<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1665-6423</journal-id>
<journal-title><![CDATA[Journal of applied research and technology]]></journal-title>
<abbrev-journal-title><![CDATA[J. appl. res. technol]]></abbrev-journal-title>
<issn>1665-6423</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1665-64232013000500016</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Using the Monte Carlo Simulation Methods in Gauge Repeatability and Reproducibility of Measurement System Analysis]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Yeh]]></surname>
<given-names><![CDATA[Tsu-Ming]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Sun]]></surname>
<given-names><![CDATA[Jia-Jeng]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Dayeh University Department of Industrial Engineering and Management ]]></institution>
<addr-line><![CDATA[Taiwan ]]></addr-line>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>10</month>
<year>2013</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>10</month>
<year>2013</year>
</pub-date>
<volume>11</volume>
<numero>5</numero>
<fpage>780</fpage>
<lpage>796</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1665-64232013000500016&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1665-64232013000500016&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1665-64232013000500016&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Measurements are required to maintain the consistent quality of all finished and semi-finished products in a production line. Many firms in the automobile and general precision industries apply the TS 16949:2009 Technical Specifications and Measurement System Analysis (MSA) manual to establish measurement systems. This work is undertaken to evaluate gauge repeatability and reproducibility (GR & R) to verify the measuring ability and quality of the measurement frame, as well as to continuously improve and maintain the verification process. Nevertheless, the implementation of GR & R requires considerable time and manpower, and is likely to affect production adversely. In addition, the evaluation value for GR & R is always different owing to the sum of man-made and machine-made variations. Using a Monte Carlo simulation and the prediction of the repeatability and reproducibility of the measurement system analysis, this study aims to determine the distribution of % GR & R and the related number of distinct categories (ndc). This study uses two case studies of an automobile parts manufacturer and the combination of a Monte Carlo simulation, statistical bases, and the prediction of the repeatability and reproducibility of the measurement system analysis to determine the probability density function, the distribution of % GR & R, and the related number of distinct categories (ndc). The method used in this study could evaluate effectively the possible range of the GR & R of the measurement capability, in order to establish a prediction model for the evaluation of the measurement capacity of a measurement system.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[measurement system analysis]]></kwd>
<kwd lng="en"><![CDATA[monte carlo simulation]]></kwd>
<kwd lng="en"><![CDATA[gauge repeatability and reproducibility]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="center"><font face="verdana" size="4"><b>Using the Monte Carlo Simulation Methods in Gauge Repeatability and Reproducibility of Measurement System Analysis</b></font></p>  	    <p align="center"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="2"><b>Tsu&#45;Ming Yeh*, Jia&#45;Jeng Sun</b></font></p>  	    <p align="center"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Department of Industrial Engineering and Management, Dayeh University, Taiwan</i>. *<a href="mailto:tmyeh@mail.dyu.edu.tw.">tmyeh@mail.dyu.edu.tw</a>.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>ABSTRACT</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Measurements are required to maintain the consistent quality of all finished and semi&#45;finished products in a production line. Many firms in the automobile and general precision industries apply the TS 16949:2009 Technical Specifications and Measurement System Analysis (MSA) manual to establish measurement systems. This work is undertaken to evaluate gauge repeatability and reproducibility (GR &amp; R) to verify the measuring ability and quality of the measurement frame, as well as to continuously improve and maintain the verification process. Nevertheless, the implementation of GR &amp; R requires considerable time and manpower, and is likely to affect production adversely. In addition, the evaluation value for GR &amp; R is always different owing to the sum of man&#45;made and machine&#45;made variations. Using a Monte Carlo simulation and the prediction of the repeatability and reproducibility of the measurement system analysis, this study aims to determine the distribution of % GR &amp; R and the related number of distinct categories (ndc). This study uses two case studies of an automobile parts manufacturer and the combination of a Monte Carlo simulation, statistical bases, and the prediction of the repeatability and reproducibility of the measurement system analysis to determine the probability density function, the distribution of % GR &amp; R, and the related number of distinct categories (ndc). The method used in this study could evaluate effectively the possible range of the GR &amp; R of the measurement capability, in order to establish a prediction model for the evaluation of the measurement capacity of a measurement system.