<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1665-6423</journal-id>
<journal-title><![CDATA[Journal of applied research and technology]]></journal-title>
<abbrev-journal-title><![CDATA[J. appl. res. technol]]></abbrev-journal-title>
<issn>1665-6423</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1665-64232007000200002</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[A FPGA implementation of solder paste deposit on printed circuit boards errors detector based in a bright and contrast algorithm]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[De Luca-Pennacchia]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Sánchez-Martínez]]></surname>
<given-names><![CDATA[M. Á.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Instituto Politécnico Nacional Centro de Investigación y de Estudios Avanzados ]]></institution>
<addr-line><![CDATA[México Distrito Federal]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2007</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2007</year>
</pub-date>
<volume>5</volume>
<numero>2</numero>
<fpage>89</fpage>
<lpage>101</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1665-64232007000200002&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1665-64232007000200002&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1665-64232007000200002&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Solder paste deposit on printed circuit boards (PCB) is a critical stage. It is known that about 60% of functionality defects in this type of boards are due to poor solder paste printing. These defects can be diminished by means of automatic optical inspection of this printing. Actually, this process is implemented by image processing software with its inherent high computational time cost. In this paper we propose to implement a high parallel degree image comparison algorithm suitable to be implemented on FPGA, which could be incorporated to an automatic inspection system. The hardware implementation of the algorithm allows us to fulfill time requirements demanded by industry.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[El depósito de soldadura de pasta es una fase crítica en las placas de circuitos impresos (PCB por sus siglas en inglés). Se sabe que cerca del 60% de los defectos funcionales en este tipo de placas son debidos a una impresión de soldadura de pasta deficiente. De hecho, este proceso es implementado mediante software de procesamiento de imagen con su inherente alto costo computacional. En este trabajo proponemos implementar un algoritmo de comparación de imagen con un alto grado de paralelismo idóneo para ser implementado en FPGA, el cual puede ser incorporado a un sistema de inspección automático. La implementación en hardware del algoritmo nos permite satisfacer los requerimientos en tiempo demandados por la industria.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Solder]]></kwd>
<kwd lng="en"><![CDATA[paste inspection]]></kwd>
<kwd lng="en"><![CDATA[histogram]]></kwd>
<kwd lng="en"><![CDATA[comparison]]></kwd>
<kwd lng="en"><![CDATA[FPGA]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="center"><font face="verdana" size="4"><b>A FPGA implementation of solder paste deposit on printed circuit boards errors detector based in a bright and contrast algorithm</b></font></p>  	    <p align="center"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="2"><b>A. De Luca&#45;Pennacchia &amp; M. &Aacute;. S&aacute;nchez&#45;Mart&iacute;nez</b></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Department of Computation, CINVESTAV&#45;IPN, Mexico D.F., Mexico Phone (5255) 50&#45;61&#45;38&#45;00 Fax (5255) 50&#45;61&#45;37&#45;57, E&#45;mail</i>: <a href="mailto:dlap@delta.cs.cinvestav.mx">dlap@delta.cs.cinvestav.mx</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Solder paste deposit on printed circuit boards (PCB) is a critical stage. It is known that about 60% of functionality defects in this type of boards are due to poor solder paste printing. These defects can be diminished by means of automatic optical inspection of this printing. Actually, this process is implemented by image processing software with its inherent high computational time cost. In this paper we propose to implement a high parallel degree image comparison algorithm suitable to be implemented on FPGA, which could be incorporated to an automatic inspection system. The hardware implementation of the algorithm allows us to fulfill time requirements demanded by industry.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords</b>: Solder, paste inspection, histogram comparison, FPGA.</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>  	    <p align="justify"><font face="verdana" size="2">El dep&oacute;sito de soldadura de pasta es una fase cr&iacute;tica en las placas de circuitos impresos (PCB por sus siglas en ingl&eacute;s). Se sabe que cerca del 60% de los defectos funcionales en este tipo de placas son debidos a una impresi&oacute;n de soldadura de pasta deficiente. De hecho, este proceso es implementado mediante software de procesamiento de imagen con su inherente alto costo computacional. En este trabajo proponemos implementar un algoritmo de comparaci&oacute;n de imagen con un alto grado de paralelismo id&oacute;neo para ser implementado en FPGA, el cual puede ser incorporado a un sistema de inspecci&oacute;n autom&aacute;tico. La implementaci&oacute;n en hardware del algoritmo nos permite satisfacer los requerimientos en tiempo demandados por la industria.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/jart/v5n2/v5n2a2.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p> 	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>7.&nbsp;REFERENCES</b></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;1&#93; TM.J. Swain, D.H. Ballard. Color indexing. International Journal of Computer Vision, 7(1) (1991) 11&#45;32.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4818994&pid=S1665-6423200700020000200001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;2&#93; R.P. Prasad. <i>Surface</i> Mount Technology Principles and Practice. Van Nostrand Reinhold, New York, 1989.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4818996&pid=S1665-6423200700020000200002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;3&#93; E.N. Malamasa, E.G.M. Petrakisa, M. Zervakisa, L.P&#45;D. Legat. A survey on industrial vision systems, applications and tools. Image and Vision Computing, 21(2) (2003) 171&#45;188.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4818998&pid=S1665-6423200700020000200003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;4&#93; T. Baidyk, E. Kussul, O. Makeyev. Texture recognition with random neural classifier. WSEAS Transactions on Circuits and Systems, 4(4) (2005) 319&#45;324.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4819000&pid=S1665-6423200700020000200004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;5&#93; .&#45;C. Chen, S.&#45;Y. Chen., Image classification using color, texture and regions. Image and Vision Computing, 21(9) (2003) 759&#45;776.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4819002&pid=S1665-6423200700020000200005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      ]]></body><back>
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</article>
