<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2013000500002</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Electrical and structural characteristics of spray deposited (ZnO)X-(CdO)1-X thin films]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Alarcón-Flores]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Vásquez-Pérez]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Peláez-Rodríguez]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Villa-Garcia]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Carmona-Téllez]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Luna-Guzmán]]></surname>
<given-names><![CDATA[J. A.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Falcony]]></surname>
<given-names><![CDATA[C.]]></given-names>
</name>
<xref ref-type="aff" rid="A03"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Aguilar-Frutis]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Instituto Politécnico Nacional Centro de Investigación en Ciencia Aplicada y Tecnología Avanzada ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
<country>México</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad Autónoma Metropolitana-Azcapotzalco  ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
<country>México</country>
</aff>
<aff id="A03">
<institution><![CDATA[,Insituto Politécnico Nacional Centro de Investigación y de Estudios Avanzados ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>10</month>
<year>2013</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>10</month>
<year>2013</year>
</pub-date>
<volume>59</volume>
<numero>5</numero>
<fpage>403</fpage>
<lpage>411</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2013000500002&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2013000500002&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2013000500002&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[(ZnO)X-(CdO)1-X thin films were deposited on glass substrates at 300°C and 400°C by ultrasonic spray pyrolysis with compositions ranging from CdO to ZnO. The electrical properties were obtained by impedance spectroscopy and Hall Effect measurements. Scanning electron microscopy, energy dispersive spectroscopy, and X-ray diffraction, were used to study the structural characteristics of the films. Ellipsometry, in addition, was used to confirm the structural characteristics. The films as deposited resulted mainly polycrystalline and dense, depending on the substrate temperature and on their relative composition. All the films showed n-type conductivity and the films with intermediate compositions resulted in a mixture of both phases; CdO and ZnO. Hall Effect measurements showed that the highest conductivity of CdO was close to 1x10³ (&#937;-cm)-1, the highest value obtained for CdO, without doping. Impedance spectroscopy confirmed the Hall Effect results, showing that the highly conducting character of CdO influenced dramatically the conductivity of the (ZnO)X-(CdO)1-X films. In addition, depending on the substrate temperature and on the relative composition of the films, both, the bulk or grains, as well as the grain boundaries properties limit the conductivity in them.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Películas delgadas de (ZnO)x(CdO)1_x fueron depositadas sobre sustratos de vidrio a 300°C y 400°C por rocío pirolítico ultrasónico con composiciones entre CdO y ZnO. Las propiedades eléctricas fueron determinadas a través de medidas de espectroscopia de impedancia y Efecto Hall. Microscopía electrónica de barrido, espectroscopia por dispersión de energía y difracción de rayos X fueron utilizadas para determinar las características estructurales de las películas. Elipsometría fue empleada para confirmar las características estructurales. Las películas, tal y como son depositadas resultaron policristalinas y densas, dependiendo de la temperatura del sustrato y de la composición relativa de ellas. Todas las películas mostraron una conductividad de tipo n y las películas con concentraciones intermedias resultaron con una mezcla de ambas fases; CdO y ZnO. Las mediciones de Efecto Hall mostraron que la más alta conductividad de las películas de CdO fue cercano a 1 x 10³ (&#937;-cm)-1, valor más alto obtenido para CdO sin dopante. Las medidas de espectroscopia de impedancia confirmaron los resultados obtenidos por Efecto Hall, y mostraron además que el alto carácter conductor de las películas de CdO influye de manera importante en la conductividad de las películas de (ZnO)X-(CdO)1-X. Además, dependiendo de la temperatura del sustrato y de la composición relativa de las películas ambos, los granos (o el bulto), así como las fronteras de grano, limitan la conductividad en ellas.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Impedance spectroscopy]]></kwd>
<kwd lng="en"><![CDATA[transparent conducting oxides (tcos)]]></kwd>
<kwd lng="en"><![CDATA[spray pyrolysis]]></kwd>
<kwd lng="es"><![CDATA[Espectroscopia de impedancia]]></kwd>
<kwd lng="es"><![CDATA[óxidos conductores transparentes (TCOs)]]></kwd>
