<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1405-5546</journal-id>
<journal-title><![CDATA[Computación y Sistemas]]></journal-title>
<abbrev-journal-title><![CDATA[Comp. y Sist.]]></abbrev-journal-title>
<issn>1405-5546</issn>
<publisher>
<publisher-name><![CDATA[Instituto Politécnico Nacional, Centro de Investigación en Computación]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1405-55462015000200005</article-id>
<article-id pub-id-type="doi">10.13053/CyS-19-2-1944</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[A Photometric Sampling Strategy for Reflectance Characterization and Transference]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Castelán]]></surname>
<given-names><![CDATA[Mario]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Cruz-Pérez]]></surname>
<given-names><![CDATA[Elier]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Torres-Méndez]]></surname>
<given-names><![CDATA[Luz Abril]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Instituto Politécnico Nacional Centro de Investigación y Estudios Avanzados Grupo de Robótica y Manufactura Avanzada]]></institution>
<addr-line><![CDATA[Ramos Arizpe Coahuila]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>06</month>
<year>2015</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>06</month>
<year>2015</year>
</pub-date>
<volume>19</volume>
<numero>2</numero>
<fpage>255</fpage>
<lpage>272</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S1405-55462015000200005&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S1405-55462015000200005&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S1405-55462015000200005&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Rendering 3D models with real world reflectance properties is an open research problem with significant applications in the field of computer graphics and image understanding. In this paper, our interest is in the characterization and transference of appearance from a source object onto a target 3D shape. To this end, a three-step strategy is proposed. In the first step, reflectance is sampled by rotating a light source in concentric circles around the source object. Singular value decomposition is then used for describing, in a pixel-wise manner, appearance features such as color, texture, and specular regions. The second step introduces a Markov random field transference method based on surface normal correspondence between the source object and a synthetic sphere. The aim of this step is to generate a sphere whose appearance emulates that of the source material. In the third step, final transference of properties is performed from the surface normals of the generated sphere to the surface normals of the target 3D model. Experimental evaluation validates the suitability of the proposed strategy for transferring appearance from a variety of materials between diverse shapes.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Reflectance transference]]></kwd>
<kwd lng="en"><![CDATA[singular value decomposition]]></kwd>
<kwd lng="en"><![CDATA[random Markov fields]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="justify"><font face="verdana" size="4">Art&iacute;culos</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="4"><b>A Photometric Sampling Strategy for Reflectance Characterization and Transference</b></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="2"><b>Mario Castel&aacute;n, Elier Cruz&#45;P&eacute;rez, Luz Abril Torres&#45;M&eacute;ndez</b></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Centro de Investigaci&oacute;n y Estudios Avanzados del Instituto Polit&eacute;cnico Nacional, Grupo de Rob&oacute;tica y Manufactura Avanzada, Ramos Arizpe, Coah.,</i> <i>M&eacute;xico.</i> <a href="mailto:mario.castelan@cinvestav.edu.mx">mario.castelan@cinvestav.edu.mx</a></font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Corresponding author is Mario Castel&aacute;n.</i></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">Article received on 20/02/2014.    <br> 	Accepted on 06/05/2015.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Rendering 3D models with real world reflectance properties is an open research problem with significant applications in the field of computer graphics and image understanding. In this paper, our interest is in the characterization and transference of appearance from a source object onto a target 3D shape. To this end, a three&#45;step strategy is proposed. In the first step, reflectance is sampled by rotating a light source in concentric circles around the source object. Singular value decomposition is then used for describing, in a pixel&#45;wise manner, appearance features such as color, texture, and specular regions. The second step introduces a Markov random field transference method based on surface normal correspondence between the source object and a synthetic sphere. The aim of this step is to generate a sphere whose appearance emulates that of the source material. In the third step, final transference of properties is performed from the surface normals of the generated sphere to the surface normals of the target 3D model. Experimental evaluation validates the suitability of the proposed strategy for transferring appearance from a variety of materials between diverse shapes.