Single shot phase shifting techniques for 4D radial slope measurements of transparent samples
N.I. Toto-Arellanoa, D.I. Serrano-Garcíab, A. Martínez Garcíab, G. Rodríguez-Zurita c, A. Montes-Pérezc, J.M. Miranda-Gómezd, G. Reséndiz Lópezd, A. González Rosasd, and L. García-Lechugad
a División de Óptica y Fotonica, Universidad Tecnológica de Tulancingo, Hidalgo, México, e-mail: ivantotoarellano@hotmail.com
b Centro de Investigaciones en Óptica, León, Gto., México, e-mail: david@cio.mx
c Postgrado en Óptica, Benemérita Universidad Autónoma de Puebla, Pue., México, e- mail: gzurita@fcfm.buap.mx
]]> d Área de Electromecánica Industrial, Universidad Tecnológica de Tulancingo, Hidalgo, México.
Recibido el 17 de octubre de 2011;
aceptado el 18 de mayo de 2012
Abstract
Through the use of non-destructive optical techniques to measure surfaces with high accuracy, a Mach-Zehnder Radial-Shear interferometer (MZRI) was implemented to analyze the radial slope of phase objects using simultaneous phase-shifting interferometry (SPSI). This optical configuration allows one to simultaneously obtain n-shearograms in order to retrieve the optical phase data map with higher accuracy. Phase reconstruction is performed using a well-known four step phase shifting algorithm. The experimental results for transparent samples are presented in this paper.
Keywords: Phase shifting; interferometry; phase grating; polarization; radial slope.
Resumen
]]> Debido a que el uso de técnicas ópticas no destructivas permite medir superficies con gran precisión, se ha implementado un interferómetro de desplazamiento radial para analizar la pendiente radial de objetos de fase usando interferometría de corrimiento de fase simultanea. Esta configuración óptica permite la obtención de n-interferogramas con desplazamiento radial simultáneamente, para recuperar el mapa de fase con mayor precisión. La reconstrucción de la fase se realiza utilizando el conocido algoritmo de cuatro corrimientos de fase. En este artículo se presentan los resultados experimentales de las muestras transparentes estudiadas.Descriptores: Corrimiento de fase; interferometría; rejilla de fase; polarización; pendiente radial.
PACS: 42.87.Bg; 42.79.Ci; 42.79.Dj; 42.15.Eq; 42.25.Hz; 07.05.Pj
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Acknowledgements
Authors thank M. A. Ruiz for his contribution in proofread-ing the manuscript. Enlightening comments and references from anonymous referees are also acknowledged. Author D.-I Serrano-García (Grant: 227470/31458) is very grateful to CONACyT for the graduate scholarship granted, and ex-presses sincere appreciation to Geliztle. Author N.-I. Toto-Arellano expresses sincere appreciation to Luisa, Miguel and Damian for the support provided, and to Sistema Nacional de Investigadores (SNI) for grant 47446. He currently holds a Researcher Professor position at ''Universidad Tecnologica de Tulancingo'' in Mexico, supporting the creation of a Photonics Engineering program at the same university.
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