<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2003000500015</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Nonlinear size effects of hot electrons in semiconductor thin films]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Lohvinov]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Gurevich]]></surname>
<given-names><![CDATA[Y.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Titov]]></surname>
<given-names><![CDATA[O.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Instituto Politécnico Nacional Escuela Superior de Ingeniería Mecánica y Eléctrica Sección de Estudios de Posgrado e Investigación]]></institution>
<addr-line><![CDATA[México Distrito Federal]]></addr-line>
<country>México</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Instituto Politécnico Nacional Centro de Investigación y de Estudios Avanzados Departamento de Física]]></institution>
<addr-line><![CDATA[México Distrito Federal]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>10</month>
<year>2003</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>10</month>
<year>2003</year>
</pub-date>
<volume>49</volume>
<numero>5</numero>
<fpage>482</fpage>
<lpage>484</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2003000500015&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2003000500015&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2003000500015&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Theory of nonlinear heat size effects is developed in semiconductor films in the presence of external d.c. electric field. It is supposed that this field is applied along the film surfaces. The electron temperature is introduced, and it is shown that it depends on the electric field and the film thickness. The main equations are obtained for calculation this temperature, and analysis is done for the case of the weak electron heating. The characteristic length of the problem is discussed. It is the electron cooling length measured on submicron scale. It is shown that the heat size effects arise in the case when this length is comparable or less of the film thickness.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Se desarrolla una teoría de los efectos de grosor en semiconductores cuyo grosor es del orden de la longitud de difusión (longitud de enfriamiento), la cual normalmente es de dimensiones submicronicas. Se supone que el campo eléctrico estático se aplica a lo largo de la superficie. La temperatura de los electrones se introduce bajo la suposición de que se cumpla la condición de dispersión cuasielástica sobre los fonones acústicos. Se muestra que la temperatura depende de la intensidad del campo eléctrico y del grosor de la película. Se presentan las ecuaciones fundamentales para calcular esta temperatura y se hace el análisis para el caso en que se tiene un calentamiento debil. Por otro lado, se presenta la discusión sobre la conductividad eléctrica no lineal.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Semiconductors film]]></kwd>
<kwd lng="en"><![CDATA[electron temperature]]></kwd>
<kwd lng="en"><![CDATA[cooling length]]></kwd>
<kwd lng="en"><![CDATA[size effects]]></kwd>
<kwd lng="en"><![CDATA[nonlinear electric conductivity]]></kwd>
<kwd lng="es"><![CDATA[Películas semiconductoras delgadas]]></kwd>
<kwd lng="es"><![CDATA[electrones calientes]]></kwd>
<kwd lng="es"><![CDATA[longitud de enfriamiento]]></kwd>
<kwd lng="es"><![CDATA[conductividad eléctrica no lineal]]></kwd>
<kwd lng="es"><![CDATA[efectos de grosor]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[ <p align="justify"><font face="verdana" size="4">Ense&ntilde;anza</font></p>     <p align="justify">&nbsp;</p>      <p align="center"><font face="verdana" size="4"><b>Nonlinear size effects of hot electrons in semiconductor thin films</b></font></p>      <p align="center">&nbsp;</p>     <p align="center"><font face="verdana" size="2"><b>H. Lohvinov<sup>1</sup>, Y. Gurevich<sup>2</sup> and O. Titov<sup>2</sup></b></font></p>      <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><i><sup>1</sup> SEPI, ESIME Culhuac&aacute;n, Instituto Polit&eacute;cnico Nacional, Av. Santa Ana 1000, Col. San Francisco, Culhuac&aacute;n, C.D. 04430, D.F., M&eacute;xico,</i> e&#45;mail: <a href="mailto:georgiy&#45;logvinov@mail.ru">georgiy&#45;logvinov@mail.ru</a></font></p>      <p align="justify"><font face="verdana" size="2"><i><sup>2</sup> Depto. de F&iacute;sica, CINVESTAV del IPN, Apartado Postal 14&#45;740, M&eacute;xico, 07300 D.F., M&eacute;xico</i></font></p>      <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2">Recibido el 26 de noviembre de 2002.     ]]></body>
<body><![CDATA[<br>   Aceptado el 2 de junio de 2003.</font></p>      <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>      <p align="justify"><font face="verdana" size="2">Theory of nonlinear heat size effects is developed in semiconductor films in the presence of external d.c. electric field. It is supposed that this field is applied along the film surfaces. The electron temperature is introduced, and it is shown that it depends on the electric field and the film thickness. The main equations are obtained for calculation this temperature, and analysis is done for the case of the weak electron heating. The characteristic length of the problem is discussed. It is the electron cooling length measured on submicron scale. It is shown that the heat size effects arise in the case when this length is comparable or less of the film thickness.</font></p>      <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Semiconductors film; electron temperature; cooling length; size effects; nonlinear electric conductivity.</font></p>      <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>      <p align="justify"><font face="verdana" size="2">Se desarrolla una teor&iacute;a de los efectos de grosor en semiconductores cuyo grosor es del orden de la longitud de difusi&oacute;n (longitud de enfriamiento), la cual normalmente es de dimensiones submicronicas. Se supone que el campo el&eacute;ctrico est&aacute;tico se aplica a lo largo de la superficie. La temperatura de los electrones se introduce bajo la suposici&oacute;n de que se cumpla la condici&oacute;n de dispersi&oacute;n cuasiel&aacute;stica sobre los fonones ac&uacute;sticos. Se muestra que la temperatura depende de la intensidad del campo el&eacute;ctrico y del grosor de la pel&iacute;cula. Se presentan las ecuaciones fundamentales para calcular esta temperatura y se hace el an&aacute;lisis para el caso en que se tiene un calentamiento debil. Por otro lado, se presenta la discusi&oacute;n sobre la conductividad el&eacute;ctrica no lineal.</font></p>      <p align="justify"><font face="verdana" size="2"><b>Palabras clave:</b> Pel&iacute;culas semiconductoras delgadas; electrones calientes; longitud de enfriamiento; conductividad el&eacute;ctrica no lineal; efectos de grosor.</font></p>      <p align="justify"><font face="verdana" size="2">PACS: 72.20.Ht; 73.50.Fq</font></p>      ]]></body>
<body><![CDATA[<p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v49n5/v49n5a15.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>      <p align="justify">&nbsp;</p>     <p align="justify"><font face="verdana" size="2"><b>Referencicas</b></font></p>      <!-- ref --><p align="justify"><font face="verdana" size="2">1. Z.S. Gribnikov, V.I. Mel'nikov, and T.S. Sorokina, <i>Sov. Phys. Usp.</i> 14 (1971) 113.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8296886&pid=S0035-001X200300050001500001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      <!-- ref --><p align="justify"><font face="verdana" size="2">2. A.I. Klimovskaya, O.V. Snitko, and S.I. Kirillova, <i>JETP Lett.</i> 11 (1970) 73.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8296888&pid=S0035-001X200300050001500002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      <!-- ref --><p align="justify"><font face="verdana" size="2">3. V.S. Zakordonets and G.N. Logvinov, <i>Semiconductors</i> 31 (1997) 265.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8296890&pid=S0035-001X200300050001500003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      ]]></body>
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</article>