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Reflectance transference, singular value decomposition, random Markov fields.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/cys/v19n2/v19n2a5.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2"><b>1. Basri, R. &amp; Jacobs, D. (2003).</b> Lambertian reflectance and linear subspaces. <i>IEEE Trans. on Pattern Analysis and Machine Intelligence,</i> Vol. 25, No. 6, pp. 383&#45;390.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073292&pid=S1405-5546201500020000500001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>2. Blanz, V. &amp; Vetter, T. (1999).</b> A morphable model for the synthesis of 3d faces. <i>Proc. SIGGRAPH,</i> volume 1, pp. 187&#45;194.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073294&pid=S1405-5546201500020000500002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>3. Chen, H., Belhumeur, P., &amp; Jacobs, D. (2000).</b> In search of illumination invariants. <i>Proc. IEEE InternationalConference in ComputerVision andPattern Recognition,</i> pp. 1&#45;8.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073296&pid=S1405-5546201500020000500003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>4. Cook, L. R. &amp; Torrance, K. E. (1982).</b> A reflectance model for computer graphics. <i>ACM Trans. Graph.,</i> Vol. 1, pp. 7&#45;24.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073298&pid=S1405-5546201500020000500004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>5. Cross, G. R. &amp; Jain, A. K. (1983).</b> Markov random field texture models. <i>Pattern Analysis and Machine Intelligence, IEEE Transactions on,</i> Vol. 5, pp. 25&#45;39.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073300&pid=S1405-5546201500020000500005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2"><b>6. Curet (1999). </b><i>Columbia&#45;utrech Reflectance and Texture Database.</i> <a href="http://www.cs.columbia.edu/CAVE/curet/" target="_blank">http://www.cs.columbia.edu/CAVE/curet/</a>.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073302&pid=S1405-5546201500020000500006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>7. Dana, K. J. (2001).</b> Brdf/btf measurement device. <i>Proc. IEEE International Conference in Computer Vision,</i> volume 2, pp. 460&#45;466.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073304&pid=S1405-5546201500020000500007&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>8. Dana, K. J., Ginneken, B. V., Nayar, S. K., &amp; Koenderink, J. J. (1999).</b> Reflectance and texture of real&#45;world surfaces. <i>ACM Trans. Graph.,</i> Vol. 18, pp. 1&#45;34.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073306&pid=S1405-5546201500020000500008&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>9. Epstein, R., Hallinan, P. W., &amp; Yuille, A. L. (1995).</b> 5&plusmn;2 eigenimages suffice: an empirical investigation of low&#45;dimensional lighting models. <i>Proc. Workshop on Physics&#45;based Modelling in Computer Vision,</i> pp. 108&#45;116.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073308&pid=S1405-5546201500020000500009&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>10. F. E. Nicodemus, I. W. G., J. C. Richmond &amp; Limperis, T. (1977).</b> Geometrical considerations and nomenclature for reflectance. <i>NBS Monograph.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073310&pid=S1405-5546201500020000500010&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></i></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2"><b>11. Ghosh, A., Heidrich, W., Achutha, S., &amp; O'Toole, M. (2010).</b> A basis illumination approach to BRDF measurement. <i>International Journal of Computer Vision,</i> Vol. 90, pp. 183&#45;197.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073312&pid=S1405-5546201500020000500011&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>12. He, X. D., Torrance, K. E., Sillion, F. X., &amp; Greenberg, D. P. (1991).</b> A comprehensive physical model for light reflection. <i>Proc. SIGGRAPH Computer Graphics,</i> volume 25, pp. 175&#45;186.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073314&pid=S1405-5546201500020000500012&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>13. Hern&aacute;ndez&#45;Rodr&iacute;guez, F. &amp; Castel&aacute;n, M. (2012).</b> A method for improving consistency in photometric databases. <i>Proc. British Machine Vision Conference,</i> pp. 1&#45;10.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073316&pid=S1405-5546201500020000500013&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>14. Hertzmann, A. &amp; Seitz, S. M. (2005).</b> Example&#45;based photometric stereo: Shape reconstruction with general, varying brdfs. <i>IEEE Transactions on Pattern Analysis and Machine Intelligence,</i> Vol. 27, No. 8, pp. 1254&#45;1264.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073318&pid=S1405-5546201500020000500014&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>15. Liu, R. &amp; Han, J. (2010).</b> Recovering surface normal of specular object by hough transform method. <i>IET Computer Vision,</i> Vol. 4, No. 2, pp. 129&#45;137.