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Revista mexicana de física
versión impresa ISSN 0035-001X
Resumen
SANTIAGO TEPANTLAN, C.; PEREZ GONZALEZ, A.M y VALERIANO ARREOLA, I.. Structural, optical and electrical properties of CdS thin films obtained by spray pyrolysis. Rev. mex. fis. [online]. 2008, vol.54, n.2, pp.112-117. ISSN 0035-001X.
Cadmium sulphide (CdS) thin films were prepared by means of the chemical spray pyrolysis technique. The substrate temperature was varied in the range from 200 to 400°C. The structural properties of the semiconductor were characterized by X-ray diffraction; XRD patterns indicated the presence of single-phase hexagonal CdS. Direct band gap values of 2.37-2.41 eV were obtained. The refractive index is reported on depending on the substrate temperature, and was obtained from transmission spectra and from spectroellipsometry measurements. As a consequence, the optical parameters of the films were determined using the Swanepoel, Cauchy, Sellmeier and Wemple models. The resistivity of the films was found to vary in the range 103 105Ω.cm, depending on the substrate temperature.
Palabras llave : CdS thin films; spray pyrolysis; structural properties; optical properties; electrical properties.