<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2011000600008</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Martínez]]></surname>
<given-names><![CDATA[A]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Rayas]]></surname>
<given-names><![CDATA[J.A.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Cordero]]></surname>
<given-names><![CDATA[R]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Labbe]]></surname>
<given-names><![CDATA[F]]></given-names>
</name>
<xref ref-type="aff" rid="A03"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Centro de Investigaciones en Óptica  ]]></institution>
<addr-line><![CDATA[León Guanajuato]]></addr-line>
<country>México</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad de Santiago de Chile  ]]></institution>
<addr-line><![CDATA[Santiago ]]></addr-line>
<country>Chile</country>
</aff>
<aff id="A03">
<institution><![CDATA[,Universidad Técnica Federico Santa María  ]]></institution>
<addr-line><![CDATA[Valparaíso ]]></addr-line>
<country>Chile</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>12</month>
<year>2011</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>12</month>
<year>2011</year>
</pub-date>
<volume>57</volume>
<numero>6</numero>
<fpage>518</fpage>
<lpage>523</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2011000600008&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2011000600008&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2011000600008&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in-plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Electronic speckle pattern interferometry]]></kwd>
<kwd lng="en"><![CDATA[shearography]]></kwd>
<kwd lng="en"><![CDATA[strain]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[ <p align="justify"><font face="verdana" size="4">Investigaci&oacute;n</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="center"><font face="verdana" size="4"><b>Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry</b></font></p>     <p align="center"><font face="verdana" size="2">&nbsp;</font></p>     <p align="center"><font face="verdana" size="2"><b>A. Mart&iacute;nez<b><sup>a</sup></b>, J.A. Rayas<sup>a</sup>, R. Cordero<sup>b</sup>, and F. Labbe<sup>c</sup></b></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><i><sup>a</sup> Centro de Investigaciones en &Oacute;ptica, Loma del Bosque 115, Col. Lomas del Campestre, Le&oacute;n, Guanajuato M&eacute;xico, Tel. (477) 4414200; Fax (477) 4414209 e&#150;mail: </i><a href="mailto:amalia@cio.mx">amalia@cio.mx</a><i>; </i><a href="mailto:jrayas@cio.mx">jrayas@cio.mx</a></font></p>     <p align="justify"><font face="verdana" size="2"><i><sup>b</sup> Universidad de Santiago de Chile, Ave. Bernardo O'higgins 3363, Santiago, Chile, e&#150;mail: </i><a href="mailto:raul.cordero@usach.cl">raul.cordero@usach.cl</a></font></p>     <p align="justify"><font face="verdana" size="2"><i><sup>c</sup> Universidad T&eacute;cnica Federico Santa Mar&iacute;a, Ave. Espa&ntilde;a 1680, Valpara&iacute;so, Chile e&#150;mail: </i><a href="mailto:fernando.labbe@usm.cl">fernando.labbe@usm.cl</a></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">Recibido el 15 de junio de 2011    <br> Aceptado el 19 de octubre de 2011</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>     <p align="justify"><font face="verdana" size="2">In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in&#150;plane strains induced on a composite sample. First, in&#150;plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in&#150;plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated.</font></p>     <p align="justify"><font face="verdana" size="2"><b>Keywords: </b>Electronic speckle pattern interferometry; shearography; strain.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2">PACS: 06.20.&#150;f; 07.60.Ly; 06.60 Mr; 06.90.+v</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v57n6/v57n6a8.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>     ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Acknowledgements</b></font></p>     <p align="justify"><font face="verdana" size="2">Authors wish to thank economical support from Consejo Nacional de Ciencia y Tecnolog&iacute;a (CONACYT_Mexico). The experimental results are part of the bilateral project between Mexico&#150;Chile: Analysis of deformation mechanisms to fruit cuticle using laser interferometry techniques. CONACYT&#150;CONICYT project. The support of CONICYT (FONDECYT Preis 1090471, ANILLO Preis ACT98 and ANILLO Preis ACT95), UTFSM (DGIP Preis 250915) and USACH (DICYT, academic exchange program) is gratefully acknowledged.