Ac-electrokinetics based tools in nanoengineering and molecular electronics

 

A. Ramírez, A. Zehe & R. Durán

 

Benemérita Universidad Autónoma de Puebla, Facultad de Cs. de la Electrónica, Dept. Posgrado, Apdo. Post. # 1505, 72000 Puebla, Pue., México. aramirs@siu.buap.mx

 

Received: May 28^th, 2003.
Accepted: April 21^th, 2005.

 

Abstract

Silicon-based microelectronics has been following the integration prognosis of MOORE's Law during the past decades and possibly will do so for another decade or two. Physical, technological and also financial limits in the foreseeable future will slow down the continued expansion of this branch of microelectronics and instead will force a new technological approach based on molecular-scale electronics (MOLETRONICS). New tools are needed to allow molecular device manufacturing and nanoscale engineering with high precision and productivity. One group of methods with the potential for use in such a manufacturing process is based on a.c. electrokinetics effects, which are described and discussed in this paper.

Keywords: Embedded Electrokinetics, Dielectrophoresis, Electrorotation, Dielectric Polarization, Nanoengineering.

 

Resumen

La microelectrónica en base a silicio ha seguido la prognosis de integración según la ley de MOORE durante las décadas pasadas, y posiblemente continuará así por otra década más. Límites físicos, tecnológicos y también financieros en el futuro cercano reducirán la razón de expansión de esta rama microelectrónica, y en su lugar generará una aproximación tecnológica novedosa, que se basa sobre la electrónica a escala molecular (MOLETRÓNICA). Se requieren nuevas herramientas, que permitan la fabricación de dispositivos moleculares y la ingeniería a escala nanométrica con alta precisión y productividad. Un grupo de métodos con el potencial de ser usado en tal proceso de fabricación se basa en efectos electrocinéticos en campos eléctricos alternos, que en el presente trabajo se describe y discute.

 

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ACKNOWLEDGEMENT

Financial support of the BUAP through grant III 35 G02 (2003) is kindly acknowledged.

 

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