<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>2448-5691</journal-id>
<journal-title><![CDATA[Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología]]></journal-title>
<abbrev-journal-title><![CDATA[Mundo nano]]></abbrev-journal-title>
<issn>2448-5691</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S2448-56912020000200061</article-id>
<article-id pub-id-type="doi">10.22201/ceiich.24485691e.2020.25.69630</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Nanoestructuras y su caracterización por medio de microscopía electrónica de transmisión; ciencia y arte]]></article-title>
<article-title xml:lang="en"><![CDATA[Nanostructures and their characterization by transmission electron microscopy; science and art]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Mendoza Ramírez]]></surname>
<given-names><![CDATA[Miriam-Carolina]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Avalos Borja]]></surname>
<given-names><![CDATA[Miguel]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Instituto Potosino de Investigación Científica y Tecnológica División de Materiales Avanzados ]]></institution>
<addr-line><![CDATA[San Luis Potosí S.L.P.]]></addr-line>
<country>Mexico</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<volume>13</volume>
<numero>25</numero>
<fpage>61</fpage>
<lpage>78</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S2448-56912020000200061&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S2448-56912020000200061&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S2448-56912020000200061&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen: En el presente trabajo se describen de forma didáctica los alcances de la microscopía electrónica de transmisión (TEM) para el estudio de nanosistemas. Las ilustraciones mostradas se adquirieron empleando muestras ilustrativas (nanopartículas de Au y películas de Si). A lo largo de este escrito se ejemplifica el uso de algunas técnicas TEM convencionales, como BF, DF, HAADF, SAED y EELS, así como también se ejemplifica el empleo de técnicas avanzadas de difracción, como CBED, LACBED y PED. También se brindan algunas sugerencias prácticas que permitirán describir y diferenciar de forma sencilla el contraste observado en algunas de las técnicas disponibles en el TEM. Todo con el objetivo de ofrecer una visión, llamativa, clara y didáctica de los alcances actuales de la microscopía electrónica en México.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract: The description of nanometric systems is still being a challenging topic, for this reason the transmission electron microscopy (TEM) scope is exemplified in a didactic way using several nanosystems (Au nanoparticles and thin Si films). Throughout this work, conventional TEM techniques such as bright field (BF), dark field (DF), high angle annular dark field (HAADF), selected area electron diffraction (SAED) and electron energy loss spectroscopy (EELS) are shown, emphaticizing the differences with less conventional techniques such as convergent beam electron diffraction (CBED), large angle convergent beam electron diffraction (LACBED) and precession electron diffraction (PED). Also, some practical suggestions are given for describing contrast found on several TEM techniques, offering a striking, clear and didactic vision of the current scopes of TEM in Mexico.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[microscopía electrónica de transmisión]]></kwd>
<kwd lng="es"><![CDATA[difracción de electrones]]></kwd>
<kwd lng="es"><![CDATA[precesión y haz convergente]]></kwd>
<kwd lng="en"><![CDATA[transmission electron microscopy]]></kwd>
<kwd lng="en"><![CDATA[electron diffraction]]></kwd>
<kwd lng="en"><![CDATA[precession and convergent beam]]></kwd>
</kwd-group>
</article-meta>
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