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">1. W. Steinchen, L. Yang, <i>Digital shearography </i>(Bellingham, Washington USA: SPIE Press, 2003).    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373078&pid=S0035-001X201100060000800001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">2. T. Kreis, <i>Holographic interferometry </i>(Bremen, Germany: Akademie Verlag 1996) 261&#150;263 and 123&#150;132.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373080&pid=S0035-001X201100060000800002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">3. F. Labbe, R. Cordero, A. Mart&iacute;nez, and R. Rodr&iacute;guez&#150;Vera, <i>Measurement Science Technology </i><b>16 </b>(2005) 1677&#150;1683.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373082&pid=S0035-001X201100060000800003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">4. R.A. Mart&iacute;nez&#150;Celorio, G.H. Kaufmann, and G. Mendiola, <i>Optical Engineering </i><b>39 </b>(2000) 751&#150;757.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373084&pid=S0035-001X201100060000800004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">5. P.D. Ruiz, A. D&aacute;vila, G. Mendiola, G. Kaufmann, <i>Optical Engineering </i><b>40 </b>(2001) 318&#150;324.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373086&pid=S0035-001X201100060000800005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">6. B. Bhaduri, N. Krishna Mohan, M.P. Kothiyal, and R.S. Sirohi, <i>Optics Express </i><b>14 </b>(2006) 11598&#150;11607.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373088&pid=S0035-001X201100060000800006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">7. D. Francis, R.P. Tatam and R.M. Groves, <i>Measurement Science and Technology </i><b>21 </b>(2010) 102001.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373090&pid=S0035-001X201100060000800007&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">8. P.A. Fomitchov and S. Krishnaswamy, <i>Measurement Science and Technology </i><b>8 </b>(1997) 581&#150;583.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373092&pid=S0035-001X201100060000800008&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">9. A. Mart&iacute;nez, R. Rodr&iacute;guez&#150;Vera, J.A. Rayas, and H.J. Puga, <i>Optics Communications </i><b>223 </b>(2003) 239&#150;246.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373094&pid=S0035-001X201100060000800009&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">10. P.K. Rastogi, <i>Journal of Modern Optics </i><b>43 </b>(1996) 1577&#150;1581.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373096&pid=S0035-001X201100060000800010&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">11. D. Malacara,M. Serv&iacute;n, and Z. Malacara,<i> Interferogram Analysis for Optical Testing </i>(Boca Raton, FL.: Taylor &amp; Francis, Second Edition, 2005) pp. 493&#150;500.    &nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8373098&pid=S0035-001X201100060000800011&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --></font></p>      ]]></body><back>
<ref-list>
<ref id="B1">
<label>1</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Steinchen]]></surname>
<given-names><![CDATA[W]]></given-names>
</name>
<name>
<surname><![CDATA[Yang]]></surname>
<given-names><![CDATA[L]]></given-names>
</name>
</person-group>
<source><![CDATA[Digital shearography]]></source>
<year>2003</year>
<publisher-loc><![CDATA[BellinghamWashington ]]></publisher-loc>
<publisher-name><![CDATA[SPIE Press]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B2">
<label>2</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kreis]]></surname>
<given-names><![CDATA[T]]></given-names>
</name>
</person-group>
<source><![CDATA[Holographic interferometry]]></source>
<year>1996</year>
<page-range>261-263 and 123-132</page-range><publisher-loc><![CDATA[BremenGermany ]]></publisher-loc>
<publisher-name><![CDATA[Akademie Verlag]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B3">
<label>3</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Labbe]]></surname>
<given-names><![CDATA[F]]></given-names>
</name>
<name>
<surname><![CDATA[Cordero]]></surname>
<given-names><![CDATA[R]]></given-names>
</name>
<name>
<surname><![CDATA[Martínez]]></surname>
<given-names><![CDATA[A]]></given-names>
</name>
<name>
