SciELO - Scientific Electronic Library Online

vol.57 número6Anharmonic properties of Raman modes in double wall carbon nanotubesEnhancement backscattering of light: a direct visual-desktop experience índice de autoresíndice de materiabúsqueda de artículos
Home Pagelista alfabética de revistas  

Servicios Personalizados




Links relacionados

  • No hay artículos similaresSimilares en SciELO


Revista mexicana de física

versión impresa ISSN 0035-001X


MARTINEZ, A; RAYAS, J.A.; CORDERO, R  y  LABBE, F. Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry. Rev. mex. fis. [online]. 2011, vol.57, n.6, pp.518-523. ISSN 0035-001X.

In this work, an optical setup that gives the possibility of using either ESPI or ESPSI has been implemented to assess in-plane strains induced on a composite sample. First, in-plane ESPI was used to measure displacement fields, which later allowed us to evaluate the corresponding strain fields. Next, we applied ESPSI to measure the derivative of in-plane surface displacements (the strains). The experimental results obtained by applying both techniques (ESPI and ESPSI) were compared. We found that the difference between the strain fields obtained by ESPSI and ESPI was roughly a constant. This result was expected since, although ESPI allows computing absolute strain values, the strains measured by ESPSI are relative to a reference that must be measured using an additional method. Once calibrated the system ESPSI, the ESPI could no longer be used. The strain field obtained in ESPSI is corrected by the sum of constant value calculated.

Palabras llave : Electronic speckle pattern interferometry; shearography; strain.

        · texto en Inglés     · Inglés ( pdf )


Creative Commons License Todo el contenido de esta revista, excepto dónde está identificado, está bajo una Licencia Creative Commons