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073320&pid=S1405-5546201500020000500015&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2"><b>16. Marschner, S. R., Westin, S. H., Lafortune, E. P. F., &amp; Torrance, K. E. (2000).</b> Image&#45;based bidirectional reflectance distribution function measurement. <i>Appl. Opt.,</i> Vol. 39, No. 16, pp. 2592&#45;2600.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073322&pid=S1405-5546201500020000500016&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>17. Matusik, W., Pfister, H., Brand, M., &amp; McMillan, L. (2000).</b> A data&#45;driven reflectance model. <i>ACM Trans. Graph.,</i> Vol. 22, No. 3, pp. 759&#45;769.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073324&pid=S1405-5546201500020000500017&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>18. Mertens, T., Kautz, J., Chen, J., Bekaert, P., &amp; Durand, F. (2006).</b> Texture transfer using geometry correlation. <i>Proc. Eurographics Symposium on Rendering,</i> pp. 273&#45;284.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073326&pid=S1405-5546201500020000500018&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>19. Murase, H. &amp; Nayar, S. (1993).</b> Parametric eigenspace representation for visual learning and recognition. <i>Proc. SPIE Geometric Methods in Computer Vision II,</i> volume 2031, pp. 378&#45;391.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073328&pid=S1405-5546201500020000500019&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>20. Phong, B. T. (1975).</b> Illumination for computer generated pictures. <i>Communications of ACM,</i> Vol. 18, No. 6, pp. 311&#45;317.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073330&pid=S1405-5546201500020000500020&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2"><b>21. Ramamoorthi, R. (2002).</b> Analytic pca reconstruction for theoretical analysis of lighting variability in images of a lambertian object. <i>IEEE Trans. on Pattern Analysis and Machine Intelligence,</i> Vol. 24, No. 10, pp. 1322&#45;1333.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073332&pid=S1405-5546201500020000500021&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>22. Saito, H., Omata, K., &amp; Ozawa, S. (2003).</b> Recovery of shape and surface reflectance of specular object from relative rotation of light source. <i>Image and Vision Computing,</i> Vol. 21, pp. 777&#45;787.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073334&pid=S1405-5546201500020000500022&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>23. Sato, I., Okabe, T., Yu, Q., &amp; Sato, Y. (2007).</b> Shape reconstruction based on similarity in radiance changes under varying illumination. <i>IEEE International Conference in Computer Vision,</i> pp. 1&#45;8.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073336&pid=S1405-5546201500020000500023&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>24. Standford_Repository (2011).</b> The Stanford 3D scanning repository. <a href="http://graphics.stanford.edu/data/3Dscanrep/" target="_blank">http://graphics.stanford.edu/data/3Dscanrep/</a>.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073338&pid=S1405-5546201500020000500024&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2"><b>25. Ward., G. J. (1992).</b> Measuring and modeling anisotropic reflection. <i>Proc. SIGGRAPH Comput. Graph.,</i> volume 24, pp. 265&#45;272.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=2073340&pid=S1405-5546201500020000500025&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     ]]></body>
<body><![CDATA[ ]]></body><back>
<ref-list>
<ref id="B1">
<label>1</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Basri]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Jacobs]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Lambertian reflectance and linear subspaces]]></article-title>
<source><![CDATA[IEEE Trans. on Pattern Analysis and Machine Intelligence]]></source>
<year>2003</year>
<volume>25</volume>
<numero>6</numero>
<issue>6</issue>
<page-range>383-390</page-range></nlm-citation>
</ref>
<ref id="B2">
<label>2</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Blanz]]></surname>
<given-names><![CDATA[V.]]></given-names>
</name>
<name>
<surname><![CDATA[Vetter]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A morphable model for the synthesis of 3d faces]]></article-title>
<source><![CDATA[Proc. SIGGRAPH]]></source>
<year>1999</year>
<volume>1</volume>
<page-range>187-194</page-range></nlm-citation>
</ref>
<ref id="B3">
<label>3</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Chen]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Belhumeur]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[Jacobs]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<source><![CDATA[In search of illumination invariants]]></source>
<year>2000</year>
<page-range>1-8</page-range></nlm-citation>
</ref>
<ref id="B4">
<label>4</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Cook]]></surname>
<given-names><![CDATA[L. R.]]></given-names>
</name>
<name>
<surname><![CDATA[Torrance]]></surname>
<given-names><![CDATA[K. E.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A reflectance model for computer graphics]]></article-title>
<source><![CDATA[ACM Trans. Graph.]]></source>
<year>1982</year>
<volume>1</volume>