<kwd lng="es"><![CDATA[rocío pirolítico]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="justify"><font face="verdana" size="4">Investigaci&oacute;n</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="4"><b>Electrical and structural characteristics of spray deposited (ZnO)<i><sub>X</sub></i>&#45;(CdO)<sub>1&#45;<i>X</i></sub> thin films</b></font></p>  	    <p align="center"><font face="verdana" size="2"><b>&nbsp;</b></font></p>  	    <p align="center"><font face="verdana" size="2"><b>G. Alarc&oacute;n&#45;Flores<sup>a</sup>, B. V&aacute;squez&#45;P&eacute;rez<sup>b</sup>, A. Pel&aacute;ez&#45;Rodr&iacute;guez<sup>a</sup>, M. Villa&#45;Garcia<sup>a</sup>, S. Carmona&#45;T&eacute;llez<sup>a</sup>, J. A. Luna&#45;Guzm&aacute;n<sup>a</sup>, C. Falcony<sup>c</sup>, and M. Aguilar&#45;Frutis<sup>a</sup></b></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><sup>a</sup> <i>Centro de Investigaci&oacute;n en Ciencia Aplicada y Tecnolog&iacute;a Avanzada del Instituto Polit&eacute;cnico Nacional, Legaria 694, Col. Irrigaci&oacute;n, Del. Miguel Hidalgo, 11500, M&eacute;xico D.F., M&eacute;xico.</i></font></p>  	    <p align="justify"><font face="verdana" size="2"><i><sup>b</sup> Universidad Aut&oacute;noma Metropolitana&#45;Azcapotzalco, Avenida San Pablo Xalpa 180, Reynosa Tamaulipas, Del. Azcapotzalco, 02200 M&eacute;xico D.F., M&eacute;xico.</i></font></p>  	    <p align="justify"><font face="verdana" size="2"><i><sup>c</sup> Centro de Investigaci&oacute;n y de Estudios Avanzados del Instituto Polit&eacute;cnico Nacional, Apartado Postal 14&#45;740, M&eacute;xico 07000, D.F., M&eacute;xico.</i></font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2">Received 1 February 2013    <br> 	Accepted 18 April 2013</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">(ZnO)<i><sub>X</sub></i>&#45;(CdO)<sub>1&#45;<i>X</i></sub> thin films were deposited on glass substrates at 300&deg;C and 400&deg;C by ultrasonic spray pyrolysis with compositions ranging from CdO to ZnO. The electrical properties were obtained by impedance spectroscopy and Hall Effect measurements. Scanning electron microscopy, energy dispersive spectroscopy, and X&#45;ray diffraction, were used to study the structural characteristics of the films. Ellipsometry, in addition, was used to confirm the structural characteristics. The films as deposited resulted mainly polycrystalline and dense, depending on the substrate temperature and on their relative composition. All the films showed n&#45;type conductivity and the films with intermediate compositions resulted in a mixture of both phases; CdO and ZnO. Hall Effect measurements showed that the highest conductivity of CdO was close to 1x10<sup>3</sup> (&#937;&#45;cm)<sup>&#45;1</sup>, the highest value obtained for CdO, without doping. Impedance spectroscopy confirmed the Hall Effect results, showing that the highly conducting character of CdO influenced dramatically the conductivity of the (ZnO)<i><sub>X</sub></i>&#45;(CdO)<sub>1&#45;<i>X</i></sub> films. In addition, depending on the substrate temperature and on the relative composition of the films, both, the bulk or grains, as well as the grain boundaries properties limit the conductivity in them.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Impedance spectroscopy; transparent conducting oxides (tcos); spray pyrolysis.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Pel&iacute;culas delgadas de (ZnO)x(CdO)<sub>1</sub>_x fueron depositadas sobre sustratos de vidrio a 300&deg;C y 400&deg;C por roc&iacute;o pirol&iacute;tico ultras&oacute;nico con composiciones entre CdO y ZnO. Las propiedades el&eacute;ctricas fueron determinadas a trav&eacute;s de medidas de espectroscopia de impedancia y Efecto Hall. Microscop&iacute;a electr&oacute;nica de barrido, espectroscopia por dispersi&oacute;n de energ&iacute;a y difracci&oacute;n de rayos X fueron utilizadas para determinar las caracter&iacute;sticas estructurales de las pel&iacute;culas. Elipsometr&iacute;a fue empleada para confirmar las caracter&iacute;sticas estructurales. Las pel&iacute;culas, tal y como son depositadas resultaron policristalinas y densas, dependiendo de la temperatura del sustrato y de la composici&oacute;n relativa de ellas. Todas las pel&iacute;culas mostraron una conductividad de tipo n y las pel&iacute;culas con concentraciones intermedias resultaron con una mezcla de ambas fases; CdO y ZnO. Las mediciones de Efecto Hall mostraron que la m&aacute;s alta conductividad de las pel&iacute;culas de CdO fue cercano a 1 <i>x</i> 10<sup>3</sup> (&#937;&#45;cm)<sup>&#45;1</sup>, valor m&aacute;s alto obtenido para CdO sin dopante. Las medidas de espectroscopia de impedancia confirmaron los resultados obtenidos por Efecto Hall, y mostraron adem&aacute;s que el alto car&aacute;cter conductor de las pel&iacute;culas de CdO influye de manera importante en la conductividad de las pel&iacute;culas de (ZnO)<i><sub>X</sub></i>&#45;(CdO)<sub>1&#45;<i>X</i></sub>. Adem&aacute;s, dependiendo de la temperatura del sustrato y de la composici&oacute;n relativa de las pel&iacute;culas ambos, los granos (o el bulto), as&iacute; como las fronteras de grano, limitan la conductividad en ellas.</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2"><b>Descriptores:</b> Espectroscopia de impedancia; &oacute;xidos conductores transparentes (TCOs); roc&iacute;o pirol&iacute;tico.</font></p> 	    <p align="justify">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2">PACS: 84.37.+q; 73.50&#45;h; 68.55&#45;a</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v59n5/v59n5a2.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Acknowledgements</b></font></p>  	    <p align="justify"><font face="verdana" size="2">The authors would like to acknowledge the financial support from Conacyt&#45;M&eacute;xico project CB&#45;2009/129227 and SIP&#45;IPN projects 20101556, 20111101, 20121458 and Multidisci&#45;plinary Project # 1558 (2013). The PIFI&#45;IPN program is also acknowledged. The technical support from M. Guerrero, Alfonso Martinez, and Z. Rivera is also recognized.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>  	    ]]></body>
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