<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2014000100015</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Graphite thin film characterization using a simplified resonant near field scanning microwave microscope]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[López-Maldonado]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Qureshi]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Kolokoltsev]]></surname>
<given-names><![CDATA[O. V.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Vargas-Hernández]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Ordóñez-Romero]]></surname>
<given-names><![CDATA[C. L.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Centro de Ciencias Aplicadas y Desarrollo Tecnológico  ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad Nacional Autónoma de México Instituto de Física ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>02</month>
<year>2014</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>02</month>
<year>2014</year>
</pub-date>
<volume>60</volume>
<numero>1</numero>
<fpage>88</fpage>
<lpage>94</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2014000100015&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2014000100015&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2014000100015&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non-uniform granular graphite film sample and the surface resistance results agree with data in the literature.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Presentamos una descripción del diseño de un microscopio de microondas altamente simplificado de exploración por barrido con resonador coaxial que opera en el campo cercano a 7.4 GHz configurado para la medición de la resistencia superficial y la obtención de imágenes topográficas con resolución micrométrica. El diseño de una sonda altamente estable permite la sintonización rápida de la frecuencia de resonancia mediante un sistema mecánico, y esto hace posible una implementación eficiente de la microscopía de microondas de campo cercano. Las imágenes y mediciones presentadas corresponden a una película de grafito granular no uniforme cuya resistencia superficial medida concuerda con los datos reportados en la literatura.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Near field scanning microwave microscopy]]></kwd>
<kwd lng="en"><![CDATA[surface resistance]]></kwd>
<kwd lng="en"><![CDATA[topographic images]]></kwd>
<kwd lng="en"><![CDATA[resonant probe]]></kwd>
<kwd lng="en"><![CDATA[resonant frequency]]></kwd>
<kwd lng="es"><![CDATA[Microscopía de microondas de campo cercano]]></kwd>
<kwd lng="es"><![CDATA[resistencia superficial]]></kwd>
<kwd lng="es"><![CDATA[imágenes topográficas]]></kwd>
<kwd lng="es"><![CDATA[sonda resonante]]></kwd>
<kwd lng="es"><![CDATA[frecuencia resonante]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[  	    <p align="justify"><font face="verdana" size="4">Instrumentaci&oacute;n</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="4"><b>Graphite thin film characterization using a simplified resonant near field scanning microwave microscope</b></font></p>  	    <p align="center"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="center"><font face="verdana" size="2"><b>G. L&oacute;pez&#45;Maldonado, N. Qureshi*, O. V. Kolokoltsev,</b> <b>H. Vargas&#45;Hern&aacute;ndez and C. L. Ord&oacute;&ntilde;ez&#45;Romero</b></font></p>  	    <p align="justify"><font face="verdana" size="2"></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Centro de Ciencias Aplicadas y Desarrollo Tecnol&oacute;gico (CCADET), * e&#45;mail:</i> <a href="mailto:naser.qureshi@ccadet.unam.mx">naser.qureshi@ccadet.unam.mx</a></font></p>  	    <p align="justify"><font face="verdana" size="2"><i>Instituto de F&iacute;sica, Universidad Nacional Aut&oacute;noma de M&eacute;xico, Cd. Universitaria, M&eacute;xico D.F., M&eacute;xico.</i></font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2">Received 19 February 2013.    <br> 	Accepted 30 September 2013.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>  	    <p align="justify"><font face="verdana" size="2">We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non&#45;uniform granular graphite film sample and the surface resistance results agree with data in the literature.</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Keywords:</b> Near field scanning microwave microscopy; surface resistance; topographic images; resonant probe; resonant frequency.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>  	    <p align="justify"><font face="verdana" size="2">Presentamos una descripci&oacute;n del dise&ntilde;o de un microscopio de microondas altamente simplificado de exploraci&oacute;n por barrido con resonador coaxial que opera en el campo cercano a 7.4 GHz configurado para la medici&oacute;n de la resistencia superficial y la obtenci&oacute;n de im&aacute;genes topogr&aacute;ficas con resoluci&oacute;n microm&eacute;trica. El dise&ntilde;o de una sonda altamente estable permite la sintonizaci&oacute;n r&aacute;pida de la frecuencia de resonancia mediante un sistema mec&aacute;nico, y esto hace posible una implementaci&oacute;n eficiente de la microscop&iacute;a de microondas de campo cercano. Las im&aacute;genes y mediciones presentadas corresponden a una pel&iacute;cula de grafito granular no uniforme cuya resistencia superficial medida concuerda con los datos reportados en la literatura.