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> measurement system analysis, monte carlo simulation, gauge repeatability and reproducibility.</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/jart/v11n5/v11n5a16.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b><i>References</i></b></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;1&#93; Al&#45;Refaie, A., Bata, N., Evaluating measurement and process capabilities by GR&amp;R with four quality measures, Measurement,  Vol.43, No.6, 2010, pp.842&#45;851</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840383&pid=S1665-6423201300050001600001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;2&#93; Stevens, N. T., Browne, R., Steiner, S. H., Mackay, R. J., Augmented Measurement System Assessment, Journal of Quality Technology, Vol.42, No.4, 2010, pp.388&#45;399</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840384&pid=S1665-6423201300050001600002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;3&#93; Pan, J. N., Determination of the Optimal Allocation of Parameters for Gauge Repeatability and Reproducibility, International Journal of Quality &amp; Reliability Management, Vol.21, No.6, 2004, pp.672&#45;682</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840385&pid=S1665-6423201300050001600003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;4&#93; Pan, J. N., Evaluating the Gauge Repeatability and Reproducibility for Different Industries, Quality &amp; Quantity, Vol.40, No.4, 2006, pp.499&#45;518</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840386&pid=S1665-6423201300050001600004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;5&#93; Wang, F.K., Chien, T.W., Process&#45;oriented basis representation for a multivariate gauge study, Computers &amp; Industrial Engineering, Vol.58, 2010, pp.143&#45;150</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840387&pid=S1665-6423201300050001600005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;6&#93; Montgomery, D. C., Runger, G. C., Gauge Capability and Designed Experiments Part I: Basic Methods, Quality Engineering, Vol.6, No.1, 1993, pp.115&#45;135.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840388&pid=S1665-6423201300050001600006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;7&#93; ISO, "ISO/IEC17025 General requirements for the competence of testing and calibration laboratories", 2nd Edition, 2005.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840390&pid=S1665-6423201300050001600007&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;8&#93; Automotive Industry Action Group (AIAG), Statistical Process Control (SPC) Reference Manual, Second Edition, Southfield, MI, 2005.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840392&pid=S1665-6423201300050001600008&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;9&#93; Chen, K. S., Wu, C. H., Chen, S. C., Criteria of Determining the P/T Upper Limits of GR&amp;R in MSA, Quality &amp; Quantity, Vol.42, No.1, 2008, pp.23&#45;33</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840394&pid=S1665-6423201300050001600009&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;10&#93; Kappele, W. D., Raffaldi, J., Gage R&amp;R for Destructive Measurement Systems, Quality Magazine, Vol.5, 2010, pp.32&#45;34.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840395&pid=S1665-6423201300050001600010&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;11&#93; Fang, J. J., Wang, P. S., Lee, Y. L., The Study of Gauge Repeatability and Reproducibility, Proceeding of the 10th Conference on Interdisciplinary and Multifunctional Business Management, 2006, pp.288&#45;297</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840397&pid=S1665-6423201300050001600011&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;12&#93; Automotive Industry Action Group (AIAG), Measurement Systems Analysis (MSA) Reference Manual, 4th Edition, Chrysler, Ford, GM, 2010.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840398&pid=S1665-6423201300050001600012&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;13&#93; He, S. G., Wang, G. A., Cook, D. F., Multivariate measurement system analysis in multisite testing: An online technique using principal component analysis, Expert Systems with Applications, Vol.38, 2011, pp.14602&#45;14608.