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Superficies y vacío

versão impressa ISSN 1665-3521

Resumo

BARTOLO-PEREZ, P. et al. Factores de sensibilidad XPS para la cuantificación de catalizadores de Bi 2 Mo x W 1-x O 6. Superf. vacío [online]. 2005, vol.18, n.4, pp.13-17. ISSN 1665-3521.

X-ray photoelectron spectroscopy is used widely to determine the chemical composition and oxidation states of solid materials. For quantification with XPS it is necessary to have reliable sensitivity factors. XPS general and high resolution spectra of standards of MoO3, WO3 and Bi2O3 are presented. The oxidation state of oxygen does not change in the standards; therefore the sensitivity factor of oxygen is taken like reference. XPS sensitivity factors of Mo, W and Bi are obtained; and next use becomes of these for the quantification of the catalysts of Bi2MoxW1-xO6. Also the compounds that form in these catalysts are determined.

Palavras-chave : Catalizadores; XPS; Cuantificación.

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