<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2004000500012</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[(Ba,Sr)TiO3 ferroelectric thin films for tunable microwave applications]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Chang]]></surname>
<given-names><![CDATA[Wontae]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Kirchoefer]]></surname>
<given-names><![CDATA[Steven W.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Bellotti]]></surname>
<given-names><![CDATA[J.A.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Pond]]></surname>
<given-names><![CDATA[J.M.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Schlom]]></surname>
<given-names><![CDATA[D.G.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Haeni]]></surname>
<given-names><![CDATA[J.H.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Naval Research Laboratory  ]]></institution>
<addr-line><![CDATA[Washington Distrito de Columbia]]></addr-line>
<country>Estados Unidos de América</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Pennsylvania State University Department of Materials Science and Engineering ]]></institution>
<addr-line><![CDATA[University Park Pennsylvania]]></addr-line>
<country>Estados Unidos de América</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<volume>50</volume>
<numero>5</numero>
<fpage>501</fpage>
<lpage>505</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2004000500012&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2004000500012&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2004000500012&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[The dielectric properties of ferroelectric thin films were investigated for tunable microwave applications. We have observed that epitaxially grown Ba1-x Sr x TiO3 (BST, 0.4&#8804; X &#8804;1) films are distorted from the normal cubic symmetry of the corresponding bulk at room temperature. This structural distortion caused by film strain has a strong impact on the microwave dielectric properties. For compressive strain, the dielectric constant and tuning were decreased and the films showed high dielectric Q. However for tensional strain, the opposite effect was observed. This observation has been interpreted based on phenomenological thermodynamics and strain-induced polarization physics. Two experimental examples, strain-relieved films and strain-enabled films, are presented to show how film strain affects the tunable microwave properties.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[En el presente trabajo se investigan las propiedades dieléctricas de las películas delgadas ferroeléctricas por medio de aplicaciones de microondas sintonizables. Hemos observado que la película de Ba1-x Sr x TiO3 (BST, 0.4&#8804; X &#8804;1) que crece epitaxialmente sufre una distorsión a partir de su simetría cúbica normal a temperatura ambiente. Esta distorsión estructural causada por el esfuerzo aplicado en la película tiene un impacto importante en sus propiedades dieléctricas. En el esfuerzo de compresión, la constante dieléctrica disminuyó y las películas mostraron un Q dieléctrico alto. No obstante, en el esfuerzo de tensión se observó el efecto contrario. Esta observación ha sido interpretada en base a la termodinámica fenomenológica y a la física de polarización inducida por tensión. Se presentan dos ejemplos experimentales, uno en películas libres de esfuerzos y otro en películas en tensión, y se muestra como la presencia de esfuerzos modifican las propiedades de sintonía en microondas.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Ferroelectrics]]></kwd>
<kwd lng="en"><![CDATA[thin films]]></kwd>
<kwd lng="en"><![CDATA[tunable application]]></kwd>
<kwd lng="en"><![CDATA[microwave]]></kwd>
<kwd lng="es"><![CDATA[Ferroeléctricos]]></kwd>
<kwd lng="es"><![CDATA[películas delgadas]]></kwd>
<kwd lng="es"><![CDATA[microondas]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="justify"><font face="verdana" size="4">Investigaci&oacute;n</font></p>     <p align="justify">&nbsp;</p>      <p align="center"><b><font face="verdana" size="4">(Ba,Sr)TiO<sub>3</sub> ferroelectric thin films for tunable microwave applications</font></b></p>     <p align="center">&nbsp;</p>     <p align="center"><b><font face="verdana" size="2">Wontae Chang<sup>a,</sup>*, Steven W. Kirchoefer<sup>a</sup>, J.A. Bellotti<sup>a</sup>,  J.M. Pond<sup>a</sup>,  D.G. Schlom<sup>b</sup> and J.H. Haeni<sup>b</sup></font></b></p>     <p align="center">&nbsp;</p>      <p align="justify"><font face="verdana" size="2"><i><sup>a</sup> Naval Research Laboratory, 4555 Overlook Avenue SW, Washington DC 20375, USA * e&#45;mail:</i> <a href="mailto:chang@estd.nrl.navy.mil">chang@estd.nrl.navy.mil</a></font>.</p>      <p align="justify"><font face="verdana" size="2"><i><sup>b</sup> Department of Materials Science and Engineering, Penn State University, University Park, PA 16802, USA</i></font>.</p>     <p align="justify">&nbsp;</p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">Recibido el 1 de diciembre de 2003.    <br> Aceptado el 28 de enero de 2004</font>.</p>  	    <p align="justify">&nbsp;</p> 	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p> 	    <p align="justify"><font face="verdana" size="2">The dielectric properties of ferroelectric thin films were investigated for tunable microwave applications. We have observed that epitaxially grown Ba<sub>1-x</sub> Sr<sub>x</sub> TiO<sub>3</sub> (BST, 0.4&#8804; X &#8804;1) films are distorted from the normal cubic symmetry of the corresponding bulk at room temperature. This structural distortion caused by film strain has a strong impact on the microwave dielectric properties. For compressive strain, the dielectric constant and tuning were decreased and the films showed high dielectric Q. However for tensional strain, the opposite effect was observed. This observation has been interpreted based on phenomenological thermodynamics and strain&#45;induced polarization physics. Two experimental examples, strain&#45;relieved films and strain&#45;enabled films, are presented to show how film strain affects the tunable microwave properties.</font></p>      <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Ferroelectrics; thin films; tunable application; microwave</font>.</p>     <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>      <p align="justify"><font face="verdana" size="2">En el presente trabajo se investigan las propiedades diel&eacute;ctricas de las pel&iacute;culas delgadas ferroel&eacute;ctricas por medio de aplicaciones de microondas sintonizables. Hemos observado que la pel&iacute;cula de Ba<sub>1-x</sub> Sr<sub>x</sub> TiO<sub>3</sub> (BST, 0.4&#8804; X &#8804;1) que crece epitaxialmente sufre una distorsi&oacute;n a partir de su simetr&iacute;a c&uacute;bica normal a temperatura ambiente. Esta distorsi&oacute;n estructural causada por el esfuerzo aplicado en la pel&iacute;cula tiene un impacto importante en sus propiedades diel&eacute;ctricas. En el esfuerzo de compresi&oacute;n, la constante diel&eacute;ctrica disminuy&oacute; y las pel&iacute;culas mostraron un Q diel&eacute;ctrico alto. No obstante, en el esfuerzo de tensi&oacute;n se observ&oacute; el efecto contrario. Esta observaci&oacute;n ha sido interpretada en base a la termodin&aacute;mica fenomenol&oacute;gica y a la f&iacute;sica de polarizaci&oacute;n inducida por tensi&oacute;n. Se presentan dos ejemplos experimentales, uno en pel&iacute;culas libres de esfuerzos y otro en pel&iacute;culas en tensi&oacute;n, y se muestra como la presencia de esfuerzos modifican las propiedades de sinton&iacute;a en microondas.</font></p>      <p align="justify"><font face="verdana" size="2"><b>Descriptores:</b> Ferroel&eacute;ctricos; pel&iacute;culas delgadas; microondas.</font></p> 	    ]]></body>
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