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840400&pid=S1665-6423201300050001600013&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;14&#93; Burdick, R. K., Borror, C. M., Montgomery, D. C., A review of methods for measurement systems capability analysis, Journal of Quality Technology, Vol.35, No.4, 2003, pp.342&#45;354.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840402&pid=S1665-6423201300050001600014&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;15&#93; Li, M. H., Al&#45;Refaie, A., Improving wooden parts' quality by adopting DMAIC procedure, Quality and Reliability Engineering International, Vol.24, 2008, pp.351&#45;360.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840404&pid=S1665-6423201300050001600015&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;16&#93; Barrentine, L. B., Concepts for R&amp;R Studies, ASQC Quality Press, Milwaukee, WI, 1991.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840406&pid=S1665-6423201300050001600016&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;17&#93; Automotive Industry Action Group (AIAG), Measurement Systems Analysis, AIAG Reference Manual, Southfield, MI, 1997.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840408&pid=S1665-6423201300050001600017&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;18&#93; Mandel, J., Repeatability and Reproducibility, Journal of Quality Technology, Vol.4, No.2, 1972, pp.74&#45;85.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840410&pid=S1665-6423201300050001600018&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;19&#93; Montgomery, D. C., Runger, G. C. Gauge Capability Analysis and Designed Experiments Part II: Experimental Design Models and Variance Component Estimation, Quality Engineering, Vol.6, No.2, 1993, pp.289&#45;305</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840412&pid=S1665-6423201300050001600019&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;20&#93; McNeese, W. H., Klein, R. A., Measurement System Sampling and Process Capability, Quality Engineering, Vol.4, No.1, 1991, pp.21&#45;39.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840413&pid=S1665-6423201300050001600020&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;21&#93; Tsai, P., Variable Gauge Repeatability and Reproducibility Study Using The Analysis of Variance, Quality Engineer, Vol.1, No.1, 1998, pp.107&#45;115.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840415&pid=S1665-6423201300050001600021&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;22&#93; James, P. D., Finderne, A., Graphical Display of Gauge R&amp;R Data, ASQC Quality Congress Transactions, Milwaukee, 1991, pp.835&#45;839.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840417&pid=S1665-6423201300050001600022&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">&#91;23&#93; Metropolis, N., Ulam, S., The Monte Carlo Method, Journal of the American Statistical Association, Vol.44, No.247, 1949, pp.335&#45;341.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840419&pid=S1665-6423201300050001600023&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;24&#93; Garc&iacute;a&#45;Alonso, C. R., Arenas&#45;Arroyo, E., P&eacute;rez&#45;Alcal&aacute;, G. M., macro&#45;economic model to forecast remittances based on Monte&#45;Carlo simulation and artificial intelligence, Expert Systems with Applications, Vol.39, 2012, pp.7929&#45;7937.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840421&pid=S1665-6423201300050001600024&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;25&#93; Yeh, W. C., Lin, Y. C., Chung, Y. Y., Performance analysis of cellular automata Monte Carlo Simulation for estimating network reliability, Expert Systems with Applications, Vol.37, 2010, pp.3537&#45;3544</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840423&pid=S1665-6423201300050001600025&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">&#91;26&#93; Robert, C. P., Casella, G., Monte Carlo Statistical Methods, Springer&#45;Verlag, 2nd Edition, 2004.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840424&pid=S1665-6423201300050001600026&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;27&#93; Wittwer, J. W., Monte Carlo Simulation Basics, From Vertex42.com, June 1, 2004, <a href="http://vertex42.com/ExcelArticles/mc/MonteCarloSimulation.html" target="_blank">http://vertex42.com/ExcelArticles/mc/MonteCarloSimulation.html</a>, 2004.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840426&pid=S1665-6423201300050001600027&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;28&#93; Manno, I., Introduction to the Monte Carlo Method, Akademiai Kiado, 1999.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840428&pid=S1665-6423201300050001600028&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;29&#93; Chaitin, G. J., Exploring Randomness, Springer&#45;Verlag, 2001.