SciELO - Scientific Electronic Library Online

 
vol.60 issue2Refractive index changes in n-type delta-doped GaAs under hydrostatic pressure author indexsubject indexsearch form
Home Pagealphabetic serial listing  

Services on Demand

Journal

Article

Indicators

Related links

  • Have no similar articlesSimilars in SciELO

Share


Revista mexicana de física

Print version ISSN 0035-001X

Rev. mex. fis. vol.60 n.2 México Mar./Apr. 2014

 

Investigación

 

X-ray diffraction analysis of stannite, wurtz-stannite and pseudo-cubic quaternary compounds by Rietveld method

 

M. Quinteroa,*, J. Marquinab, E. Quinteroa, E. Morenoa, S. Álvareza,b, C. Rincóna, P. Grimaa, P. Bocarandaa, D. Riveroa, J. A. Henaoc, and M. A. Macíasc

 

a Centro de Estudios de Semiconductores (CES), Departamento de Física, Facultad de Ciencias, Universidad de Los Andes, Mérida 5101, Venezuela. * e-mail: mquinterg@gmail.com; mquinter@ula.ve

b Centro de Estudios Avanzados en Óptica (CEAO), Departamento de Física, Facultad de Ciencias, Universidad de los Andes 5101, Venezuela.

c Grupo de Investigación en Química Estructural (GIQUE), Facultad de Ciencias, Escuela de Química, Universidad Industrial de Santander, Apartado aéreo 678, Bucaramanga, Colombia.

 

Received 6 November 2012.
Accepted 17 February 2014.

 

Abstract

Room temperature X-ray powder diffraction measurements were carried out on nine polycrystalline samples of the Cu2BII CIVX4 (B=Mn, or Fe, or Co; C=Si, or Ge, or Sn; X=S, or Se, or Te) magnetic semiconductor compounds. The diffraction patterns were used to show the equilibrium conditions and to derive crystalline parameter values. The results showed that four of these compounds have a tetragonal stannite structure with space group 142m(N° 121), two an orthorhombic wurtz-stannite structure with space group Pmn21(N° 31) and three of them an orthorhombic pseudo-cubic structure with space group F222 (N° 22). In each case, the structure was refined using the Rietveld method. When the obtained atomic parameter values for the tetragonal compounds were plotted as a function of molecular weight W, it was found that the values of the atomic positions, the cation-anion bond distances, tetragonal distortion and internal distortion of the compounds containing S and/or Se lay on different lines. Also, it was found that when the experimental points of the cation-anion bond distances dCu-VI, dII-VI and dIV-VI were plotted against the effective lattice parameter ae = (V/N)1/3, a linear variation of these distances with ae was obtained. Values of the ionic energy gap Ci and homopolar energy gap Eh using the Phillips-Van Vechten scheme, with the present experimental crystallographic results as well as using the atomic data, were determined. It was found that the observed and predicted values of Ci and Eh lie on the same straight line.

Keywords: Magnetic semiconductors; crystal structure; X-ray powder diffraction; Rietveld refinement; crystal growth.

 

PACS: 61.05.cp; 61.50-f; 61.66.Fn; 75.50Pp

 

DESCARGAR ARTÍCULO EN FORMATO PDF

 

Acknowledgments

This work was partially supported by the CDCHT-ULA (Project No. C-1740-11-05-AA). E. Moreno would like to thank the Plan de Desarrollo de Talentos Humanos de Alto Nivel of FONACIT, through contract No. 200601411, Venezuela. S. Alvares would like to thank the Plan de Desarrollo de Talentos Humanos de Alto Nivel of FONACIT, through contract No. 200801535, Venezuela. P. Grima-Gallardo would like to thank to FONACIT, project PEII No 1697. M. A. Macías would to thank COLCIENCIAS (Colombia) for his doctoral fellowship. The authors would like to thank to the reviewer for its interest in this work and critical reading of the manuscript.

 

References

1. H. Katagiri, K. Jimbo, W. S. Maw, K. Oishi, M. Yamazaki, H. Araki and A. Takeuchi, Thin Solid Films, 517 (2009) 2455-2460.         [ Links ]

2. Y. Shapira, E.J. McNiff Jr., N.F. Oliveira Jr., E.D. Honig, K. Dwight and A. Wold, Phys. Rev. B, 37 (1988) 411.         [ Links ]

3. L. Guen and W. S. Glaunsinger, J. Sol. Stat. Chem., 35 (1980) 10.         [ Links ]

4. X. L. Chen, A. M. Lamarche, G. Lamarche, and J. C. Woolley, J. Magn. Magn. Mater. 118 (1993) 119.         [ Links ]

5. E. Quintero et al., J. Phys. Chem. Solids, 71 (2010) 993.         [ Links ]

6. W. Schäfer and R. Nitsche, Mat. Res. Bull. 9 (1974) 645.         [ Links ]

7. L. D. Gulay, O. P. Nazarchuk and I. D. Olekseyuk, J. Alloy Compd. 377 (2004) 306.         [ Links ]

8. M. Quintero et al., Mater. Res. Bull. 34 (1999) 2263-2270.         [ Links ]

9. E. Parthé, K. Yvon, and R. H. Deitch, Acta Cryst., B25 (1969) 1164.         [ Links ]

10. A.-M. Lamarche, A. Willsher, L. Chen, G. Lamarche and J.C. Woolley, J. Sol. Stat. Chem., 94 (1991) 313-318.         [ Links ]

11. A. Boultif and D. Louer. J. Appl. Cryst. 37 (2006) 724.         [ Links ]

12. LMGP-Suite Suite of Programs for the interpretation of 18. X-ray Experiments, by Jean laugier and Bernard Bochu, ENSP/Laboratoire des Materiaux et du Genie Physique, BP 46. 38042 Saint Martin d'Heres, France. WWW: http://www.inpg.fr/LMGP and http://www.ccp14.ac.uk/tutorial/lmgp/.         [ Links ]

13. A. D. Mighell, C. R. Hubbard, and J. K. Stalick, NBS*AIDS83: A Fortran Program for Crystallographic Data Evaluation, National Bureau of standards (USA), Tech note 1141, (1981).         [ Links ]

14. Lutterotti L. Material Analysis using Diffraction - MAUD: Computer code JAVA. Trento: University of Trento. 1997-2009. Available from: http://www.ing.unitn.it/~maud/.         [ Links ]

15. R. A. Young, Editor. The Rietveld Method. (Oxford University Press, Oxford, 1993).         [ Links ]

16. J. A. Henao et al., Chalcogenide Lett. 6 (2009) 5S3.         [ Links ]

17. O. V. Parasyuk, L. D. Gulay, Ya. E. Romanyuk, and L. V. Piskach, J. Alloy Compd., 329 (2001) 202.         [ Links ]

18. V. P. Sachanyuk, I. D. Olekseyuk, and O. V. Parasyuk, phys. stat. sol. (a) 203 (2006) 459.         [ Links ]

19. I. D. Olekseyuk, L. D. Gulay, I. V. Dydchak, L. V. Piskach, O. V. Parasyuk, and O. V. Marchuk, J. Alloy Compd. 340 (2002) 141.         [ Links ]

20. J. A. Van Vechten and T. K. Bergstresser, Phys. Rev. 1 (1970) 3351.         [ Links ]

21. J. C. Phillips, Rev. Mod. Phys. 42 (1970) 317.         [ Links ]

22. B. Cordero et al., Dalton Trans., (2008) 2832.         [ Links ]

Creative Commons License All the contents of this journal, except where otherwise noted, is licensed under a Creative Commons Attribution License