Resumen

VAZQUEZ-LOPEZ, C; FRAGOSO, R; GOLZARRI, J.I  y  ESPINOSA, G. Applications of the atomic force microscopy to nuclear track methodology. Rev. mex. fis. [online]. 2007, vol.53, suppl.3, pp.52-56. ISSN 0035-001X.

The fundamental instrumentation scheme of atomic force microscopy is reviewed, with the purpose of understanding the great value of this technology in studying nuclear tracks in solids. Different morphologies are revealed in the samples, in which detailed metrological features are very important in the characterization and study of nuclear tracks. Among them, conical pits on etched CR-39 exposed to alpha particles, and hillocks and/or craters on some minerals exposed to ²⁵²Cf fission fragments. Some examples of artifacts in the convolution of sample topography and probe geometry are also mentioned.

Palabras llave : Atomic force microscopy; nuclear track detectors; plastic detectors.

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