</font></p>  	    ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2"><i>Descriptores:</i> Microscop&iacute;a de microondas de campo cercano; resistencia superficial; im&aacute;genes topogr&aacute;ficas; sonda resonante; frecuencia resonante.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2">PACS: 78.70.Gq.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v60n1/v60n1a15.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>Acknowledgement</b></font></p>  	    <p align="justify"><font face="verdana" size="2">This work was supported by PAPIIT UNAM, project IN104513. The authors are grateful to Agilent, Mexico, for their generous assistance with microwave measurements.</font></p>  	    <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>  	    <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">1. T. Wei, X. &#45;D. Xiang, W. G. Wallace&#45;Freedman and P. G. Schultz, <i>Appl. Phys. Lett.</i> 68 (1996) 3506.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393177&pid=S0035-001X201400010001500001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">2. M. Tabib&#45;Azar and D. Akinwande, <i>Rev. Sci. Instrum.</i> 71 (2000) 1460.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393179&pid=S0035-001X201400010001500002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">3. M. Park, H. Yoo, H. Yoo, S. Na, S. Kim, K. Lee, B. Friedman, E. Lim and M. Iwamoto, <i>Thin Solid Films</i> 499 (2006) 318.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393181&pid=S0035-001X201400010001500003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">4. C. Gao and X. &#45;D. Xiang, <i>Rev. Sci. Instrum.</i> 69 (1998) 3846.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393183&pid=S0035-001X201400010001500004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">5. M. Tabib&#45;Azar, P. S. Pathak, G. Ponchak and S. LeClair, <i>Rev.</i> <i>Sci. Instrum.</i> 70 (1999) 2783.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393185&pid=S0035-001X201400010001500005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">6. R. A. Kleismit, M. K. Kazimierczuk and G. Kozlowski, <i>IEEE Trans. on Microwave Theory and Tech,</i> 54 (2006) 639.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393187&pid=S0035-001X201400010001500006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">7. A. Imtiaz, S. M. Anlage, J. D. Barry and J. Melngailis, <i>Appl.</i> <i>Phys. Lett.</i> 90 (2007) 143106&#45;1.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393189&pid=S0035-001X201400010001500007&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">8. M. Tabib&#45;Azar and Y. Wang, <i>IEEE Trans. on Microwave Theory and Tech.</i> 52 (2004) 971.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393191&pid=S0035-001X201400010001500008&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">9. D. W. van der Weide, <i>Appl. Phys. Lett.</i> 70 (1997) 677.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393193&pid=S0035-001X201400010001500009&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">10. M. Tabib&#45;Azar, D. &#45;P. Su, A. Pohar, S. R. LeClair and G. Ponchak, <i>Rev. Sci. Instrum.</i> 70 (1999) 1725.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393195&pid=S0035-001X201400010001500010&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">11 . B. T. Rosner and D. W. van der Weide, <i>Rev. Sci. Instrum.</i> 73 (2002) 2505.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393197&pid=S0035-001X201400010001500011&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">12. C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar and F. C. Wellstood, <i>Appl. Phys. Lett.</i> 69 (1996) 3272.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393199&pid=S0035-001X201400010001500012&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">13. M. Abu&#45;Teir, M. Golosovsky, and D. Davidov, <i>Rev. Sci. Instrum.</i> 72 (2001)2073.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393201&pid=S0035-001X201400010001500013&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">14. J. Kim, K. Lee, B. Friedman and D. Cha, <i>Appl. Phys. Lett.</i> 83 (2003) 1032.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393203&pid=S0035-001X201400010001500014&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">15. J. Kim, M. S. Kim, K. Lee, J. Lee, D. Cha and B. Friedman, <i>Meas. Sci. Technol.</i> 14 (2003) 7.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393205&pid=S0035-001X201400010001500015&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">16. C. P. Vlahacos, D. E. Steinhauer, S. K. Dutta, B. J. Feenstra, S. M. Anlage and F. C. Wellstood, <i>Appl. Phys. Lett.