<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>2448-5691</journal-id>
<journal-title><![CDATA[Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología]]></journal-title>
<abbrev-journal-title><![CDATA[Mundo nano]]></abbrev-journal-title>
<issn>2448-5691</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S2448-56912020000200133</article-id>
<article-id pub-id-type="doi">10.22201/ceiich.24485691e.2020.25.69649</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Microscopía electrónica de transmisión para observar átomos: principios y desarrollo]]></article-title>
<article-title xml:lang="en"><![CDATA[Transmission electron microscopy to look at atoms: principles and development]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Calderón]]></surname>
<given-names><![CDATA[Héctor A.]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Instituto Politécnico Nacional Escuela Superior de Física y Matemáticas ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>Mexico</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<volume>13</volume>
<numero>25</numero>
<fpage>133</fpage>
<lpage>156</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S2448-56912020000200133&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S2448-56912020000200133&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S2448-56912020000200133&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen: La microscopía electrónica es una herramienta importante en la caracterización de nanomateriales. En su modalidad de alta resolución, es posible obtener imágenes de las columnas de átomos que conforman una muestra, o si el espesor es una monocapa, pueden obtenerse imágenes de átomos. Normalmente, el producto es una imagen con intensidades específicas, que para ser interpretado correctamente, se debe considerar la interacción del haz electrónico con la muestra. En este trabajo, se describen algunas características importantes de la microscopía electrónica de alta resolución y de resolución atómica. Asimismo, se proporcionan ejemplos de observaciones en materiales específicos. Se da atención especial a la interacción de los electrones con la muestra para obtener imágenes que reproduzcan la distribución atómica genuina y sin modificación por un haz electrónico demasiado intenso.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract: Electron microscopy is an important tool in characterizing nanomaterials. In its high resolution mode, it is possible to obtain images of the columns of atoms that make up a sample or if the thickness is a monolayer, images of atoms can be obtained. Normally the product image has specific intensities that require proper interpretation, additionally there is a need to consider the electron beam interaction with the sample. In this work, some important characteristics of high resolution and atomic resolution electron microscopy are described. Examples are given with observations in different materials. The beam-sample interaction is given special attention in order to avoid sample damage by an intense electron beam.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[microscopía electrónica]]></kwd>
<kwd lng="es"><![CDATA[resolución atómica]]></kwd>
<kwd lng="es"><![CDATA[resolución espacial]]></kwd>
<kwd lng="es"><![CDATA[interacción del haz]]></kwd>
<kwd lng="es"><![CDATA[dosis electrónica]]></kwd>
<kwd lng="en"><![CDATA[electron microscopy]]></kwd>
<kwd lng="en"><![CDATA[atomic resolution]]></kwd>
<kwd lng="en"><![CDATA[spatial resolution]]></kwd>
<kwd lng="en"><![CDATA[simple-beam interaction]]></kwd>
<kwd lng="en"><![CDATA[electron dose]]></kwd>
</kwd-group>
</article-meta>
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