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840430&pid=S1665-6423201300050001600029&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;30&#93; Lehmer, D. H., Mathematical methods in large&#45;scale computing units, Proceedings of the Second Symposium on Large Scale Digital Computing Machinery, Harvard University Press, 1951, pp.141&#45;146.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840432&pid=S1665-6423201300050001600030&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;31&#93; Law, A. M., Kelton, W. D., Simulation Modeling &amp; Analysis, Third Edition, McGraw&#45;Hill, 2000.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840434&pid=S1665-6423201300050001600031&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;32&#93; Wichmann, B. A., Hill, I. D., An efficient and portable pseudo&#45;random number generator, Applied Statistics, Vol.31, No.2, 1982, pp.188&#45;190.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840436&pid=S1665-6423201300050001600032&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;33&#93; Press, W. H., Flannery, B. P., Teukolsky, S. A., Vetterling, W. T., Numerical Recipes in FORTRAN 77: The Art of Scientific Computing, Second Edition, Cambridge University Press, 1992.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840438&pid=S1665-6423201300050001600033&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;34&#93; Wheeler, D. J., Lyday, R. W., Evaluating the Measurement Process, SPC Press, Inc., Knoxville, Tennessee, 1989.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840440&pid=S1665-6423201300050001600034&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;35&#93; ISO, 2008, ISO/IEC Guide 98&#45;3: Uncertainty of measurement &#45; Part3: Guide to the expression of uncertainty in measurement (GUM: 1995).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840442&pid=S1665-6423201300050001600035&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">&#91;36&#93; ISO, 1994, ISO 5725&#45;1, Accuracy (trueness and precision) of Measurement Methods and Results&#45;Part 1: General Principles and Definitions. ISO: Geneva, Switzerland.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=4840444&pid=S1665-6423201300050001600036&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      ]]></body><back>
<ref-list>
<ref id="B1">
<label>1</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Al-Refaie]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Bata]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Evaluating measurement and process capabilities by GR&R with four quality measures]]></article-title>
<source><![CDATA[Measurement]]></source>
<year>2010</year>
<volume>43</volume>
<numero>6</numero>
<issue>6</issue>
<page-range>842-851</page-range></nlm-citation>
</ref>
<ref id="B2">
<label>2</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Stevens]]></surname>
<given-names><![CDATA[N. T.]]></given-names>
</name>
<name>
<surname><![CDATA[Browne]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Steiner]]></surname>
<given-names><![CDATA[S. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Mackay]]></surname>
<given-names><![CDATA[R. J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Augmented Measurement System Assessment]]></article-title>
<source><![CDATA[Journal of Quality Technology]]></source>
<year>2010</year>
<volume>42</volume>
<numero>4</numero>
<issue>4</issue>
<page-range>388-399</page-range></nlm-citation>
</ref>
<ref id="B3">
<label>3</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Pan]]></surname>
<given-names><![CDATA[J. N.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Determination of the Optimal Allocation of Parameters for Gauge Repeatability and Reproducibility]]></article-title>
<source><![CDATA[International Journal of Quality & Reliability Management]]></source>
<year>2004</year>
<volume>21</volume>
<numero>6</numero>
<issue>6</issue>
</nlm-citation>
</ref>
<ref id="B4">
<label>4</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Pan]]></surname>
<given-names><![CDATA[J. N.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Evaluating the Gauge Repeatability and Reproducibility for Different Industries]]></article-title>
<source><![CDATA[Quality & Quantity]]></source>
<year>2006</year>
<volume>40</volume>
<numero>4</numero>
<issue>4</issue>
<page-range>499-518</page-range></nlm-citation>
</ref>
<ref id="B5">
<label>5</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Wang]]></surname>
<given-names><![CDATA[F.K.]]></given-names>
</name>
<name>
<surname><![CDATA[Chien]]></surname>
<given-names><![CDATA[T.W.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Process-oriented basis representation for a multivariate gauge study]]></article-title>
<source><![CDATA[Computers & Industrial Engineering]]></source>
