Federico Sandoval-Ibarra
CINVESTAV-Guadalajara Unit. Av. Científica 1145, Col. El Bajío, 45015 Zapopan, Jalisco, México sandoval@cts-design.com
ABSTRACT
An automatic test environment (ATE) based on a PSoC has been developed to perform electrical characterization of integrated circuits (ICs). The ICs are designed for academic and research purposes as part of the Electronic Design graduate program at CINVESTAV-Guadalajara Unit; these ICs are manufactured in standard N-well, 5-V, 1.5μm/0.5μm CMOS technologies. The ATE offers programmable capabilities to develop master-slave architectures, memory for data storage, functions generator to stimulate circuits and systems, current/voltage sources for several purposes, current-voltage measurements, and ports to download experimental data to a PC. To date, several ICs have been tested with the help of the ATE. In this paper, however, examples based on MOS Transistors only are presented in order to describe the ATE performance and also to show how experimental data of the devices under characterization were validated through SPICE simulations, experimental data given by manufacturers, and using commercial equipment as well.
Keywords: Microelectronics, electric variables measurement, teaching.
]]>RESUMEN
Se ha desarrollado un ambiente automático de pruebas (ATE) basado en un PSoC comercial para realizar la caracterización eléctrica de circuitos integrados (CIs). Los CIs son diseñados para propósitos académicos y de investigación como parte del programa de posgrado de la Unidad Guadalajara del CINVESTAV; esos CIs son fabricados en tecnologías pozo-N, 5-V, 1.5μm/0.5μm CMOS estándar. El ATE ofrece capacidades de programación para desarrollar arquitecturas amo-esclavo, memoria para almacenar información, generador de funciones para estimular circuitos y sistemas, fuente de voltaje/corriente para diversos propósitos, mediciones en voltaje/corriente, y puertos para descargar información experimental a una computadora personal. A la fecha, varios CIs han sido caracterizados con ayuda del ATE. En esta contribución, por cuestiones de espacio, se presentan algunos ejemplos basados en transistores MOS para mostrar la operación del ATE y también para mostrar cómo los resultados experimentales de los dispositivos bajo caracterización se validaron a través de simulaciones SPICE, de información experimental dada por los fabricantes, y también usando equipo de medición comercial.
Palabras clave: Microelectrónica, medición de variables eléctricas, enseñanza.
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