<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>2007-7467</journal-id>
<journal-title><![CDATA[RIDE. Revista Iberoamericana para la Investigación y el Desarrollo Educativo]]></journal-title>
<abbrev-journal-title><![CDATA[RIDE. Rev. Iberoam. Investig. Desarro. Educ]]></abbrev-journal-title>
<issn>2007-7467</issn>
<publisher>
<publisher-name><![CDATA[Centro de Estudios e Investigaciones para el Desarrollo Docente A.C.]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S2007-74672023000100156</article-id>
<article-id pub-id-type="doi">10.23913/ride.v13i26.1510</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Determinación Experimental del Tiempo de Muestreo en Hardware con Microcontroladores y su Relación con las Matemáticas en t, s y z]]></article-title>
<article-title xml:lang="en"><![CDATA[Experimental Determination of Sampling Time in Hardware with Microcontrollers and Its Relationship to Mathematics in t, s and z]]></article-title>
<article-title xml:lang="pt"><![CDATA[Determinação Experimental do Tempo de Amostragem em Hardware com Microcontroladores e sua Relação com a Matemática em t, s e z]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Rivera-Mejia]]></surname>
<given-names><![CDATA[José]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Medina-Rodríguez]]></surname>
<given-names><![CDATA[Vicente]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Molinar-Solís]]></surname>
<given-names><![CDATA[Jesús Ezequiel]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Instituto Tecnológico de Chihuahua Tecnológico Nacional de México ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>México</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Instituto Tecnológico de Chihuahua Tecnológico Nacional de México ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>México</country>
</aff>
<aff id="Af3">
<institution><![CDATA[,Instituto Tecnológico de Chihuahua Tecnológico Nacional de México ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>06</month>
<year>2023</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>06</month>
<year>2023</year>
</pub-date>
<volume>13</volume>
<numero>26</numero>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S2007-74672023000100156&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S2007-74672023000100156&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S2007-74672023000100156&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen El diseño de sistemas de monitoreo y/o control se basa en modelos matemáticos en el tiempo t, que implican ecuaciones diferenciales y transformadas de Laplace para su solución. Al asociar estos modelos con sistemas discretos y al usar microcontroladores o computadoras para digitalizar estos sistemas, se hace necesario el uso de la Transformada-z. Esta última requiere que se conozca el tiempo de muestreo utilizado, para que todos los modelos concuerden en sus resultados. El presente trabajo muestra un método práctico para determinar el tiempo de muestreo. Se utilizó el kit de desarrollo ESP-32-S2 y una red con una resistencia y un condensador. Mediante un programa en lenguaje C/C++ y un osciloscopio, se midió el tiempo de muestreo. Se realizaron experimentos para diferentes condiciones de operación del sistema de adquisición de datos, registrando el voltaje del condensador en respuesta a una alimentación escalón unitario. Los resultados reales se compararon gráficamente con los resultados en t, s y z, y se calculó el error entre la respuesta en t y los resultados prácticos. Esto demostró que el método propuesto genera una buena medida del tiempo de muestreo y que los resultados de los modelos en todos los planos concuerdan con los obtenidos en la práctica. Con esto, esperamos motivar a estudiantes y profesionales a aplicar las matemáticas en el diseño de sistemas digitales, fomentando el uso de herramientas de simulación que permitan el desarrollo de sistemas más rápidos y eficientes. Además, buscamos fortalecer trabajos relacionados con sistemas embebidos, sensores inteligentes, la Internet de las cosas y la industria 4.0.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract The design of monitoring and/or control systems is based on mathematical models at time t, which involve differential equations and Laplace transforms for their solution. Associating these models with discrete systems and the use of microcontrollers or computers to digitize these systems involves the use of the z-transform, which requires knowledge of the sampling time used for all models to coincide in their results. The present work shows a practical method for determining the sampling time. The ESP-32-S2 development kit and a network with a resistor and a capacitor were used. Using a C/C++ language program and oscilloscope, the sampling time was measured. Experiments were performed for different operating conditions of the data acquisition system, recording the capacitor voltage in response to one unit step supply. The true results were compared graphically with the results in t,s and z and the error between the response in t and the practical results also was calculated. Demonstrating that the proposed method generates a good measure of the sampling time and that the model results in all planes coincide with those obtained in practice. Hoping to motivate students and professionals to apply mathematics in the design of digital systems. Encouraging the use of simulation tools that allow the development of faster and more efficient systems. Strengthening work related to embedded systems, intelligent sensors, internet of things and industry 4.0.]]></p></abstract>
<abstract abstract-type="short" xml:lang="pt"><p><![CDATA[Resumo O projeto de sistemas de monitoramento e/ou controle é baseado em modelos matemáticos no tempo t, que envolvem equações diferenciais e transformadas de Laplace para sua solução. Ao associar esses modelos a sistemas discretos e ao usar microcontroladores ou computadores para digitalizar esses sistemas, o uso da Z-Transform torna-se necessário. Este último exige que o tempo de amostragem utilizado seja conhecido, para que todos os modelos concordem em seus resultados. O presente trabalho mostra um método prático para determinar o tempo de amostragem. Foi utilizado o kit de desenvolvimento ESP-32-S2 e uma rede com um resistor e um capacitor. Usando um programa em linguagem C/C++ e um osciloscópio, o tempo de amostragem foi medido. Experimentos foram realizados para diferentes condições de operação do sistema de aquisição de dados, registrando a tensão do capacitor em resposta a uma alimentação em degrau unitário. Os resultados reais foram comparados graficamente com os resultados em t, s e z, e o erro entre a resposta t e os resultados práticos foi calculado. Isso demonstrou que o método proposto gera uma boa medida do tempo de amostragem e que os resultados dos modelos em todos os planos concordam com os obtidos na prática. Com isso, esperamos motivar estudantes e profissionais a aplicar a matemática no projeto de sistemas digitais, promovendo o uso de ferramentas de simulação que permitam o desenvolvimento de sistemas mais rápidos e eficientes. Além disso, buscamos fortalecer trabalhos relacionados a sistemas embarcados, sensores inteligentes, internet das coisas e indústria 4.0.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[Tiempo de muestreo]]></kwd>
<kwd lng="es"><![CDATA[Sistemas digitales]]></kwd>
<kwd lng="es"><![CDATA[IoT]]></kwd>
<kwd lng="es"><![CDATA[sensores inteligentes]]></kwd>
<kwd lng="en"><![CDATA[Sample time]]></kwd>
<kwd lng="en"><![CDATA[Digital Systems]]></kwd>
<kwd lng="en"><![CDATA[IoT]]></kwd>
<kwd lng="en"><![CDATA[intelligent sensors]]></kwd>
<kwd lng="pt"><![CDATA[Tempo de amostragem]]></kwd>
<kwd lng="pt"><![CDATA[Sistemas digitais]]></kwd>
<kwd lng="pt"><![CDATA[IoT]]></kwd>
<kwd lng="pt"><![CDATA[sensores inteligentes]]></kwd>
</kwd-group>
</article-meta>
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<article-title xml:lang=""><![CDATA[Sampling-Interval-Aware LSTM for Industrial Process Soft Sensing of Dynamic Time Sequences with Irregular Sampling Measurements]]></article-title>
<source><![CDATA[IEEE Sensors Journal]]></source>
<year>2021</year>
<volume>21</volume>
<numero>9</numero>
<issue>9</issue>
</nlm-citation>
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</back>
</article>
