A New Analytical Method to Calculate the Characteristic Impedance Zc of Uniform Transmission Lines
Nuevo método analítico para calcular la impedancia característica Zc de líneas de transmisión uniformes
José Eleazar Zúñiga-Juárez1, J. Apolinar Reynoso-Hernández1, María del Carmen Maya-Sánchez1, and Roberto S. Murphy-Arteaga2
1 Centro de Investigación Científica y de Educación Superior de Ensenada (CICESE),División de Física Aplicada, Depto. Electrónica y Telecomunicaciones, Km. 107 Carretera Tijuana-Ensenada, 22860, Ensenada, B.C., México apolinar@cicese.mx, ezuniga@cicese.mx
]]> 2 Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE), Departamento de Electrónica, Luis Enrique Erro 1, 72840, Tonantzintla, Puebla, México rmurphy@inaoep.mx
Article received on 13/05/2010;
accepted on 28/01/2011.
Abstract
A new analytical method to calcúlate the characteristic impedance of transmission lines embedded in identical, symmetrical and reciprocal connectors is herein presented. To calcalate the characteristic impedance of transmission lines, the proposed method uses S-parameter measurements performed on two uniform transmission lines having the same characteristic impedance and propagation constant but different lengths. The method was successfully applied to characterize microstrip lines printed on an FR4 substrate in the 0.45-4GHz frequency range.
Keywords. Characteristic impedance, propagation constant, microstrip line, symmetrical-reciprocal connectors.
Resumen
]]> Se presenta un nuevo método analítico para calcular la impedancia característica de líneas de transmisión uniformes insertadas entre conectores iguales, recíprocos y simétricos. Para calcular la impedancia característica de las líneas, el método propuesto utiliza mediciones de parámetros S de dos líneas de transmisión que tienen la misma impedancia característica y la misma constante de propagación pero diferentes longitudes. El método fue aplicado exitosamente en la caracterización de líneas de microcinta construidas en un substrato tipo FR4 en el rango de frecuencias de 0.045 a 4 GHz.Palabras clave: Impedancia característica, constante de propagación, línea de microcinta, conectores simétricos y recíprocos.
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References
1. Achar, R. & Nakhla, M.S. (2001). ''Simulation of high-speed interconnects'', Proc. IEEE, Vol. 89, No. 5, May2001, pp. 693-778. [ Links ]
2. Agilent ADS Ver. 2009 Agilent technologies. http://www.home.agilent.com/agilent/product.jspx?cc=US&lc=eng&ckey=1297113&nid=-34346.0.00&id=1297113 [ Links ]
3. Bianco, B., Parodi, R.M., ''Determination of the propagation constant of uniform microstrip lines'', Alta Frequence, Vol. 45, No. 2, febrero 1976, pp.107-110. [ Links ]
4. Deutsch, A., ''Electrical characterization of interconnections for high-performance systems'' Proc. IEEE., Vol. 86, No.2, Feb. 1998, pp. 315-357. [ Links ]
5. Enders, A. (1989). An accurate measurement technique for the line properties, junction-effects and dielectric and magnetic material parameters. IEEE Transactions on Microwave Theory Techniques, 37(3), 598-605. [ Links ]
6. Goyal, R. (1994). Managing signal integrity. IEEE Spectrum, 31(3), 54-58. [ Links ]
7. Janezic, M.D. & Jargon, J.A. (1999). Complex Permitivity Determination from Propagation Constant Measurements. IEEE Microwave and Guided Wave Letters, 9(2), 76-78. [ Links ]
8. Lee, M.Q. & Nam, S. (1996). An accurate broadband measurement of substrate dielectric constant. IEEE Microwave and Guided Wave Letters, 6(4), 168-170. [ Links ]
9. Mangan, A.M., Voinigescu, S.P., Yang, M.T., & Tazlauanu, M. (2006). De- Embedding transmission line measurements for accurate modeling of IC designs. IEEE Transaction on Electrón Devices, 53(2), 235-241. [ Links ]
10. Narita, K. & Kushta, T. (2006). An Accurate experimental method for characterizing transmission lines embedded in multilayer printed circuits boards. IEEE Transaction on Advanced Packaging, 29(1), 114-121. [ Links ]
11. Reynoso-Hernández, J.A., Estrada-Maldonado, C.F., Parra, T., Grenier, K., & Graffeuil, J. (1999). An improved method for the wave propagation constant estimation in broadband uniform millimeter-wave transmission line. Microwave and Optical Technology Letters, 22(4), 268-271. [ Links ]
12. Reynoso-Hernández, J.A. (2003). Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines. IEEE Microwave and Wireless Components Letters, 13(8), 351-353. [ Links ]
13. Steer, M.B., Goldberg, S.B., Frazon, P.D., & Enders, A. (1992). Comments on An accurate measurement technique for the line properties, junctions effects, and dielectric and magnetic parameters. IEEE Transactions on Microwave Theory and Techniques, 40(2), 410-411. [ Links ]
14. Torres-Torres, R., Romo, G., Armenia, L., & Horine, B. (2009). Analytical Characteristic Impedance Determination Method for Microstrip Lines Fabricated on Printed Circuit Boards. International Journal of RF Microwave Computer-Aided Engineering, 19(1), 60-68. [ Links ]
15. Williams, D.F. & Marks, R.B. (1991). Transmission Line Capacitance Measurement. IEEE Microwave and Guided Wave Letters, 1(9), 243-245. [ Links ]
16. Williams, D.F. & Marks, R.B. (1993). Accurate Transmission Line characterization. IEEE Microwave and Guided Wave Letters, 3(8), 247-249. [ Links ]
17. Zuñiga-Juárez, J.E., Reynoso-Hernández J.A., & Zarate-de Landa, A. (2008). A new method for determining the characteristic impedance Zc of transmission lines embedded in symmetrical transitions. 2008 IEEE MTT-S International Microwave Symposium Digest, Atlanta, Georgia, USA, 52-55. [ Links ]
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