<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0035-001X</journal-id>
<journal-title><![CDATA[Revista mexicana de física]]></journal-title>
<abbrev-journal-title><![CDATA[Rev. mex. fis.]]></abbrev-journal-title>
<issn>0035-001X</issn>
<publisher>
<publisher-name><![CDATA[Sociedad Mexicana de Física]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0035-001X2006000400007</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Multi-wavelength images detector for micro-cathodoluminescence analysis]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Pérez-Tijerina]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
<xref ref-type="aff" rid="A01"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Gradilla]]></surname>
<given-names><![CDATA[I.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Garcia]]></surname>
<given-names><![CDATA[V.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Machorro]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Avalos-Borja]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Contreras]]></surname>
<given-names><![CDATA[O.]]></given-names>
</name>
<xref ref-type="aff" rid="A02"/>
</contrib>
</contrib-group>
<aff id="A01">
<institution><![CDATA[,Universidad Autónoma de Nuevo Léon Facultad de Ciencias Físico-Matemáticas Laboratorio de Nanociencias y Nanotecnología]]></institution>
<addr-line><![CDATA[N.L. San Nicolás de los Garza]]></addr-line>
<country>México</country>
</aff>
<aff id="A02">
<institution><![CDATA[,Universidad Nacional Autónoma de México Centro de Ciencias de la Materia Condensada ]]></institution>
<addr-line><![CDATA[B.C. Ensenada]]></addr-line>
<country>México</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>08</month>
<year>2006</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>08</month>
<year>2006</year>
</pub-date>
<volume>52</volume>
<numero>4</numero>
<fpage>342</fpage>
<lpage>345</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S0035-001X2006000400007&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S0035-001X2006000400007&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S0035-001X2006000400007&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[A novel instrument capable of collecting the entire cathodoluminescence emission spectrum simultaneously with SEM scanning is presented in this work. The cathodoluminescence produced in a standard scanning electron microscope is collected and analyzed. The electronic signal used by the microscope to trigger the electron raster and produce an image is also used by the spectrograph to synchronize spectrum acquisition. At each point in the sample the complete spectrum is acquired. All the data are recorded and saved in an electronic file. With this information it is possible to reconstruct panchromatic and/or monochromatic images of the sample and correlate its optical properties with its microstructure. Instead of an elliptical mirror to collect the light in the conventional CL system, a single optical fiber is used. This new way of acquiring light permits a reduction in the work distance (down to 5 mm) in the microscope, thus achieving a better spatial resolution. Another advantage of this arrangement is that we can simultaneously use other detection modes such as backscattered electrons, x-rays etc. Examples showed here illustrate the capabilities of the instrument.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[En este trabajo presentamos un novedoso instrumento capaz de colectar el espectro de emisión completo de cátodoluminiscencia, simultáneamente con imágenes de SEM. Se colecta y analiza la cátodoluminiscencia producida en un microscopio electrónico de barrido. La electrónica utilizada por el microscopio para barrer el haz de electrones y producir la imagen es utilizada por el espectrógrafo para sincronizar la adquisicion de espectros. En cada punto de la muestra se adquiere el espectro completo. Todos los datos son grabados y guardados en un archivo electrónico. Con esta información es posible reconstruir imágenes pancromáticas y/o monocromáticas de la muestra y correlacionar sus propiedades ópticas con la microestructura. En lugar de un espejo elíptico para colectar la luz, como en el sistema convencional de CL, se utiliza una sola fibra óptica. Esta nueva manera de adquirir la luz permite una reducción en la distancia de trabajo (menor a 5 mm) en el microscopio, logrando así una mejor resolucion espacial. Otra ventaja de este arreglo es que nosotros podemos usar otros modos de detección simultáneamente como los electrones retrodispersados, rayos X, etc. Se muestran algunos ejemplos para ilustrar las capacidades del instrumento.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Cathodoluminiscence]]></kwd>
