<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2007000900013</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Applications of the atomic force microscopy to nuclear track methodology]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Vázquez-López]]></surname>
<given-names><![CDATA[C]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Fragoso]]></surname>
<given-names><![CDATA[R]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Golzarri]]></surname>
<given-names><![CDATA[J.I]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Espinosa]]></surname>
<given-names><![CDATA[G]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Centro de Investigación y de Estudios Avanzados Departamento de Física ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad Nacional Autónoma de México Instituto de Física ]]></institution>
<addr-line><![CDATA[México D.F.]]></addr-line>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>02</month>
<year>2007</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>02</month>
<year>2007</year>
</pub-date>
<volume>53</volume>
<fpage>52</fpage>
<lpage>56</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2007000900013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2007000900013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2007000900013&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of this technology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological features are very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles, and hillocks and/or craters on some minerals exposed to 252Cf fission fragments. Some examples of artifacts in the convolution of sample topography and probe geometry are also mentioned.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Se revisa el esquema fundamental de la instrumentación de la microscopía de fuerza átomica, con el propósito de entender el gran valor de esta tecnología en el estudio de las trazas nucleares en sólidos. Diferentes morfologías aparecen en las muestras, en las que se determinan detalles metrológicos muy importantes en la caracterización y estudio de las trazas. Entre ellas están los orificios cónicos en CR-39 revelados químicamente después de la exposición a partículas alfa, y las montañas y/o cráteres sobre algunos minerales expuestos a fragmentos de fisión del 252Cf. Algunos ejemplos de artefactos que aparecen en la convolución de la topografía de las muestras con la geometría de las puntas de prueba son también mencionados.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Atomic force microscopy]]></kwd>
<kwd lng="en"><![CDATA[nuclear track detectors]]></kwd>
<kwd lng="en"><![CDATA[plastic detectors]]></kwd>
<kwd lng="es"><![CDATA[Microscopio de fuerza atómica]]></kwd>
<kwd lng="es"><![CDATA[metodología de trazas nucleares]]></kwd>
<kwd lng="es"><![CDATA[detectores plásticos]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[ <p align="center"><font face="verdana" size="4"><b>Applications of the atomic force microscopy to nuclear track methodology</b></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="center"><font face="verdana" size="2"><b>C. V&aacute;zquez-L&oacute;pez&ordf;, R. Fragoso&ordf;, J.I. Golzarri<sup>b</sup>, G. Espinosa<sup>b</sup></b></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><i>&ordf; Departamento de F&iacute;sica. Centro de Investigaci&oacute;n y de Estudios Avanzados. Apartado Postal 14-740, 07000, M&eacute;xico, D.F. e-mail: <a href="mailto:cvlopez@fis.cinvestav.mx">cvlopez@fis.cinvestav.mx</a></i></font></p>     <p align="justify"><font face="verdana" size="2"><i><sup>b</sup> Instituto de F&iacute;sica, Universidad Nacional Aut&oacute;noma de M&eacute;xico. Apartado postal 20-364, 01000 M&eacute;xico, D.F.</i><i> e-mail: <a href="mailto:espinosa@fisica.unam.mx">espinosa@fisica.unam.mx</a></i></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2">Recibido el 2 de marzo de 2006    <br> Aceptado el 18 de agosto de 2006</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>     <p align="justify"><font face="verdana" size="2">The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of this technology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological features are very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles, and hillocks and/or craters on some minerals exposed to <sup>252</sup>Cf fission fragments. Some examples of artifacts in the convolution of sample topography and probe geometry are also mentioned.</font></p>     <p align="justify"><font face="verdana" size="2"><b>Keywords: </b>Atomic force microscopy; nuclear track detectors; plastic detectors.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>     <p align="justify"><font face="verdana" size="2">Se revisa el esquema fundamental de la instrumentaci&oacute;n de la microscop&iacute;a de fuerza &aacute;tomica, con el prop&oacute;sito de entender el gran valor de esta tecnolog&iacute;a en el estudio de las trazas nucleares en s&oacute;lidos. Diferentes morfolog&iacute;as aparecen en las muestras, en las que se determinan detalles metrol&oacute;gicos muy importantes en la caracterizaci&oacute;n y estudio de las trazas. Entre ellas est&aacute;n los orificios c&oacute;nicos en CR-39 revelados qu&iacute;micamente despu&eacute;s de la exposici&oacute;n a part&iacute;culas alfa, y las monta&ntilde;as y/o cr&aacute;teres sobre algunos minerales expuestos a fragmentos de fisi&oacute;n del <sup>252</sup>Cf. Algunos ejemplos de artefactos que aparecen en la convoluci&oacute;n de la topograf&iacute;a de las muestras con la geometr&iacute;a de las puntas de prueba son tambi&eacute;n mencionados.</font></p>     <p align="justify"><font face="verdana" size="2"><b>Descriptores: </b>Microscopio de fuerza at&oacute;mica; metodolog&iacute;a de trazas nucleares; detectores pl&aacute;sticos. </font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2">PACS: 07.79.Lh, 07.57.Kp, 29.40. -n, 85.25.Pb</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v53s3/v53s3a13.pdf">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a> </font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Acknowledgements</b></font></p>     <p align="justify"><font face="verdana" size="2">The authors thank the technical assistance of Blanca Zendejas and Ana Bertha Soto.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>References</b></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">1. G. Binig, C.F. Quate, and C. Gerber, <i>Phys. Rev. Lett. </i><b>56</b> (1986) 930</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8338745&pid=S0035-001X200700090001300001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">2. Digital Instruments Tutorial.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8338746&pid=S0035-001X200700090001300002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">3. G. Espinosa, I. Jacobson, J.I. Golzarri, C. V&aacute;zquez, R. Fragoso, and E. Santos, <i>Radiation Protection Dosimetry, </i>&nbsp;<b>101</b> (2002) 89.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8338747&pid=S0035-001X200700090001300003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">4. C. V&aacute;zquez-L&oacute;pez, R. Fragoso, J.I. Golzarri, F. Castillo-Mej&iacute;a, M. Fujii, and G. Espinosa, <i>Radiation Measurements, </i><b>34</b> (2001) 89.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8338748&pid=S0035-001X200700090001300004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">5. H.S. Nagaraje, F. Ohnesorge, D.K. Avasthi, , R. Neuman, P.  Mohan-Rao, <i>Appl Phys. A, </i><b>71</b> (2000) 337. </font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8338749&pid=S0035-001X200700090001300005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --> ]]></body><back>
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