<surname><![CDATA[Rodríguez-Vera]]></surname>
<given-names><![CDATA[R]]></given-names>
</name>
</person-group>
<source><![CDATA[Measurement Science Technology]]></source>
<year>2005</year>
<volume>16</volume>
<page-range>1677-1683</page-range></nlm-citation>
</ref>
<ref id="B4">
<label>4</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Martínez-Celorio]]></surname>
<given-names><![CDATA[R.A.]]></given-names>
</name>
<name>
<surname><![CDATA[Kaufmann]]></surname>
<given-names><![CDATA[G.H.]]></given-names>
</name>
<name>
<surname><![CDATA[Mendiola]]></surname>
<given-names><![CDATA[G]]></given-names>
</name>
</person-group>
<source><![CDATA[Optical Engineering]]></source>
<year>2000</year>
<volume>39</volume>
<page-range>751-757</page-range></nlm-citation>
</ref>
<ref id="B5">
<label>5</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ruiz]]></surname>
<given-names><![CDATA[P.D.]]></given-names>
</name>
<name>
<surname><![CDATA[Dávila]]></surname>
<given-names><![CDATA[A]]></given-names>
</name>
<name>
<surname><![CDATA[Mendiola]]></surname>
<given-names><![CDATA[G]]></given-names>
</name>
<name>
<surname><![CDATA[Kaufmann]]></surname>
<given-names><![CDATA[G]]></given-names>
</name>
</person-group>
<source><![CDATA[Optical Engineering]]></source>
<year>2001</year>
<volume>40</volume>
<page-range>318-324</page-range></nlm-citation>
</ref>
<ref id="B6">
<label>6</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Bhaduri]]></surname>
<given-names><![CDATA[B]]></given-names>
</name>
<name>
<surname><![CDATA[Krishna Mohan]]></surname>
<given-names><![CDATA[N]]></given-names>
</name>
<name>
<surname><![CDATA[Kothiyal]]></surname>
<given-names><![CDATA[M.P.]]></given-names>
</name>
<name>
<surname><![CDATA[Sirohi]]></surname>
<given-names><![CDATA[R.S.]]></given-names>
</name>
</person-group>
<source><![CDATA[Optics Express]]></source>
<year>2006</year>
<volume>14</volume>
<page-range>11598-11607</page-range></nlm-citation>
</ref>
<ref id="B7">
<label>7</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Francis]]></surname>
<given-names><![CDATA[D]]></given-names>
</name>
<name>
<surname><![CDATA[Tatam]]></surname>
<given-names><![CDATA[R.P.]]></given-names>
</name>
<name>
<surname><![CDATA[Groves]]></surname>
<given-names><![CDATA[R.M.]]></given-names>
</name>
</person-group>
<source><![CDATA[Measurement Science and Technology]]></source>
<year>2010</year>
<volume>21</volume>
<page-range>102001</page-range></nlm-citation>
</ref>
<ref id="B8">
<label>8</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Fomitchov]]></surname>
<given-names><![CDATA[P.A.]]></given-names>
</name>
<name>
<surname><![CDATA[Krishnaswamy]]></surname>
<given-names><![CDATA[S]]></given-names>
</name>
</person-group>
<source><![CDATA[Measurement Science and Technology]]></source>
<year>1997</year>
<volume>8</volume>
<page-range>581-583</page-range></nlm-citation>
</ref>
<ref id="B9">
<label>9</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Martínez]]></surname>
<given-names><![CDATA[A]]></given-names>
</name>
<name>
<surname><![CDATA[Rodríguez-Vera]]></surname>
<given-names><![CDATA[R]]></given-names>
</name>
<name>
<surname><![CDATA[Rayas]]></surname>
<given-names><![CDATA[J.A.]]></given-names>
</name>
<name>
<surname><![CDATA[Puga]]></surname>
<given-names><![CDATA[H.J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Optics Communications]]></source>
<year>2003</year>
<volume>223</volume>
<page-range>239-246</page-range></nlm-citation>
</ref>
<ref id="B10">
<label>10</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Rastogi]]></surname>
<given-names><![CDATA[P.K.]]></given-names>
</name>
</person-group>
<source><![CDATA[Journal of Modern Optics]]></source>
<year>1996</year>
<volume>43</volume>
<page-range>1577-1581</page-range></nlm-citation>
</ref>
<ref id="B11">
<label>11</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Malacara]]></surname>
<given-names><![CDATA[D]]></given-names>
</name>
<name>
<surname><![CDATA[Servín]]></surname>
<given-names><![CDATA[M]]></given-names>
</name>
<name>
<surname><![CDATA[Malacara]]></surname>
<given-names><![CDATA[Z]]></given-names>
</name>
</person-group>
<source><![CDATA[Interferogram Analysis for Optical Testing]]></source>
<year>2005</year>
<edition>Second</edition>
<page-range>493-500</page-range><publisher-loc><![CDATA[Boca Raton^eFL FL]]></publisher-loc>
<publisher-name><![CDATA[Taylor & Francis]]></publisher-name>
</nlm-citation>
</ref>
</ref-list>
</back>
</article>
