<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>2448-5691</journal-id>
<journal-title><![CDATA[Mundo nano. Revista interdisciplinaria en nanociencias y nanotecnología]]></journal-title>
<abbrev-journal-title><![CDATA[Mundo nano]]></abbrev-journal-title>
<issn>2448-5691</issn>
<publisher>
<publisher-name><![CDATA[Universidad Nacional Autónoma de México, Instituto de Ciencias Aplicadas y Tecnología]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S2448-56912020000200045</article-id>
<article-id pub-id-type="doi">10.22201/ceiich.24485691e.2020.25.69636</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Resolución atómica de elementos ligeros utilizando HAADF y ABF-STEM con corrección de Cs y bajo voltaje]]></article-title>
<article-title xml:lang="en"><![CDATA[Atomic resolution imaging of light elements using low voltage Cs-corrected HAADF and ABF-STEM]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Esparza]]></surname>
<given-names><![CDATA[Rodrigo]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Nacional Autónoma de México Centro de Física Aplicada y Tecnología Avanzada ]]></institution>
<addr-line><![CDATA[Santiago de Querétaro Qro]]></addr-line>
<country>Mexico</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>09</month>
<year>2020</year>
</pub-date>
<volume>13</volume>
<numero>25</numero>
<fpage>45</fpage>
<lpage>60</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_arttext&amp;pid=S2448-56912020000200045&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_abstract&amp;pid=S2448-56912020000200045&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://www.scielo.org.mx/scielo.php?script=sci_pdf&amp;pid=S2448-56912020000200045&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen: La microscopía electrónica de barrido y transmisión (STEM) puede ofrecer información estructural y química con resolución espacial del orden de 0.1 nm, es posible alcanzar tal resolución utilizando un corrector de aberración esférica para el haz de prueba. En el STEM, un haz de electrones es enfocado y escaneado sobre la muestra, por lo que la imagen se forma midiendo la intensidad electrónica transmitida que surge después de las interacciones electrón-muestra. La intensidad de los electrones dispersados que atraviesan la muestra puede ser empleada para obtener imágenes de campo claro y campo obscuro. El microscopio STEM es un poderoso instrumento para estudiar las propiedades físicas de las nanoestructuras, que requieren de un análisis estructural y químico a nivel atómico. Por lo tanto, STEM es una técnica capaz de identificar columnas atómicas y la posición de los átomos auxiliándose con técnicas de simulación. En este trabajo, los parámetros instrumentales básicos del microscopio en modo campo oscuro anular de gran ángulo (HAADF-STEM) y campo claro (BF-STEM) fueron evaluados utilizando una muestra estándar de Si[110]. Además, imágenes experimentales de HAADF-STEM y campo claro anular (ABF-STEM) de una muestra de LaAlO3 se consiguieron a 80 kV de operación y comparadas con imágenes simuladas obtenidas con el método de multicapas, el cual se basa en la teoría dinámica de la difracción. Mediante la técnica ABF-STEM fue posible visualizar claramente las columnas atómicas de los elementos La, O y Al presentes en la muestra. Se encontró que las imágenes simuladas coinciden bien con las imágenes experimentales.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract: Scanning transmission electron microscopy (STEM) can give structural and chemical information down to 0.1 nm of spatial resolution, which sub-angstrom resolution is achieved with a spherical aberration corrector for the probe. In the STEM, the electron probe is focused and scanned over the sample and the image is formed by measuring the transmitted electron intensity arising after the electron-specimen interactions. The scattered electron intensity that cross the sample can be employed to obtain bright and dark field images. The STEM is a powerful instrument to understand the physical properties of nanostructures which requires the local structure and local chemistry to be determined at the atomic scale. Therefore, STEM is a technique able to identify the atomic columns and the position of atoms using simulation techniques. In this work, the basic instrumental parameters using high angle annular dark field (HAADF-STEM) and annular bright field (ABF-STEM) modes were evaluated using a standard sample of Si[110]. Also, experimental HAADF-STEM and annular bright field (ABF-STEM) images of LaAlO3 sample were obtained at 80 kV and compared with simulated images obtained by using the multi slice dynamical diffraction method. Using the ABF-STEM technique, it was possible to clearly visualize the atomic columns of the La, O and Al elements included in the sample. Images simulated were found to agree well with experimental images.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[microscopía electrónica de transmisión/barrido]]></kwd>
<kwd lng="es"><![CDATA[campo oscuro anular de alto ángulo]]></kwd>
<kwd lng="es"><![CDATA[campo claro anular]]></kwd>
<kwd lng="es"><![CDATA[simulación de imágenes]]></kwd>
<kwd lng="en"><![CDATA[scanning transmission electron microscopy]]></kwd>
<kwd lng="en"><![CDATA[annular bright field]]></kwd>
<kwd lng="en"><![CDATA[high angle annular dark field]]></kwd>
<kwd lng="en"><![CDATA[image simulations]]></kwd>
</kwd-group>
</article-meta>
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