Resumo

POVEDA, J.C.; ALVAREZ, I.  e  CISNEROS, C. Multiphoton ionization of naphthalene clusters at 266 nm. Rev. mex. fis. [online]. 2011, vol.57, n.1, pp.68-74. ISSN 0035-001X.

In this work we analyze the photoionization of Naphthalene clusters: dimmer, trimmer and tetramers when radiation of 266 nm from Nd:YAG laser at intensities up to 10⁹ W·cm^-2 was used, in the range from 0.5 to 20.0 mJ per pulse. The clusters were formed by thermal desorption of a sample at 373 K and translational and vibrationally cooled in a jet by adiabatic expansion. At these experimental conditions the ionization processes were accomplished in the multiphoton regime by two photon absorption. A complete identification of fragment ions arising from the clusters was carried out, using a linear time of flight mass analyzer, ToF-MA. Evidence of proton and carbon atoms migration between molecular units in the clusters was observed, and the ions C₁₀Hs-H⁺ and (C₁₀Hs)₂-H⁺ were detected. The analysis of ion yield of clusters as a function of the energy per pulse showed that the dimmer stability is higher than trimmer and tetramer structures. The efficiency of clusters formation, and ionization processes were analyzed as a function of different carrier gases, CG: He, Ne, Ar, Kr and Xe. With He and Ne as CG, the ion yield decreases comparatively when Ar, Kr, Xe or not CG were used.

Palavras-chave : Naphthalene; photoionization; molecular clusters; PAHs.

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