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Revista mexicana de física

versão impressa ISSN 0035-001X

Resumo

LINO, Jorge L. S.. Electronic excitation of atoms by positron impact using the scaling born approach. Rev. mex. fis. [online]. 2018, vol.64, n.6, pp.598-602.  Epub 05-Nov-2019. ISSN 0035-001X.  http://dx.doi.org/10.31349/revmexfis.64.598.

We consider the efficiency of the scaling Born positron (SBP) approach, in calculating reliable integral cross sections (ICS) for positron impact excitation of electronic states in atoms. We will demonstrate, using specific examples as H, He, Hg, and Mg, that this relatively simple procedure can generate quite accurate ICS when compared with more sophisticated methods. In the absence of the experimental data, comparisons are made with analogous electron scattering.

Palavras-chave : Born; positron; scaling; 34.80.Dp.

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