Resumen

CADENA-ARENAS, Antonio; KRYSHTAB, Tetyana; PALACIOS-GOMEZ, Jesús  y  KRYVKO, Andriy. Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis. Ing. invest. y tecnol. [online]. 2014, vol.15, n.2, pp.241-252. ISSN 2594-0732.

A method to correct pole densities (PD) for primary and secondary extinction applied for maxima of pole figures (PF) measured by X-ray diffraction, was extended to correct the whole 111 and 200 PFs for nickel samples after 75% cold rolling and subsequent annealing at 600°C during 30 minutes. The PDs were corrected, and parameters of primary and secondary extinction were calculated using the PDs obtained in PFs measured for the first order reflections with two wavelengths (Cu Kα and Co Kα - radiations) and for the second order reflections with Cu Kα - radiation. Three orientation distribution functions (ODF) were calculated, namely: the first one from 111, 200 and 220 PFs; the second one from 222 and 400 PFs (the second order reflections) and 220 PF (440 reflection is absent for the radiations used); the third one from corrected 111 and 200 PFs and not corrected 220 PF (for lack of the second order reflection). Essential differences between the obtained ODFs indicate the necessity to take into account the extinction phenomenon in analysis of textured materials. The obtained parameters of extinction were used for the evaluation of microstructure details of textured nickel depending on grains orientation that is not easily obtained by conventional metallographic methods.

Palabras llave : X-ray diffraction; texture; primary extinction; secondary extinction; microstructure.

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