<year>2010</year>
<volume>58</volume>
<page-range>143-150</page-range></nlm-citation>
</ref>
<ref id="B6">
<label>6</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Montgomery]]></surname>
<given-names><![CDATA[D. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Runger]]></surname>
<given-names><![CDATA[G. C.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Gauge Capability and Designed Experiments Part I: Basic Methods]]></article-title>
<source><![CDATA[Quality Engineering]]></source>
<year>1993</year>
<volume>6</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>115-135</page-range></nlm-citation>
</ref>
<ref id="B7">
<label>7</label><nlm-citation citation-type="">
<collab>ISO</collab>
<source><![CDATA[ISO/IEC17025 General requirements for the competence of testing and calibration laboratories]]></source>
<year>2005</year>
<edition>2</edition>
</nlm-citation>
</ref>
<ref id="B8">
<label>8</label><nlm-citation citation-type="">
<collab>Automotive Industry Action Group</collab>
<source><![CDATA[Statistical Process Control (SPC) Reference Manual]]></source>
<year>2005</year>
<edition>Second</edition>
<publisher-loc><![CDATA[Southfield^eMI MI]]></publisher-loc>
</nlm-citation>
</ref>
<ref id="B9">
<label>9</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Chen]]></surname>
<given-names><![CDATA[K. S.]]></given-names>
</name>
<name>
<surname><![CDATA[Wu]]></surname>
<given-names><![CDATA[C. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Chen]]></surname>
<given-names><![CDATA[S. C.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Criteria of Determining the P/T Upper Limits of GR&R in MSA]]></article-title>
<source><![CDATA[Quality & Quantity]]></source>
<year>2008</year>
<volume>42</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>23-33</page-range></nlm-citation>
</ref>
<ref id="B10">
<label>10</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kappele]]></surname>
<given-names><![CDATA[W. D.]]></given-names>
</name>
<name>
<surname><![CDATA[Raffaldi]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Gage R&R for Destructive Measurement Systems]]></article-title>
<source><![CDATA[Quality Magazine]]></source>
<year>2010</year>
<volume>5</volume>
<page-range>32-34</page-range></nlm-citation>
</ref>
<ref id="B11">
<label>11</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Fang]]></surname>
<given-names><![CDATA[J. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Wang]]></surname>
<given-names><![CDATA[P. S.]]></given-names>
</name>
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[Y. L.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[The Study of Gauge Repeatability and Reproducibility]]></article-title>
<source><![CDATA[Proceeding of the 10th Conference on Interdisciplinary and Multifunctional Business Management]]></source>
<year>2006</year>
<page-range>288-297</page-range></nlm-citation>
</ref>
<ref id="B12">
<label>12</label><nlm-citation citation-type="book">
<collab>Automotive Industry Action Group</collab>
<source><![CDATA[Measurement Systems Analysis (MSA) Reference Manual]]></source>
<year>2010</year>
<edition>4</edition>
<publisher-name><![CDATA[ChryslerFordGM]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B13">
<label>13</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[He]]></surname>
<given-names><![CDATA[S. G.]]></given-names>
</name>
<name>
<surname><![CDATA[Wang]]></surname>
<given-names><![CDATA[G. A.]]></given-names>
</name>
<name>
<surname><![CDATA[Cook]]></surname>
<given-names><![CDATA[D. F.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Multivariate measurement system analysis in multisite testing: An online technique using principal component analysis]]></article-title>
<source><![CDATA[Expert Systems with Applications]]></source>
<year>2011</year>
<volume>38</volume>
<page-range>14602-14608</page-range></nlm-citation>
</ref>
<ref id="B14">
<label>14</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Burdick]]></surname>
<given-names><![CDATA[R. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Borror]]></surname>
<given-names><![CDATA[C. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Montgomery]]></surname>
<given-names><![CDATA[D. C.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A review of methods for measurement systems capability analysis]]></article-title>
<source><![CDATA[Journal of Quality Technology]]></source>
<year>2003</year>
<volume>35</volume>
<numero>4</numero>
<issue>4</issue>
<page-range>342-354</page-range></nlm-citation>
</ref>
<ref id="B15">
<label>15</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[M. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Al-Refaie]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Improving wooden parts' quality by adopting DMAIC procedure]]></article-title>
<source><![CDATA[Quality and Reliability Engineering International]]></source>