<page-range>7-24</page-range></nlm-citation>
</ref>
<ref id="B5">
<label>5</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Cross]]></surname>
<given-names><![CDATA[G. R.]]></given-names>
</name>
<name>
<surname><![CDATA[Jain]]></surname>
<given-names><![CDATA[A. K.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Markov random field texture models]]></article-title>
<source><![CDATA[Pattern Analysis and Machine Intelligence, IEEE Transactions on]]></source>
<year>1983</year>
<volume>5</volume>
<page-range>25-39</page-range></nlm-citation>
</ref>
<ref id="B6">
<label>6</label><nlm-citation citation-type="">
<collab>Curet</collab>
<source><![CDATA[Columbia-utrech Reflectance and Texture Database]]></source>
<year>1999</year>
</nlm-citation>
</ref>
<ref id="B7">
<label>7</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Dana]]></surname>
<given-names><![CDATA[K. J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Brdf/btf measurement device]]></source>
<year>2001</year>
<volume>2</volume>
<page-range>460-466</page-range></nlm-citation>
</ref>
<ref id="B8">
<label>8</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Dana]]></surname>
<given-names><![CDATA[K. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Ginneken]]></surname>
<given-names><![CDATA[B. V.]]></given-names>
</name>
<name>
<surname><![CDATA[Nayar]]></surname>
<given-names><![CDATA[S. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Koenderink]]></surname>
<given-names><![CDATA[J. J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Reflectance and texture of real-world surfaces]]></article-title>
<source><![CDATA[ACM Trans. Graph.]]></source>
<year>1999</year>
<volume>18</volume>
<page-range>1-34</page-range></nlm-citation>
</ref>
<ref id="B9">
<label>9</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Epstein]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Hallinan]]></surname>
<given-names><![CDATA[P. W.]]></given-names>
</name>
<name>
<surname><![CDATA[Yuille]]></surname>
<given-names><![CDATA[A. L.]]></given-names>
</name>
</person-group>
<source><![CDATA[5±2 eigenimages suffice: an empirical investigation of low-dimensional lighting models]]></source>
<year>1995</year>
<page-range>108-116</page-range></nlm-citation>
</ref>
<ref id="B10">
<label>10</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Nicodemus]]></surname>
<given-names><![CDATA[F. E.]]></given-names>
</name>
<name>
<surname><![CDATA[Richmond]]></surname>
<given-names><![CDATA[J. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Limperis]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
</person-group>
<source><![CDATA[Geometrical considerations and nomenclature for reflectance]]></source>
<year>1977</year>
<publisher-name><![CDATA[NBS Monograph]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B11">
<label>11</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ghosh]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Heidrich]]></surname>
<given-names><![CDATA[W.]]></given-names>
</name>
<name>
<surname><![CDATA[Achutha]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[O'Toole]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A basis illumination approach to BRDF measurement]]></article-title>
<source><![CDATA[International Journal of Computer Vision]]></source>
<year>2010</year>
<volume>90</volume>
<page-range>183-197</page-range></nlm-citation>
</ref>
<ref id="B12">
<label>12</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[He]]></surname>
<given-names><![CDATA[X. D.]]></given-names>
</name>
<name>
<surname><![CDATA[Torrance]]></surname>
<given-names><![CDATA[K. E.]]></given-names>
</name>
<name>
<surname><![CDATA[Sillion]]></surname>
<given-names><![CDATA[F. X.]]></given-names>
</name>
<name>
<surname><![CDATA[Greenberg]]></surname>
<given-names><![CDATA[D. P.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A comprehensive physical model for light reflection]]></article-title>
<source><![CDATA[Proc. SIGGRAPH Computer Graphics]]></source>
<year>1991</year>
<volume>25</volume>
<page-range>175-186</page-range></nlm-citation>
</ref>
<ref id="B13">
<label>13</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Hernández-Rodríguez]]></surname>
<given-names><![CDATA[F.]]></given-names>
</name>
<name>
<surname><![CDATA[Castelán]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
</person-group>
<source><![CDATA[A method for improving consistency in photometric databases]]></source>
<year>2012</year>
<page-range>1-10</page-range></nlm-citation>
</ref>
<ref id="B14">
<label>14</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Hertzmann]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Seitz]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Example-based photometric stereo: Shape reconstruction with general, varying brdfs]]></article-title>
<source><![CDATA[IEEE Transactions on Pattern Analysis and Machine Intelligence]]></source>
<year>2005</year>
<volume>27</volume>
<numero>8</numero>
<issue>8</issue>
<page-range>1254-1264</page-range></nlm-citation>
</ref>
<ref id="B15">
<label>15</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Liu]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Han]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Recovering surface normal of specular object by hough transform method]]></article-title>
