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Revista mexicana de física

Print version ISSN 0035-001X

Rev. mex. fis. vol.59 n.2 México Mar./Apr. 2013




A program for phase identification using diffractograms obtained from TEM structure images


R. Galiciaa, R. Herreraa*, J. L. Riusb, C. Zorrillaa, and A. Gómeza


aDepartamento de Materia Condensada, Instituto de Física, Universidad National Autónoma de México, 20-364, México, 01000, D.F., México. * e-mail:

bDepartamento de Sistemas Complejos, Instituto de Física, Universidad National Autónoma de México, 20-364, México, 01000, D.F., México.


Recibido el 16 de agosto de 2012.
Aceptado el 8 de noviembre de 2012.



In this work a computer program for the indexing of diffractograms is presented. The diffractograms are obtained by means of a discrete Fourier transform from high resolution electron microscope images. The program requires the use of x-ray diffraction data files together with a fast Fourier transform program, for this purpose we used the Digital Micrograph software.

Keywords: Electron microscopy; X-ray diffraction; difractograms; indexing.



Se presenta un programa de computo que ayuda a identificar los planos cristalográficos (indexar difractogramas) que aparecen al aplicar la Transformada Rápida de Fourier (FFT) a una imagen digital de alta resolución obtenida con un microscopio electrónico de transmisión de alta resolución. El programa requiere el uso de los archivos de Rayos X de uso común y de un programa que obtenga la FFT, para este caso se utiliza el software de Digital Micrograph.

Descriptores: Microscopia electrónica; rayos X; difractogramas; indexación.


PACS: 61.14.Dc; 61.68.+n





The authors acknowledge the financial support from DGAPA with grant PAPIIT IN105109-5 and Conacyt grant 82270.



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