<kwd lng="en"><![CDATA[spectroscopy]]></kwd>
<kwd lng="es"><![CDATA[Catodoluminiscencia]]></kwd>
<kwd lng="es"><![CDATA[espectroscopia]]></kwd>
</kwd-group>
</article-meta>
</front><body><![CDATA[ <p align="justify"><font face="verdana" size="4">Investigaci&oacute;n</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="center"><font face="verdana" size="4"><b>Multi&#150;wavelength images detector for micro&#150;cathodoluminescence analysis</b></font></p>     <p align="center"><font face="verdana" size="2">&nbsp;</font></p>     <p align="center"><font face="verdana" size="2"><b>E. P&eacute;rez&#150;Tijerina*, I. Gradilla**, V. Garcia**, R. Machorro**, M. Avalos&#150;Borja**, and O. Contreras**</b></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><i>* Laboratorio de Nanociencias y Nanotecnolog&iacute;a, Facultad de Ciencias F&iacute;sico&#150;Matem&aacute;ticas de la UANL, Manuel L. Barrag&aacute;n S/N, Edif. de Posgrado, Ciudad Universitaria, San Nicol&aacute;s de los Garza, N.L., 66450, M&eacute;xico.</i></font></p>     <p align="justify"><font face="verdana" size="2"><i>** Centro de Ciencias de la Materia Condensada, UNAM, Apartado Postal 2681 Ensenada, 22860 B.C., M&eacute;xico.</i></font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2">Recibido el 23 de marzo de 2006    ]]></body>
<body><![CDATA[<br> Aceptado el 8 de junio de 2006</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Abstract</b></font></p>     <p align="justify"><font face="verdana" size="2">A novel instrument capable of collecting the entire cathodoluminescence emission spectrum simultaneously with SEM scanning is presented in this work. The cathodoluminescence produced in a standard scanning electron microscope is collected and analyzed. The electronic signal used by the microscope to trigger the electron raster and produce an image is also used by the spectrograph to synchronize spectrum acquisition. At each point in the sample the complete spectrum is acquired. All the data are recorded and saved in an electronic file. With this information it is possible to reconstruct panchromatic and/or monochromatic images of the sample and correlate its optical properties with its microstructure. Instead of an elliptical mirror to collect the light in the conventional CL system, a single optical fiber is used. This new way of acquiring light permits a reduction in the work distance (down to 5 mm) in the microscope, thus achieving a better spatial resolution. Another advantage of this arrangement is that we can simultaneously use other detection modes such as backscattered electrons, x&#150;rays etc. Examples showed here illustrate the capabilities of the instrument.</font></p>     <p align="justify"><font face="verdana" size="2"><b>Keywords: </b>Cathodoluminiscence; spectroscopy.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><b>Resumen</b></font></p>     <p align="justify"><font face="verdana" size="2">En este trabajo presentamos un novedoso instrumento capaz de colectar el espectro de emisi&oacute;n completo de c&aacute;todoluminiscencia, simult&aacute;neamente con im&aacute;genes de SEM. Se colecta y analiza la c&aacute;todoluminiscencia producida en un microscopio electr&oacute;nico de barrido. La electr&oacute;nica utilizada por el microscopio para barrer el haz de electrones y producir la imagen es utilizada por el espectr&oacute;grafo para sincronizar la adquisicion de espectros. En cada punto de la muestra se adquiere el espectro completo. Todos los datos son grabados y guardados en un archivo electr&oacute;nico. Con esta informaci&oacute;n es posible reconstruir im&aacute;genes pancrom&aacute;ticas y/o monocrom&aacute;ticas de la muestra y correlacionar sus propiedades &oacute;pticas con la microestructura. En lugar de un espejo el&iacute;ptico para colectar la luz, como en el sistema convencional de CL, se utiliza una sola fibra &oacute;ptica. Esta nueva manera de adquirir la luz permite una reducci&oacute;n en la distancia de trabajo (menor a 5 mm) en el microscopio, logrando as&iacute; una mejor resolucion espacial. Otra ventaja de este arreglo es que nosotros podemos usar otros modos de detecci&oacute;n simult&aacute;neamente como los electrones retrodispersados, rayos X, etc. Se muestran algunos ejemplos para ilustrar las capacidades del instrumento.</font></p>     <p align="justify"><font face="verdana" size="2"><b>Descriptores: </b>Catodoluminiscencia; espectroscopia.</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     ]]></body>
