J. Díaz–Reyes¹, V. Dorantes–García², A. Pérez–Benítez³, J. A. Balderas–López⁴

¹ CIBA–IPN, Ex –Hacienda de San Juan Molino Km. 1.5. Tepetitla, Tlaxcala. C. P. 90700. México.

² Preparatoria Simón Bolívar, BUAP 4 Oriente 408. Col. Centro. C.P. 74200. Atlixco, Pue. México

³ FCQ–BUAP, 14 Sur y Av. San Claudio. Col. San Manuel. C. P. 72570 Puebla, Pue. México

⁴ UPIBI–IPN, Av. Acueducto S/N, Col. Barrio la Laguna, C. P. 07340, México, D. F.

Recibido: 15 de enero de 2008. ]]> Aceptado: 18 de marzo de 2008.

Abstract

Thin film of tungsten oxide (WO₃) has been studied extensively as an electrochromic material and has numerous applications in electrochromic devices, smart windows, gas sensors and optical windows. In order to explore the possibility of using it in electrochromic devices, thorough study the optical properties of the WO₃ is an important step. The WO₃ layers have been grown by hot–filament metal oxide deposition technique under atmospheric pressure and an oxygen atmosphere. By FTIR and Raman scattering studies we found that the films contain hydrates. We have observed that the thin films of WO3 can be satisfactorily grown by this technique.

Keywords: WO₃; Chemistry of light bulb; Infrared spectroscopy; Raman scattering.

DESCARGAR ARTÍCULO EN FORMATO PDF

References

[1] D. Manno, A. Serra, M.Di. Guilio, G. Micocci, A. Tepore, Thin Solid Films 324, 44 (1998).         [ Links ]

[2] S.K. Deb, Appl. Opt. 3J, 192 (1969).         [ Links ]

[3] C.G. Granqvist, Handbook of Inorganic Electrochromic Materials, Elsevier, Amsterdam, 1995.         [ Links ]

[4] P. Cox, the Electronic Structure and Chemistry of Solids, Oxford University Press, Oxford, 1987.         [ Links ]

[5] B.W. Faughnan, R.S. Crandall, Top. Appl. Phys. 40, 181 (1980).         [ Links ]

[6] S. Passerini, B. Scrosati, A. Gorenstein, A.M. Andersson, C.G. Granqvist, J. Electrochem. Soc. 136, 3394 (1989).         [ Links ]

[7] R. Sivakumar, A. Moses Ezhil Raj, B. Subramanian, M. Jayachandran, D.C. Trivedi, C. Sanjeeviraja, Mater. Res. Bull. 39, 1479 (2004).         [ Links ]

[8] K. Miyake, H. Kaneko, M. Sano, N. Suedomi, J. Appl. Phys. 55, 274 (1984) 7.         [ Links ]

[9] J. V. Gabrusenoks, P. D. Cikmach, A.R. Lusis, J. J. Kleperis and G. M. Ramans, Solid State Ionics 14, 25 (1984).         [ Links ]

[10] L. E. Depero, S. Groppelli, I. Natali–Sora, L. Sangaletti, G. Sberveglieri, E. Tondello, J. Solid State Chem. 121, 379 (1996).         [ Links ]

[11] A. Raougier, F. Portemer, A. Quede, M. EI Marssi, Appl. Surf. Sci. 153, 1 (1999).         [ Links ]

[12] L. Dixit, S. K. Kapoor, I. D. Singh and P. L. Gupta, Indian J. Phys. B 51, 116 (1977).         [ Links ]

[13] G. Atanassor, R. Thielsch, D. Popor, Thin Solid Films 223, 288 (1993).         [ Links ]

[14] P. Delichere, P. Falaras, M. Froment, A. Hugot–Le Goff, Thin Solid Films 161, 35 (1988).         [ Links ]

[15] C. J. Wright, J. Solid State Chem. 20, 89 (1977).         [ Links ]

[16] F. Daniel, B. Desbat, J. C. Lassegues, B. Gerand, M. Figlarz, J. Solid State Chem. 67, 235 (1987).         [ Links ]

[17] J. Pfeifer, Cao Guifang, P. Tekula–Buxbaum, B. A. Kiss, M. Farkas–Jahnke, and K. Vadasdi, J. Solid State Chem. 119, 90 (1995).         [ Links ]

[18] I. Hargittai, M. Hargittai, V. P. Spiridonov and E. V. Erokhin, J. Mol. Struct. 8, 31 (1971).         [ Links ]

[19] U. Opara Krasovec, A. Surca Vuk, B. Orel, Electrochimica Acta 46, 1921 (2001).         [ Links ]

[20] H. A. Willis, J. H. van der Maas and R. G. J. Miller, Laboratory Methods in Vibrational Spectroscopy, 3^rd Edition, John Wiley & Sons: New York (1987).         [ Links ]

[21] K. Bange, Sol. Ener. Mater. And Sol. Cell 58, 1 (1999).         [ Links ]

[22] C. Cantalini, H. T. Faccio, M. Pelino, Sensors and Actuators B 31, 81 (1996).         [ Links ]

[23] B. M. Weckhuysen, J.–M. Jehng, I. E. Wachs, J. Phys. Chem. B 104, 7382 (2000).         [ Links ]

[24] T. Kubo, Y.Nishikitani, J. Electrochem. Soc. 145, 1729 (1998) .         [ Links ]

[25] P. Tagtstrom, U. Jansson, Thin Solid Films 352, 107 (1999) .         [ Links ]

[26] Y. Shigesato, Y. Hayashi, A. Masui, T. Haranou, Jpn. J. Appl. Phys. 30, 814 (1991).         [ Links ]

[27] D. Gazzoli, M. Valigi, R. Dragone, A. Marucci and G. Mattei, J. Phys. Chem. B 101, 11129 (1997).         [ Links ]

[28] M.Regragui, M. Addou, A. Outzourhi, J. C. Bernede, Elb. EI Idrissi, E. Benseddik, A. Kachouane, Thin Solid Films 358, 40 (2000).         [ Links ]