Resumen

PALAVICINI, C.; JAOUEN, Y.; GALLION, P.  y  CAMPUZANO, G.. Caracterización de componentes fotónicos utilizando reflectometría optica de baja coherencia. Rev. mex. fis. [online]. 2006, vol.52, n.4, pp.379-386. ISSN 0035-001X.

Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

Palabras llave : Optical low-coherence reflectometry; photonic device characterization.

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