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Superficies y vacío

versión impresa ISSN 1665-3521

Superf. vacío vol.18 no.3 Ciudad de México sep. 2005

 

Articles

Infrared and Raman characterization of amorphous carbon nitride thin films prepared by laser ablation

L. Escobar-Alarcón c  

A. Arrieta b  

E. Camps c  

S. Romeroa 

M. A. Camacho-Lopezc 

a Departamento de Física, Instituto Nacional de Investigaciones Nucleare Apdo. Postal 18-1027, México DF 11801, México

b Departamento de Física, Universidad Autónoma Metropolitana Iztapalapa, Apdo. Postal 55-534, México D. F. 09340, México

c Facultad de Química, Universidad Autónoma del Estado de México, Paseo Colón y Tollocan, Toluca Edo. de México, 50110, México.


Abstract

Infrared and Raman spectroscopies have been used to characterize the presence of sp2 and sp3 bonds in carbon nitride films providing some information about the sp2/sp3 ratio. The Raman results revealed that the increase in size or number of sp2 clusters is the result of two processes, which include the increase of nitrogen content and particle bombardment, so that under certain experimental conditions a film with practically the same composition but different microstructure can be obtained. IR results reveal the presence of carbon-carbon, carbon-nitrogen, carbon-oxygen and carbon-hydrogen bonding, and their intensities depend on the laser fluence used for deposition.

Keywords: Laser ablation; Carbon nitride; Raman spectroscopy; Infrared spectroscopy

Full text available only in PDF format.

References

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Received: June 15, 2005; Accepted: August 17, 2005

Creative Commons License This is an open-access article distributed under the terms of the Creative Commons Attribution License