</i> 72 (1998) 1778.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393207&pid=S0035-001X201400010001500016&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">17. D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta, B. J. Feenstra, F. C. Wellstood and S. M. Anlage, <i>Appl. Phys. Lett.</i> 72 (1998) 861.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393209&pid=S0035-001X201400010001500017&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">18. K. Lee, H. Melikyan, A. Babajanyan, T. Sargsyan, J. Kim, S. Kim and Barry Friedman, <i>Ultra&#45;microscopy</i> 109 (2009) 889.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393211&pid=S0035-001X201400010001500018&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">19. S&#45;C. Lee, C. P. Vlahacos, B. J. Feenstra, A. Schwartz, D. E. Steinhauer, F. C. Wellstood and S. M. Anlage, <i>Appl. Phys. Lett.</i> 77 (2000) 4404.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393213&pid=S0035-001X201400010001500019&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">20. A. Tselev, S. M. Anlage, Z. Ma and J. Melngailis, <i>Rev. Sci. Instrum.</i> 78 (2007) 044701&#45;1.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393215&pid=S0035-001X201400010001500020&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    ]]></body>
<body><![CDATA[<!-- ref --><p align="justify"><font face="verdana" size="2">21. P. J. Petersan and S. M. Anlage, <i>J. Appl. Phys.</i> 84 (1998) 3392.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393217&pid=S0035-001X201400010001500021&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">22. N. Qureshi, O. V. Kolokoltsev, R. Ortega&#45;Martinez,C. L. Ordo&ntilde;ez&#45;Romero and J. M. Saniger, <i>J. Nanosci. Nanotechnol</i> 8 (2008) 6466.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393219&pid=S0035-001X201400010001500022&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">23. S. M. Anlage, V. V. Talanov and A. R. Schwartz, <i>Principles of Near&#45;Field Microwave Microscopy, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale,</i> vol. 1, (Springer&#45;Verlag, New York, 2007), pp. 215253.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393221&pid=S0035-001X201400010001500023&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">24. D. M. Pozar, <i>Microwave Engineering,</i> 3rd ed.(John Wiley &amp; Sons, USA, 2005). pp 687.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393223&pid=S0035-001X201400010001500024&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>  	    <!-- ref --><p align="justify"><font face="verdana" size="2">25. M. Mehdizadeh, Microwave/RF Applicators and Probes, (Elsevier, Great Britain, 2010). pp 24 56.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8393225&pid=S0035-001X201400010001500025&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     ]]></body>
<body><![CDATA[ ]]></body><back>
<ref-list>
<ref id="B1">
<label>1</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Wei]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Xiang]]></surname>
<given-names><![CDATA[X. -D.]]></given-names>
</name>
<name>
<surname><![CDATA[Wallace-Freedman]]></surname>
<given-names><![CDATA[W. G.]]></given-names>
</name>
<name>
<surname><![CDATA[Schultz]]></surname>
<given-names><![CDATA[P. G.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>1996</year>
<volume>68</volume>
<page-range>3506</page-range></nlm-citation>
</ref>
<ref id="B2">
<label>2</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tabib-Azar]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Akinwande]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>2000</year>
<volume>71</volume>
<page-range>1460</page-range></nlm-citation>
</ref>
<ref id="B3">
<label>3</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Park]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Yoo]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Yoo]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Na]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[K.]]></given-names>
</name>
<name>
<surname><![CDATA[Friedman]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
<name>
<surname><![CDATA[Lim]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
<name>
<surname><![CDATA[Iwamoto]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Thin Solid Films]]></source>
<year>2006</year>
<volume>499</volume>
<page-range>318</page-range></nlm-citation>
</ref>
<ref id="B4">
<label>4</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Gao]]></surname>
<given-names><![CDATA[C.]]></given-names>
</name>
<name>
<surname><![CDATA[Xiang]]></surname>
<given-names><![CDATA[X. -D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>1998</year>
<volume>69</volume>
<page-range>3846</page-range></nlm-citation>
</ref>
<ref id="B5">
<label>5</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tabib-Azar]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Pathak]]></surname>