<year>2008</year>
<volume>24</volume>
<page-range>351-360</page-range></nlm-citation>
</ref>
<ref id="B16">
<label>16</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Barrentine]]></surname>
<given-names><![CDATA[L. B.]]></given-names>
</name>
</person-group>
<source><![CDATA[Concepts for R&R Studies]]></source>
<year>1991</year>
<publisher-loc><![CDATA[Milwaukee^eWI WI]]></publisher-loc>
<publisher-name><![CDATA[ASQC Quality Press]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B17">
<label>17</label><nlm-citation citation-type="book">
<collab>Automotive Industry Action Group</collab>
<source><![CDATA[Measurement Systems Analysis]]></source>
<year>1997</year>
<publisher-loc><![CDATA[Southfield^eMI MI]]></publisher-loc>
<publisher-name><![CDATA[AIAG Reference Manual]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B18">
<label>18</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Mandel]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Repeatability and Reproducibility]]></article-title>
<source><![CDATA[Journal of Quality Technology]]></source>
<year>1972</year>
<volume>4</volume>
<numero>2</numero>
<issue>2</issue>
<page-range>74-85</page-range></nlm-citation>
</ref>
<ref id="B19">
<label>19</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Montgomery]]></surname>
<given-names><![CDATA[D. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Runger]]></surname>
<given-names><![CDATA[G. C.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Gauge Capability Analysis and Designed Experiments Part II: Experimental Design Models and Variance Component Estimation]]></article-title>
<source><![CDATA[Quality Engineering]]></source>
<year>1993</year>
<volume>6</volume>
<numero>2</numero>
<issue>2</issue>
<page-range>289-305</page-range></nlm-citation>
</ref>
<ref id="B20">
<label>20</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[McNeese]]></surname>
<given-names><![CDATA[W. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Klein]]></surname>
<given-names><![CDATA[R. A.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Measurement System Sampling and Process Capability]]></article-title>
<source><![CDATA[Quality Engineering]]></source>
<year>1991</year>
<volume>4</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>21-39</page-range></nlm-citation>
</ref>
<ref id="B21">
<label>21</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tsai]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Variable Gauge Repeatability and Reproducibility Study Using The Analysis of Variance]]></article-title>
<source><![CDATA[Quality Engineer]]></source>
<year>1998</year>
<volume>1</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>107-115</page-range></nlm-citation>
</ref>
<ref id="B22">
<label>22</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[James]]></surname>
<given-names><![CDATA[P. D.]]></given-names>
</name>
<name>
<surname><![CDATA[Finderne]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
</person-group>
<source><![CDATA[Graphical Display of Gauge R&R Data, ASQC Quality Congress Transactions]]></source>
<year>1991</year>
<page-range>835-839</page-range><publisher-loc><![CDATA[Milwaukee ]]></publisher-loc>
</nlm-citation>
</ref>
<ref id="B23">
<label>23</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Metropolis]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
<name>
<surname><![CDATA[Ulam]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[The Monte Carlo Method]]></article-title>
<source><![CDATA[Journal of the American Statistical Association]]></source>
<year>1949</year>
<volume>44</volume>
<numero>247</numero>
<issue>247</issue>
<page-range>335-341</page-range></nlm-citation>
</ref>
<ref id="B24">
<label>24</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[García-Alonso]]></surname>
<given-names><![CDATA[C. R.]]></given-names>
</name>
<name>
<surname><![CDATA[Arenas-Arroyo]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
<name>
<surname><![CDATA[Pérez-Alcalá]]></surname>
<given-names><![CDATA[G. M.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[macro-economic model to forecast remittances based on Monte-Carlo simulation and artificial intelligence]]></article-title>
<source><![CDATA[Expert Systems with Applications]]></source>
<year>2012</year>
<volume>39</volume>
<page-range>7929-7937</page-range></nlm-citation>
</ref>
<ref id="B25">
<label>25</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Yeh]]></surname>
<given-names><![CDATA[W. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Lin]]></surname>
<given-names><![CDATA[Y. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Chung]]></surname>
<given-names><![CDATA[Y. Y.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Performance analysis of cellular automata Monte Carlo Simulation for estimating network reliability]]></article-title>
<source><![CDATA[Expert Systems with Applications]]></source>
