica de barrido de emisión de campo]]></kwd>
<kwd lng="es"><![CDATA[microscopía electrónica de transmisión]]></kwd>
<kwd lng="es"><![CDATA[campo oscuro anular a ángulo grande en alta resolución]]></kwd>
<kwd lng="es"><![CDATA[microscopía electrónica de transmisión de barrido]]></kwd>
<kwd lng="es"><![CDATA[microscopía de fuerza atómica]]></kwd>
<kwd lng="es"><![CDATA[microscopía de efecto tunel]]></kwd>
<kwd lng="es"><![CDATA[espectroscopía de tunelamiento de barrido]]></kwd>
<kwd lng="es"><![CDATA[microscopía de fuerza magnética]]></kwd>
<kwd lng="en"><![CDATA[scanning electron microscopy (SEM)]]></kwd>
<kwd lng="en"><![CDATA[field emission electron microscopy (FSEM)]]></kwd>
<kwd lng="en"><![CDATA[transmission electron microscopy (TEM)]]></kwd>
<kwd lng="en"><![CDATA[high resolution-high angle annular dark field (HR-HAADF)]]></kwd>
<kwd lng="en"><![CDATA[scanning transmission electron microscopy (STEM)]]></kwd>
<kwd lng="en"><![CDATA[atomic force microscopy (AFM)]]></kwd>
<kwd lng="en"><![CDATA[scanning tunneling microscopy (STM)]]></kwd>
<kwd lng="en"><![CDATA[scanning tunneling spectroscopy (STS)]]></kwd>
<kwd lng="en"><![CDATA[magnetic force microscopy (MFM)]]></kwd>
</kwd-group>
</article-meta>
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</name>
</person-group>
<article-title xml:lang=""><![CDATA[Effect of medium on interaction forces between atomic force microscopy (AFM) tip and gold nanoparticle]]></article-title>
<source><![CDATA[Journal of Physics: Conference Series]]></source>
<year>2018</year>
<volume>1083</volume>
<numero>1</numero>
<issue>1</issue>
</nlm-citation>
</ref>
</ref-list>
</back>
</article>