<given-names><![CDATA[P. S.]]></given-names>
</name>
<name>
<surname><![CDATA[Ponchak]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
<name>
<surname><![CDATA[LeClair]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>1999</year>
<volume>70</volume>
<page-range>2783</page-range></nlm-citation>
</ref>
<ref id="B6">
<label>6</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kleismit]]></surname>
<given-names><![CDATA[R. A.]]></given-names>
</name>
<name>
<surname><![CDATA[Kazimierczuk]]></surname>
<given-names><![CDATA[M. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Kozlowski]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
</person-group>
<source><![CDATA[IEEE Trans. on Microwave Theory and Tech]]></source>
<year>2006</year>
<volume>54</volume>
<page-range>639</page-range></nlm-citation>
</ref>
<ref id="B7">
<label>7</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Imtiaz]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Barry]]></surname>
<given-names><![CDATA[J. D.]]></given-names>
</name>
<name>
<surname><![CDATA[Melngailis]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>2007</year>
<volume>90</volume>
<page-range>143106-1</page-range></nlm-citation>
</ref>
<ref id="B8">
<label>8</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tabib-Azar]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Wang]]></surname>
<given-names><![CDATA[Y.]]></given-names>
</name>
</person-group>
<source><![CDATA[IEEE Trans. on Microwave Theory and Tech.]]></source>
<year>2004</year>
<volume>52</volume>
<page-range>971</page-range></nlm-citation>
</ref>
<ref id="B9">
<label>9</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[van der Weide]]></surname>
<given-names><![CDATA[D. W.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>1997</year>
<volume>70</volume>
<page-range>677</page-range></nlm-citation>
</ref>
<ref id="B10">
<label>10</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tabib-Azar]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Su]]></surname>
<given-names><![CDATA[D. -P.]]></given-names>
</name>
<name>
<surname><![CDATA[Pohar]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[LeClair]]></surname>
<given-names><![CDATA[S. R.]]></given-names>
</name>
<name>
<surname><![CDATA[Ponchak]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>1999</year>
<volume>70</volume>
<page-range>1725</page-range></nlm-citation>
</ref>
<ref id="B11">
<label>11</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Rosner]]></surname>
<given-names><![CDATA[B. T.]]></given-names>
</name>
<name>
<surname><![CDATA[van der Weide]]></surname>
<given-names><![CDATA[D. W.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>2002</year>
<volume>73</volume>
<page-range>2505</page-range></nlm-citation>
</ref>
<ref id="B12">
<label>12</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Vlahacos]]></surname>
<given-names><![CDATA[C. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Black]]></surname>
<given-names><![CDATA[R. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Amar]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Wellstood]]></surname>
<given-names><![CDATA[F. C.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>1996</year>
<volume>69</volume>
<page-range>3272</page-range></nlm-citation>
</ref>
<ref id="B13">
<label>13</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Abu-Teir]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Golosovsky]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Davidov]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>2001</year>
<volume>72</volume>
<page-range>2073</page-range></nlm-citation>
</ref>
<ref id="B14">
<label>14</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[K.]]></given-names>
</name>
<name>
<surname><![CDATA[Friedman]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
<name>
<surname><![CDATA[Cha]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>2003</year>
<volume>83</volume>
<page-range>1032</page-range></nlm-citation>
</ref>
<ref id="B15">
<label>15</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[S. Kim]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[K.]]></given-names>
</name>
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Cha]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
<name>
<surname><![CDATA[Friedman]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
</person-group>
<source><![CDATA[Meas. Sci. Technol.]]></source>
<year>2003</year>
<volume>14</volume>
<page-range>7</page-range></nlm-citation>
</ref>
<ref id="B16">
<label>16</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Vlahacos]]></surname>
<given-names><![CDATA[C. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Steinhauer]]></surname>
<given-names><![CDATA[D. E.]]></given-names>
</name>
<name>
<surname><![CDATA[Dutta]]></surname>
<given-names><![CDATA[S. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Feenstra]]></surname>