<body><![CDATA[<p align="justify"><font face="verdana" size="2">PACS: 78.60.Hf; 07.60.Rd</font></p>     <p align="justify"><font face="verdana" size="2">&nbsp;</font></p>     <p align="justify"><font face="verdana" size="2"><a href="/pdf/rmf/v52n4/v52n4a7.pdf" target="_blank">DESCARGAR ART&Iacute;CULO EN FORMATO PDF</a></font></p>     <p align="justify">&nbsp;</p>     <p align="justify"><font size="2" face="verdana"><b>Acknowledgments</b></font></p>     <p align="justify"><font face="verdana" size="2">The authors' thanks to M. Farfan, G. Vilchis, A. Tiznado, Enrique and J. Peralta for their technical assistance. This work was done in part with support from Conacyt&#150;Mexico, under contract 400380&#150;5&#150;G36531&#150;E. We also wish to thank to Durel Corporation for providing the ZnS powder.</font></p>     <p align="justify">&nbsp;</p>     <p align="justify"><font size="2" face="verdana"><b>References</b></font></p>     <!-- ref --><p align="justify"><font face="verdana" size="2">1. D.B. Holt, (1981) in <i>Microscopy of semiconducting materials</i> (IOP, Bristol) p. 165.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319867&pid=S0035-001X200600040000700001&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">2. A.D. Trigg, (1985) in <i>Scanning electron microscopy 1985/III, </i>ed. O. Johari, SEM Inc., Chicago, p. 1011.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319868&pid=S0035-001X200600040000700002&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">3. J.B. Steyn, P. Giles, and D.B. Holt, <i>J. Microscopy </i><b>107 </b>(1976) 107.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319869&pid=S0035-001X200600040000700003&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">4. G. Koschekand E. Kubaleck<i>, Scanning </i><b>7</b><i> (1985) </i>199.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319870&pid=S0035-001X200600040000700004&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">5. E.M. Horl and E. Mugschl, (1972) In <i>Proc. 5th Eur. Cong. Electr. Microsc. </i>(EMCON 72), IOP, London, p. 502.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319871&pid=S0035-001X200600040000700005&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">6. L. Carlsson and C.G. van Essen, <i>J. Phys. E. </i><b>7</b> (174) 98.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319872&pid=S0035-001X200600040000700006&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">7. O. Contreras<i> et al., Appl. Phy. Lett </i><b>81</b> (2002) 1993.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319873&pid=S0035-001X200600040000700007&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">8. S. O. Kucheyev <i>et al.,J. Appl. Phy. </i><b>91</b> (2002) 5867</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319874&pid=S0035-001X200600040000700008&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">9. E.F. Bond, G.H. Haggis, and D. Beresford, <i>J. Microscopy </i><b>100 </b>(1974) 271.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319875&pid=S0035-001X200600040000700009&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">10. S.M. Davidson and A. Rasul, <i>J. Phys. E: Sci. Instrum. </i><b>9</b> 1976 1.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319876&pid=S0035-001X200600040000700010&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --><!-- ref --><p align="justify"><font face="verdana" size="2">11. S. Myhajlenko, J.L. Batstone, H.J. Hutchison, and J.W. Steeds, <i>J. Phys. C Solid state phys. </i><b>17 </b>(1984) 6477.</font>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;[&#160;<a href="javascript:void(0);" onclick="javascript: window.open('/scielo.php?script=sci_nlinks&ref=8319877&pid=S0035-001X200600040000700011&lng=','','width=640,height=500,resizable=yes,scrollbars=1,menubar=yes,');">Links</a>&#160;]<!-- end-ref --> ]]></body><back>
<ref-list>
<ref id="B1">
<nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Holt]]></surname>
<given-names><![CDATA[D.B.]]></given-names>
</name>
</person-group>
