Resumen

COELLO, V. et al. Near-field microscopy of evanescent microwaves. Rev. mex. fis. [online]. 2005, vol.51, n.4, pp.426-430. ISSN 0035-001X.

Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilities of the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane) scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their corresponding near-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a check of potential (two-dimensional) micro-components and possibly for micro and nano-circuits.

Palabras llave : Scanning near-field optical microscopy; microwave radiation; wave optics.

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