<given-names><![CDATA[B. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Wellstood]]></surname>
<given-names><![CDATA[F. C.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>1998</year>
<volume>72</volume>
<page-range>1778</page-range></nlm-citation>
</ref>
<ref id="B17">
<label>17</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Steinhauer]]></surname>
<given-names><![CDATA[D. E.]]></given-names>
</name>
<name>
<surname><![CDATA[Vlahacos]]></surname>
<given-names><![CDATA[C. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Dutta]]></surname>
<given-names><![CDATA[S. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Feenstra]]></surname>
<given-names><![CDATA[B. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Wellstood]]></surname>
<given-names><![CDATA[F. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>1998</year>
<volume>72</volume>
<page-range>861</page-range></nlm-citation>
</ref>
<ref id="B18">
<label>18</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[K.]]></given-names>
</name>
<name>
<surname><![CDATA[Melikyan]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Babajanyan]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Sargsyan]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Friedman]]></surname>
<given-names><![CDATA[Barry]]></given-names>
</name>
</person-group>
<source><![CDATA[Ultra-microscopy]]></source>
<year>2009</year>
<volume>109</volume>
<page-range>889</page-range></nlm-citation>
</ref>
<ref id="B19">
<label>19</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Lee]]></surname>
<given-names><![CDATA[S-C.]]></given-names>
</name>
<name>
<surname><![CDATA[Vlahacos]]></surname>
<given-names><![CDATA[C. P.]]></given-names>
</name>
<name>
<surname><![CDATA[Feenstra]]></surname>
<given-names><![CDATA[B. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Schwartz]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Steinhauer]]></surname>
<given-names><![CDATA[D. E.]]></given-names>
</name>
<name>
<surname><![CDATA[Wellstood]]></surname>
<given-names><![CDATA[F. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phys. Lett.]]></source>
<year>2000</year>
<volume>77</volume>
<page-range>4404</page-range></nlm-citation>
</ref>
<ref id="B20">
<label>20</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Tselev]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Ma]]></surname>
<given-names><![CDATA[Z.]]></given-names>
</name>
<name>
<surname><![CDATA[Melngailis]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Rev. Sci. Instrum.]]></source>
<year>2007</year>
<volume>78</volume>
<page-range>044701-1</page-range></nlm-citation>
</ref>
<ref id="B21">
<label>21</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Petersan]]></surname>
<given-names><![CDATA[P. J.]]></given-names>
</name>
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Appl. Phys.]]></source>
<year>1998</year>
<volume>84</volume>
<page-range>3392</page-range></nlm-citation>
</ref>
<ref id="B22">
<label>22</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Qureshi]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
<name>
<surname><![CDATA[Kolokoltsev]]></surname>
<given-names><![CDATA[O. V.]]></given-names>
</name>
<name>
<surname><![CDATA[Ortega-Martinez]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Ordoñez-Romero]]></surname>
<given-names><![CDATA[C. L.]]></given-names>
</name>
<name>
<surname><![CDATA[Saniger]]></surname>
<given-names><![CDATA[J. M.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Nanosci. Nanotechnol]]></source>
<year>2008</year>
<volume>8</volume>
<page-range>6466</page-range></nlm-citation>
</ref>
<ref id="B23">
<label>23</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Anlage]]></surname>
<given-names><![CDATA[S. M.]]></given-names>
</name>
<name>
<surname><![CDATA[Talanov]]></surname>
<given-names><![CDATA[V. V.]]></given-names>
</name>
<name>
<surname><![CDATA[Schwartz]]></surname>
<given-names><![CDATA[A. R.]]></given-names>
</name>
</person-group>
<source><![CDATA[Principles of Near-Field Microwave Microscopy, in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale]]></source>
<year>2007</year>
<volume>1</volume>
<page-range>215253</page-range><publisher-loc><![CDATA[New York ]]></publisher-loc>
<publisher-name><![CDATA[Springer-Verlag]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B24">
<label>24</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Pozar]]></surname>
<given-names><![CDATA[D. M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Microwave Engineering]]></source>
<year>2005</year>
<edition>3</edition>
<page-range>687</page-range><publisher-name><![CDATA[John Wiley & Sons]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B25">
<label>25</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Mehdizadeh]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Microwave/RF Applicators and Probes]]></source>
<year>2010</year>
<page-range>24 56</page-range><publisher-name><![CDATA[Elsevier]]></publisher-name>
</nlm-citation>
</ref>
</ref-list>
</back>
</article>