<source><![CDATA[Microscopy of semiconducting materials]]></source>
<year>1981</year>
<page-range>165</page-range><publisher-loc><![CDATA[Bristol ]]></publisher-loc>
<publisher-name><![CDATA[IOP]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B2">
<nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Trigg]]></surname>
<given-names><![CDATA[A.D.]]></given-names>
</name>
</person-group>
<person-group person-group-type="editor">
<name>
<surname><![CDATA[Johari]]></surname>
<given-names><![CDATA[O.]]></given-names>
</name>
</person-group>
<source><![CDATA[Scanning electron microscopy 1985/III]]></source>
<year>1985</year>
<page-range>1011</page-range><publisher-loc><![CDATA[Chicago ]]></publisher-loc>
<publisher-name><![CDATA[SEM Inc]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B3">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Steyn]]></surname>
<given-names><![CDATA[J.B.]]></given-names>
</name>
<name>
<surname><![CDATA[Giles]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[Holt]]></surname>
<given-names><![CDATA[D.B.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Microscopy]]></source>
<year>1976</year>
<volume>107</volume>
<page-range>107</page-range></nlm-citation>
</ref>
<ref id="B4">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Koschekand]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
<name>
<surname><![CDATA[Kubaleck]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
</person-group>
<source><![CDATA[Scanning]]></source>
<year>1985</year>
<volume>7</volume>
<page-range>199</page-range></nlm-citation>
</ref>
<ref id="B5">
<nlm-citation citation-type="confpro">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Horl]]></surname>
<given-names><![CDATA[E.M.]]></given-names>
</name>
<name>
<surname><![CDATA[Mugschl]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
</person-group>
<source><![CDATA[]]></source>
<year>1972</year>
<conf-name><![CDATA[ Proc. 5th Eur. Cong. Electr. Microsc. (EMCON 72)]]></conf-name>
<conf-loc>London </conf-loc>
</nlm-citation>
</ref>
<ref id="B6">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Carlsson]]></surname>
<given-names><![CDATA[L.]]></given-names>
</name>
<name>
<surname><![CDATA[van Essen]]></surname>
<given-names><![CDATA[C.G.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Phys. E.]]></source>
<year></year>
<volume>7</volume>
<numero>174</numero>
<issue>174</issue>
<page-range>98</page-range></nlm-citation>
</ref>
<ref id="B7">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Contreras]]></surname>
<given-names><![CDATA[O.]]></given-names>
</name>
</person-group>
<source><![CDATA[Appl. Phy. Lett]]></source>
<year>2002</year>
<volume>81</volume>
<page-range>1993</page-range></nlm-citation>
</ref>
<ref id="B8">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Kucheyev]]></surname>
<given-names><![CDATA[S. O.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Appl. Phy.]]></source>
<year>2002</year>
<volume>91</volume>
<page-range>5867</page-range></nlm-citation>
</ref>
<ref id="B9">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Bond]]></surname>
<given-names><![CDATA[E.F.]]></given-names>
</name>
<name>
<surname><![CDATA[Haggis]]></surname>
<given-names><![CDATA[G.H.]]></given-names>
</name>
<name>
<surname><![CDATA[Beresford]]></surname>
<given-names><![CDATA[D.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Microscopy]]></source>
<year>1974</year>
<volume>100</volume>
<page-range>271</page-range></nlm-citation>
</ref>
<ref id="B10">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Davidson]]></surname>
<given-names><![CDATA[S.M.]]></given-names>
</name>
<name>
<surname><![CDATA[Rasul]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Phys. E: Sci. Instrum.]]></source>
<year>1976</year>
<volume>9</volume>
<page-range>1</page-range></nlm-citation>
</ref>
<ref id="B11">
<nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Myhajlenko]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Batstone]]></surname>
<given-names><![CDATA[J.L.]]></given-names>
</name>
<name>
<surname><![CDATA[Hutchison]]></surname>
<given-names><![CDATA[H.J.]]></given-names>
</name>
<name>
<surname><![CDATA[Steeds]]></surname>
<given-names><![CDATA[J.W.]]></given-names>
</name>
</person-group>
<source><![CDATA[J. Phys. C Solid state phys.]]></source>
<year>1984</year>
<volume>17</volume>
<page-range>6477</page-range></nlm-citation>
</ref>
</ref-list>
</back>
</article>
