Abstract

CERRUD-SANCHEZ, S.M.; JACOBO-ARMENDARIZ, V.H.; ORTIZ-PRADO, A.  and  SCHOUWENAARS, R.. Deterioro por corrosión atmosférica de componentes electrónicos de equipo telefónico. Ing. invest. y tecnol. [online]. 2005, vol.6, n.4, pp.219-237. ISSN 2594-0732.

The failure deterioration of electronic devices caused by atmospheric corrosion has been studied since the late sixties. Most of the research was oriented towards the climatologic conditions typical for the industrialized countries. In these regions, the use of air conditioning is very common. Therefore, the difference between indoor and outdoor atmospheres is very important. This situation is very different in Latin America and the research in this topic has been limited. In this pa per, are also presented the results of the failure analysis in printed circuits from residential telephones. The electronic de vices have been in service under different climatic conditions within Mexico. With the observations, it is possible to identify the main atmospheric variables promoting the corrosion in electronic de vices. The results are used to improve the de sign of the elements.

Keywords : Atmospheric corrosion; failure analysis; electronic equipment.

        · abstract in Spanish     · text in Spanish     · Spanish ( pdf )