<source><![CDATA[IET Computer Vision]]></source>
<year>2010</year>
<volume>4</volume>
<numero>2</numero>
<issue>2</issue>
<page-range>129-137</page-range></nlm-citation>
</ref>
<ref id="B16">
<label>16</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Marschner]]></surname>
<given-names><![CDATA[S. R.]]></given-names>
</name>
<name>
<surname><![CDATA[Westin]]></surname>
<given-names><![CDATA[S. H.]]></given-names>
</name>
<name>
<surname><![CDATA[Lafortune]]></surname>
<given-names><![CDATA[E. P. F.]]></given-names>
</name>
<name>
<surname><![CDATA[Torrance]]></surname>
<given-names><![CDATA[K. E.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Image-based bidirectional reflectance distribution function measurement]]></article-title>
<source><![CDATA[Appl. Opt.]]></source>
<year>2000</year>
<volume>39</volume>
<numero>16</numero>
<issue>16</issue>
<page-range>2592-2600</page-range></nlm-citation>
</ref>
<ref id="B17">
<label>17</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Matusik]]></surname>
<given-names><![CDATA[W.]]></given-names>
</name>
<name>
<surname><![CDATA[Pfister]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Brand]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[McMillan]]></surname>
<given-names><![CDATA[L.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[A data-driven reflectance model]]></article-title>
<source><![CDATA[ACM Trans. Graph.]]></source>
<year>2000</year>
<volume>22</volume>
<numero>3</numero>
<issue>3</issue>
<page-range>759-769</page-range></nlm-citation>
</ref>
<ref id="B18">
<label>18</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Mertens]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Kautz]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Chen]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Bekaert]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[Durand]]></surname>
<given-names><![CDATA[F.]]></given-names>
</name>
</person-group>
<source><![CDATA[Texture transfer using geometry correlation]]></source>
<year>2006</year>
<page-range>273-284</page-range></nlm-citation>
</ref>
<ref id="B19">
<label>19</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Murase]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Nayar]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
</person-group>
<source><![CDATA[Parametric eigenspace representation for visual learning and recognition]]></source>
<year>1993</year>
<volume>2031</volume>
<page-range>378-391</page-range></nlm-citation>
</ref>
<ref id="B20">
<label>20</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Phong]]></surname>
<given-names><![CDATA[B. T.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Illumination for computer generated pictures]]></article-title>
<source><![CDATA[Communications of ACM]]></source>
<year>1975</year>
<volume>18</volume>
<numero>6</numero>
<issue>6</issue>
<page-range>311-317</page-range></nlm-citation>
</ref>
<ref id="B21">
<label>21</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ramamoorthi]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Analytic pca reconstruction for theoretical analysis of lighting variability in images of a lambertian object]]></article-title>
<source><![CDATA[IEEE Trans. on Pattern Analysis and Machine Intelligence]]></source>
<year>2002</year>
<volume>24</volume>
<numero>10</numero>
<issue>10</issue>
<page-range>1322-1333</page-range></nlm-citation>
</ref>
<ref id="B22">
<label>22</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Saito]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Omata]]></surname>
<given-names><![CDATA[K.]]></given-names>
</name>
<name>
<surname><![CDATA[Ozawa]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Recovery of shape and surface reflectance of specular object from relative rotation of light source]]></article-title>
<source><![CDATA[Image and Vision Computing]]></source>
<year>2003</year>
<volume>21</volume>
<page-range>777-787</page-range></nlm-citation>
</ref>
<ref id="B23">
<label>23</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Sato]]></surname>
<given-names><![CDATA[I.]]></given-names>
</name>
<name>
<surname><![CDATA[Okabe]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Yu]]></surname>
<given-names><![CDATA[Q.]]></given-names>
</name>
<name>
<surname><![CDATA[Sato]]></surname>
<given-names><![CDATA[Y.]]></given-names>
</name>
</person-group>
<source><![CDATA[Shape reconstruction based on similarity in radiance changes under varying illumination]]></source>
<year>2007</year>
<page-range>1-8</page-range></nlm-citation>
</ref>
<ref id="B24">
<label>24</label><nlm-citation citation-type="">
<collab>Standford_Repository</collab>
<source><![CDATA[The Stanford 3D scanning repository]]></source>
<year>2011</year>
</nlm-citation>
</ref>
<ref id="B25">
<label>25</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ward]]></surname>
<given-names><![CDATA[G. J.]]></given-names>
</name>
</person-group>
<article-title xml:lang="en"><![CDATA[Measuring and modeling anisotropic reflection]]></article-title>
<source><![CDATA[Proc. SIGGRAPH Comput. Graph.]]></source>
<year>1992</year>
<volume>24</volume>
<page-range>265-272</page-range></nlm-citation>
</ref>
</ref-list>
</back>
</article>
