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Revista mexicana de física
versão impressa ISSN 0035-001X
Resumo
GORDILLO, G.; CALDERON, C. e ROJAS, F.. Determination of optical constants of ZnxIn1-xSe thin films deposited by evaporation. Rev. mex. fis. [online]. 2003, vol.49, n.4, pp.329-334. ISSN 0035-001X.
Polycrystalline ZnxIn1-xSe thin films with Se contents varying between x=0 (InSe) and x=1 (ZnSe), deposited on glass substrates, were optically characterized. These samples were grown by coevaporation of the ZnSe and In2Se3 compounds using a crucible constituted by two coaxial chambers. The optical constants (refractive index n, absorption coefficient a and optical gap Eg) and the film thickness d, were determined using the transmission spectrum and simple calculations based on a theoretical model including interference effect induced by multiple internal reflections in the substrate/film system. The reliability of the results was tested by comparing the experimental transmittance spectra with the theoretically ones, using values of n, α and d obtained experimentally.
Palavras-chave : Optical properties; selenides; semiconductors; solar cells.