<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1665-3521</journal-id>
<journal-title><![CDATA[Superficies y vacío]]></journal-title>
<abbrev-journal-title><![CDATA[Superf. vacío]]></abbrev-journal-title>
<issn>1665-3521</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1665-35212005000400013</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Factores de sensibilidad XPS para la cuantificación de catalizadores de Bi 2 Mo x W 1-x O 6]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Bartolo-Pérez]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Peña]]></surname>
<given-names><![CDATA[J.L.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Rangel]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Manzanilla]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Riech]]></surname>
<given-names><![CDATA[I.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,IPN CINVESTAV Departamento de Física Aplicada]]></institution>
<addr-line><![CDATA[Mérida Yuc.]]></addr-line>
<country>Mexico</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Universidad Autónoma de Campeche Programa de Corrosión del Golfo México ]]></institution>
<addr-line><![CDATA[Campeche Cam.]]></addr-line>
<country>Mexico</country>
</aff>
<aff id="Af3">
<institution><![CDATA[,Universidad Michoacana de San Nicolás de Hidalgo Facultad de Ingeniería Química ]]></institution>
<addr-line><![CDATA[Morelia Mich.]]></addr-line>
<country>México</country>
</aff>
<aff id="Af4">
<institution><![CDATA[,Universidad Autónoma de Yucatán Facultad de Ingeniería Física ]]></institution>
<addr-line><![CDATA[Mérida Yuc.]]></addr-line>
<country>Mexico</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2005</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2005</year>
</pub-date>
<volume>18</volume>
<numero>4</numero>
<fpage>13</fpage>
<lpage>17</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1665-35212005000400013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1665-35212005000400013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1665-35212005000400013&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen La espectroscopia de fotoelectrones de rayos se utiliza ampliamente para determinar la composición química y los estados de oxidación de materiales sólidos. Para la cuantificación con XPS es necesario tener factores de sensibilidad relativos confiables. Se presentan espectros XPS generales y de alta resolución de los estándares de MoO3, WO3 y Bi2O3. El estado de oxidación de oxígeno no cambia en los estándares; por lo tanto se toma como referencia el factor de sensibilidad del oxígeno. Se obtienen los factores de sensibilidad XPS para Mo, W y Bi; y a continuación se hace uso de estos para la cuantificación de los catalizadores de Bi2MoxW1-xO6. También se determinan los compuestos que se forman en estos catalizadores.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract X-ray photoelectron spectroscopy is used widely to determine the chemical composition and oxidation states of solid materials. For quantification with XPS it is necessary to have reliable sensitivity factors. XPS general and high resolution spectra of standards of MoO3, WO3 and Bi2O3 are presented. The oxidation state of oxygen does not change in the standards; therefore the sensitivity factor of oxygen is taken like reference. XPS sensitivity factors of Mo, W and Bi are obtained; and next use becomes of these for the quantification of the catalysts of Bi2MoxW1-xO6. Also the compounds that form in these catalysts are determined.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[Catalyst]]></kwd>
<kwd lng="es"><![CDATA[XPS]]></kwd>
<kwd lng="es"><![CDATA[quantification]]></kwd>
<kwd lng="en"><![CDATA[Catalizadores]]></kwd>
<kwd lng="en"><![CDATA[XPS]]></kwd>
<kwd lng="en"><![CDATA[Cuantificación]]></kwd>
</kwd-group>
</article-meta>
</front><back>
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