Resumo

LEPY, M.C  e  PLAGNARD, J. Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel. Rev. mex. fis. [online]. 2007, vol.53, suppl.3, pp.68-73. ISSN 0035-001X.

In the frame of the French Metrology Institute, the Laboratoire National Henri Becquerel performs accurate characterization of semiconductor detectors that are in use in a number of applications. Their efficiency calibration, energy resolution and the detailed shape of their response function are parameters of interest for accurate processing of low-energy X-ray spectra to be applied to elements identification and fundamental research studies. The tools specifically developed for low-energy detectors calibration and characterization are described, from the use of radioactivity standard to the development of a tunable monochromatic X-ray source.

Palavras-chave : X-ray spectrometry; semiconductor detector; calibration; metrology.

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