<year>2010</year>
<volume>37</volume>
<page-range>3537-3544</page-range></nlm-citation>
</ref>
<ref id="B26">
<label>26</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Robert]]></surname>
<given-names><![CDATA[C. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Casella]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
</person-group>
<source><![CDATA[Monte Carlo Statistical Methods]]></source>
<year>2004</year>
<edition>2</edition>
<publisher-name><![CDATA[Springer-Verlag]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B27">
<label>27</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Wittwer]]></surname>
<given-names><![CDATA[J. W.]]></given-names>
</name>
</person-group>
<source><![CDATA[Monte Carlo Simulation Basics]]></source>
<year>June</year>
<month> 1</month>
<day>, </day>
<publisher-name><![CDATA[From Vertex42.com]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B28">
<label>28</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Manno]]></surname>
<given-names><![CDATA[I.]]></given-names>
</name>
</person-group>
<source><![CDATA[Introduction to the Monte Carlo Method]]></source>
<year>1999</year>
<publisher-name><![CDATA[Akademiai Kiado]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B29">
<label>29</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Chaitin]]></surname>
<given-names><![CDATA[G. J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Exploring Randomness]]></source>
<year>2001</year>
<publisher-name><![CDATA[Springer-Verlag]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B30">
<label>30</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Lehmer]]></surname>
<given-names><![CDATA[D. H.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Mathematical methods in large-scale computing units]]></article-title>
<source><![CDATA[Proceedings of the Second Symposium on Large Scale Digital Computing Machinery]]></source>
<year>1951</year>
<page-range>141-146</page-range><publisher-name><![CDATA[Harvard University Press]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B31">
<label>31</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Law]]></surname>
<given-names><![CDATA[A. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Kelton]]></surname>
<given-names><![CDATA[W. D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Simulation Modeling & Analysis]]></source>
<year>2000</year>
<edition>Third</edition>
<publisher-name><![CDATA[McGraw-Hill]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B32">
<label>32</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Wichmann]]></surname>
<given-names><![CDATA[B. A.]]></given-names>
</name>
<name>
<surname><![CDATA[Hill]]></surname>
<given-names><![CDATA[I. D.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[An efficient and portable pseudo-random number generator]]></article-title>
<source><![CDATA[Applied Statistics]]></source>
<year>1982</year>
<volume>31</volume>
<numero>2</numero>
<issue>2</issue>
<page-range>188-190</page-range></nlm-citation>
</ref>
<ref id="B33">
<label>33</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Press]]></surname>
<given-names><![CDATA[W. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Flannery]]></surname>
<given-names><![CDATA[B. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Teukolsky]]></surname>
<given-names><![CDATA[S. A.]]></given-names>
</name>
<name>
<surname><![CDATA[Vetterling]]></surname>
<given-names><![CDATA[W. T.]]></given-names>
</name>
</person-group>
<source><![CDATA[Numerical Recipes in FORTRAN 77: The Art of Scientific Computing]]></source>
<year>1992</year>
<edition>Second</edition>
<publisher-name><![CDATA[Cambridge University Press]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B34">
<label>34</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Wheeler]]></surname>
<given-names><![CDATA[D. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Lyday]]></surname>
<given-names><![CDATA[R. W.]]></given-names>
</name>
</person-group>
<source><![CDATA[Evaluating the Measurement Process]]></source>
<year>1989</year>
<publisher-loc><![CDATA[Knoxville^eTennessee Tennessee]]></publisher-loc>
<publisher-name><![CDATA[SPC Press, Inc.]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B35">
<label>35</label><nlm-citation citation-type="">
<collab>ISO</collab>
<source><![CDATA[ISO/IEC Guide 98-3: Uncertainty of measurement - Part3: Guide to the expression of uncertainty in measurement]]></source>
<year>2008</year>
</nlm-citation>
</ref>
<ref id="B36">
<label>36</label><nlm-citation citation-type="book">
<collab>ISO</collab>
<source><![CDATA[ISO 5725-1, Accuracy (trueness and precision) of Measurement Methods and Results-Part 1: General Principles and Definitions]]></source>
<year>1994</year>
<publisher-loc><![CDATA[Geneva ]]></publisher-loc>
<publisher-name><![CDATA[ISO]]></publisher-name>
</nlm-citation>
</ref>
</ref-list>
</back>
</article>
