<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1665-6423</journal-id>
<journal-title><![CDATA[Journal of applied research and technology]]></journal-title>
<abbrev-journal-title><![CDATA[J. appl. res. technol]]></abbrev-journal-title>
<issn>1665-6423</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1665-64232004000100007</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Modeling an improved method for double modulation photo reflectance experiments]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Hernández]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Ivanov]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,,Universidad de La Habana Facultad de Física ]]></institution>
<addr-line><![CDATA[La Habana ]]></addr-line>
<country>Cuba</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad Autónoma de Zacatecas Facultad de Física ]]></institution>
<addr-line><![CDATA[Zacatecas ]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<volume>2</volume>
<numero>1</numero>
<fpage>68</fpage>
<lpage>75</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1665-64232004000100007&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1665-64232004000100007&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1665-64232004000100007&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[This paper describes an improved method to be used in double modulation photo reflectance experiments, in order to reduce the influence of parasitic effects in the useful signal. The method uses the inner and outer sections of a single chopper disk to modulate the monochromator and the laser beam, eliminating the need of complex electronic filters, and two additional PIN photodiodes for scattered light compensation. The method has been numerically simulated using LabVIEW in order to investigate the influence of the modulator finite switching time and the finite resolution of the digital acquisition system. Results show that a relative error less than 1% can be achieved.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Photo reflectance]]></kwd>
<kwd lng="en"><![CDATA[Double modulation]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="center"><font face="verdana" size="4"><b>Modeling an improved method for double modulation photo reflectance experiments</b></font></p>     <p align="center">&nbsp;</p>  	    <p align="center"><b><font face="verdana" size="2">M. Hern&aacute;ndez<sup>1</sup> &amp; R. Ivanov<sup>2</sup></font></b><font face="verdana" size="2"></font></p>     <p align="center">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2"><sup>1</sup>&nbsp;<i>Facultad de F&iacute;sica, UH, Cuba</i>. Email: <a href="mailto:mhernan@ff.oc.uh.cu">mhernan@ff.oc.uh.cu</a></font></p>  	    <p align="justify"><font face="verdana" size="2"><sup>2</sup>&nbsp;<i>Facultad de F&iacute;sica, UAZ, M&eacute;xico.</i> Email: <a href="mailto:rumen@ahobon.reduaz.mx">rumen@ahobon.reduaz.mx</a></font></p> 	    <p align="justify">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2">Received: November 27<sup>th</sup>, 2001.     <br>     Accepted October 15<sup>th</sup>, 2002.</font></p>     ]]></body>
<body><![CDATA[<p align="justify">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">This paper describes an improved method to be used in double modulation photo reflectance experiments, in order to reduce the influence of parasitic effects in the useful signal. The method uses the inner and outer sections of a single chopper disk to modulate the monochromator and the laser beam, eliminating the need of complex electronic filters, and two additional PIN photodiodes for scattered light compensation. The method has been numerically simulated using LabVIEW in order to investigate the influence of the modulator finite switching time and the finite resolution of the digital acquisition system. Results show that a relative error less than 1% can be achieved.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Photo reflectance, Double modulation.</font></p>     <p align="justify">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/jart/v2n1/v2n1a7.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p> 	    <p align="justify">&nbsp;</p>  	    <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;1&#93; Shen H., Dutta M. "Sweeping photoreflectance spectroscopy of semiconductors", Appl. Phys. Lett., 57, (6), 587, (1990).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814985&pid=S1665-6423200400010000700001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">&#91;2&#93; Sousa D.F., Bell M.J.V., Nunes L.A.O., "Photoreflectance and time&#45;sesolved photoreflectance in delta&#45;doped superlattices", J. Appl. Phys., 83, (5), 2806, (1998).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814987&pid=S1665-6423200400010000700002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p> 	    <!-- ref --><p align="justify"><font face="verdana" size="2"> &#91;3&#93; Sydor M., Badakshan A., "Different photoreflectance from a high&#45;mobility and highly luminescent two&#45;dimensional electron gas", J. Appl. Phys., 70, (4), 2322, (1991).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814989&pid=S1665-6423200400010000700003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p> 	    <!-- ref --><p align="justify"><font face="verdana" size="2"> &#91;4&#93; Klem J.F., Breiland W.G., Fritz I.J., Drummond T.J., Lee S.R., "Application of in situ reflectance monitoring to molecular beam epitaxy of vertical&#45;cavity structures", J. Vac. Sci. Technol., B16 (3) 1498, (1998).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814991&pid=S1665-6423200400010000700004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --> </font></p> 	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;5&#93; Ghosh S., Arora B.M., "Photo reflectance spectroscopy with white light pump beam", Rev. Sci. Instrum., 69, (3), 1261, (1998).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814993&pid=S1665-6423200400010000700005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;6&#93; Catalog "Scientific and Engineering Instruments", Ed.: "Stanford Research Systems", 84, (2000).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4814995&pid=S1665-6423200400010000700006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     ]]></body>
<body><![CDATA[ ]]></body><back>
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