<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2004000300005</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Novel tunable acceptor doped BST thin films for high quality tunable microwave devices]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Cole]]></surname>
<given-names><![CDATA[M.W.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Geyer]]></surname>
<given-names><![CDATA[R.G.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,United States Army Research Laboratory Weapons and Materials Research Directorate Aberdeen Proving Ground]]></institution>
<addr-line><![CDATA[ MD]]></addr-line>
<country>U.S.A.</country>
</aff>
<aff id="A02">
<institution><![CDATA[,National Institute of Standards and Technology , RF Technology Division ]]></institution>
<addr-line><![CDATA[Boulder Colorado]]></addr-line>
<country>Estados Unidos de América</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2004</year>
</pub-date>
<volume>50</volume>
<numero>3</numero>
<fpage>232</fpage>
<lpage>238</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2004000300005&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2004000300005&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2004000300005&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[The materials properties of undoped and low concentration Mg doped Ba0.6.Sr0.4TiO3 (BST) thin films are reported. The films were fabricated on single crystal (100) MgO and Pt coated Si substrates via the metalorganic solution deposition (MOSD) technique using carboxylate-alkoxide precursors and post-deposition annealed at 800°C (film/MgO substrates) and 750°C (film/Pt-Si substrates). The dielectric properties were measured at 10 GHz using unpatterned/non-metallized films via a tuned coupled/split dielectric resonator system and at 100 kHz using metal-insulator-metal capacitors. The structure, microstructure, surface morphology and film/substrate compositional quality were analyzed and correlated to the films dielectric and insulating properties. The Mg doped BST films exhibited improved dielectric loss and insulating characteristics compared to the undoped BST thin films. The improved dielectric properties, low leakage current, and good tunability of the low level Mg doped BST thin films merits strong potential for utilization in microwave tunable devices.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Se reportan las propiedades de láminas delgadas de Ba0.6.Sr0.4TiO3 (BST) puro y dopado con bajas concentraciones de Mg. Las láminas fueron obtenidas sobre monocristales (100) MgO y sustratos de Si cubiertos de Pt, por deposición de solución metalorgánica (MOSD) usando precursores de carboxilato-alkóxido y recocido post-deposición a 800°C (sustratos lamina/MgO) y 750°C (sustratos lámna/Pt-Si). Las propiedades dieléctricas fueron medidas a 10 GHz usando láminas no-empatronadas/no-metalizadas por sintonía de un sistema dieléctrico resonante de acople/desacople y a 100 kHz mediante capacitores metal-aislante-metal. La estructura, microestructura, morfología y composición de los sistemas lámina/sustrato fueron analizadas y correlacionadas con las propiedades dieléctricas y aislantes de las láminas. Las láminas BST dopadas con Mg exhibieron mejores características de aislamiento y pérdidas dieléctricas que las láminas de BST puras. La mejora en propiedades dieléctricas, baja corriente de pérdida y buena sintonizabilidad de las láminas con bajo dopaje de Mg amerita su utilización potencial para dispositivos de sintonía de microondas.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Tunable microwave devices]]></kwd>
<kwd lng="en"><![CDATA[thin films]]></kwd>
<kwd lng="en"><![CDATA[microstructure]]></kwd>
<kwd lng="es"><![CDATA[Dispositivos de sintonía de microondas]]></kwd>
<kwd lng="es"><![CDATA[películas delgadas]]></kwd>
<kwd lng="es"><![CDATA[microestructura]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="justify"><font face="verdana" size="4">Investigaci&oacute;n</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="4"><b>Novel tunable acceptor doped BST thin films for high quality tunable microwave devices</b></font></p>  	    <p align="center"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="2"><b>M.W. Cole* y R.G. Geyer**</b></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><i>* U.S. Army Research Laboratory, Weapons and Materials Research Directorate Aberdeen Proving Ground, MD 21005, U.S.A., (410)&#45;306&#45;0747.</i> E&#45;mail: <a href="mailto:mcole@arl.army.mil">mcole@arl.army.mil</a></font></p>  	    <p align="justify"><font face="verdana" size="2"><i>** National Institute of Standards and Technology, RF Technology Division, Boulder, CO 80303, U.S.A.</i></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">Recibido el 5 de noviembre de 2002;    <br> 	Aceptado el 11 de noviembre de 2003.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">The materials properties of undoped and low concentration Mg doped Ba<sub>0.6</sub>.Sr<sub>0.4</sub>TiO<sub>3</sub> (BST) thin films are reported. The films were fabricated on single crystal (100) MgO and Pt coated Si substrates via the metalorganic solution deposition (MOSD) technique using carboxylate&#45;alkoxide precursors and post&#45;deposition annealed at 800&deg;C (film/MgO substrates) and 750&deg;C (film/Pt&#45;Si substrates). The dielectric properties were measured at 10 GHz using unpatterned/non&#45;metallized films via a tuned coupled/split dielectric resonator system and at 100 kHz using metal&#45;insulator&#45;metal capacitors. The structure, microstructure, surface morphology and film/substrate compositional quality were analyzed and correlated to the films dielectric and insulating properties. The Mg doped BST films exhibited improved dielectric loss and insulating characteristics compared to the undoped BST thin films. The improved dielectric properties, low leakage current, and good tunability of the low level Mg doped BST thin films merits strong potential for utilization in microwave tunable devices.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Tunable microwave devices; thin films; microstructure.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Se reportan las propiedades de l&aacute;minas delgadas de Ba<sub>0.6</sub>.Sr<sub>0.4</sub>TiO<sub>3</sub> (BST) puro y dopado con bajas concentraciones de Mg. Las l&aacute;minas fueron obtenidas sobre monocristales (100) MgO y sustratos de Si cubiertos de Pt, por deposici&oacute;n de soluci&oacute;n metalorg&aacute;nica (MOSD) usando precursores de carboxilato&#45;alk&oacute;xido y recocido post&#45;deposici&oacute;n a 800&deg;C (sustratos lamina/MgO) y 750&deg;C (sustratos l&aacute;mna/Pt&#45;Si). Las propiedades diel&eacute;ctricas fueron medidas a 10 GHz usando l&aacute;minas no&#45;empatronadas/no&#45;metalizadas por sinton&iacute;a de un sistema diel&eacute;ctrico resonante de acople/desacople y a 100 kHz mediante capacitores metal&#45;aislante&#45;metal. La estructura, microestructura, morfolog&iacute;a y composici&oacute;n de los sistemas l&aacute;mina/sustrato fueron analizadas y correlacionadas con las propiedades diel&eacute;ctricas y aislantes de las l&aacute;minas. Las l&aacute;minas BST dopadas con Mg exhibieron mejores caracter&iacute;sticas de aislamiento y p&eacute;rdidas diel&eacute;ctricas que las l&aacute;minas de BST puras. La mejora en propiedades diel&eacute;ctricas, baja corriente de p&eacute;rdida y buena sintonizabilidad de las l&aacute;minas con bajo dopaje de Mg amerita su utilizaci&oacute;n potencial para dispositivos de sinton&iacute;a de microondas.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Descriptores:</b> Dispositivos de sinton&iacute;a de microondas; pel&iacute;culas delgadas; microestructura.</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2">PACS: 77: 77.55+f; 81.40.Tv</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v50n3/v50n3a5.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">1.&nbsp;W. Chang <i>et al., Appl. Phys. Lett.</i> <b>74</b> (1999) 1033.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8302188&pid=S0035-001X200400030000500001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">2.&nbsp;S. Zafar <i>et al., Appl. Phys Lett.</i> <b>72</b> (1998) 2820.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8302190&pid=S0035-001X200400030000500002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
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