Abstract

SANTIAGO TEPANTLAN, C.; PEREZ GONZALEZ, A.M  and  VALERIANO ARREOLA, I.. Structural, optical and electrical properties of CdS thin films obtained by spray pyrolysis. Rev. mex. fis. [online]. 2008, vol.54, n.2, pp.112-117. ISSN 0035-001X.

Cadmium sulphide (CdS) thin films were prepared by means of the chemical spray pyrolysis technique. The substrate temperature was varied in the range from 200 to 400°C. The structural properties of the semiconductor were characterized by X-ray diffraction; XRD patterns indicated the presence of single-phase hexagonal CdS. Direct band gap values of 2.37-2.41 eV were obtained. The refractive index is reported on depending on the substrate temperature, and was obtained from transmission spectra and from spectroellipsometry measurements. As a consequence, the optical parameters of the films were determined using the Swanepoel, Cauchy, Sellmeier and Wemple models. The resistivity of the films was found to vary in the range 10³ 10⁵Ω.cm, depending on the substrate temperature.

Keywords : CdS thin films; spray pyrolysis; structural properties; optical properties; electrical properties.

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