<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1665-6423</journal-id>
<journal-title><![CDATA[Journal of applied research and technology]]></journal-title>
<abbrev-journal-title><![CDATA[J. appl. res. technol]]></abbrev-journal-title>
<issn>1665-6423</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1665-64232018000300229</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Design and implementation of an alternative measurement system for MOSFET-Like sensors characterization]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Viton-Zorrilla]]></surname>
<given-names><![CDATA[Luighi]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Lezama]]></surname>
<given-names><![CDATA[Jinmi]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Acosta]]></surname>
<given-names><![CDATA[Rubén]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Ríos-Julcapoma]]></surname>
<given-names><![CDATA[Milton]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Nacional de Ingeniería Instituto Nacional de Investigación y Capacitación de Telecomunicacione ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>Peru</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>00</month>
<year>2018</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>00</month>
<year>2018</year>
</pub-date>
<volume>16</volume>
<numero>3</numero>
<fpage>229</fpage>
<lpage>240</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1665-64232018000300229&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1665-64232018000300229&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1665-64232018000300229&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract: This paper describes the design and implementation of an alternative system to measure electrical parameters (voltage and current) in order to characterize MOSFET-Like sensors. To design a signal conditioning circuit is necessary to understand the sensor behavior, therefore knowing its characteristics is essential. As sensor manufacturers do not usually provide the whole technical information about them, a measurement system is proposed to obtain those sensor characteristics with the aim of modeling the sensor device. This system is based on a MCU which generates voltages and measures currents via an external transimpedance amplifier, and it is supported by a software platform developed upon python based open source tools. Such combination offers a low cost system to stimulate and capture sensor responses which could be processed later to extract the characteristic parameters. The system was tested principally with an fon Sensitive Field Effect Transistor (1SFET) and results show the VDS-IDS and Ves curves obtained with it.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[measurement system]]></kwd>
<kwd lng="en"><![CDATA[sensor characterization]]></kwd>
<kwd lng="en"><![CDATA[MCU]]></kwd>
<kwd lng="en"><![CDATA[1SFET]]></kwd>
</kwd-group>
</article-meta>
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